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Probe circuit, multi-probe circuit, test apparatus, and electric device

  • US 8,536,887 B2
  • Filed: 07/06/2010
  • Issued: 09/17/2013
  • Est. Priority Date: 09/16/2009
  • Status: Expired due to Fees
First Claim
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1. A probe circuit provided in an electronic device that includes a circuit which is under test and outputs a response signal corresponding to an input signal in synchronization with an operation clock, comprising:

  • a sampling clock supplying section that outputs a sampling clock having a predetermined frequency;

    a sampling section that outputs, outside the electronic device, a probe output signal of which frequency is lower than a frequency of the response signal and which corresponds to a sampling result obtained by sampling the response signal using the sampling clock; and

    an edge-timing detecting section that detects edge timing at which logical value of the probe output signal changes,wherein the response signal has a prescribed signal pattern repeated with a predetermined recurrence period, andthe sampling clock supplying section outputs the sampling clock of which relative phase with respect in the signal pattern sequentially changes in each recurrence period.

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