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Methods for constructing an optimal endpoint algorithm

  • US 8,538,572 B2
  • Filed: 06/29/2010
  • Issued: 09/17/2013
  • Est. Priority Date: 06/30/2009
  • Status: Active Grant
First Claim
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1. A method for automatically identifying an optimal endpoint algorithm for qualifying a process endpoint during substrate processing within a plasma processing system, comprising:

  • receiving sensor data from a plurality of sensors during substrate processing of at least one substrate within said plasma processing system wherein said sensor data includes a plurality of signal streams from a plurality of sensor channels;

    identifying an endpoint domain, wherein said endpoint domain is an approximate period within which said process endpoint is expected to occur;

    analyzing said sensor data to generate a set of potential endpoint signatures;

    converting said set of potential endpoint signatures into a set of optimal endpoint algorithms; and

    importing one optimal endpoint algorithm of said set of optimal endpoint algorithms into production environment, wherein said analyzing of said sensor data includes performing linear fitting on said sensor data to divide each signal stream from said plurality of signal streams into a plurality of segments based on time intervals.

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