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Charging protection device

  • US 8,546,855 B2
  • Filed: 09/22/2011
  • Issued: 10/01/2013
  • Est. Priority Date: 06/12/2009
  • Status: Active Grant
First Claim
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1. A semiconductor device comprising:

  • a silicon-on-insulator (SOI) substrate including a bulk silicon layer;

    an active silicon layer on the SOI substrate;

    a transistor formed in the active silicon layer, the transistor including source/drain regions; and

    a diode formed in the active silicon layer, the diode including two active regions;

    first, second, third, and fourth conductive contacts;

    first and second metal lines;

    wherein the first conductive contact connects the drain of the transistor with the first metal line, the second conductive contact connects one active region of the diode with the first metal line, the third conductive contact connects the second active region of the diode with the second metal line, and the fourth conductive contact connects the second metal line to the bulk silicon layer;

    wherein, the drain region, active diode regions, and bulk silicon layer are electrically connected to form a charging protection device.

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