Through silicon via (TSV) isolation structures for noise reduction in 3D integrated circuit
First Claim
1. A semiconductor device comprising:
- an active semiconductor device formed on a surface of a semiconductor substrate;
an isolation through silicon via (TSV) extending through said semiconductor substrate and laterally spaced from said active semiconductor device and next to a surface dopant impurity region of a first dopant impurity type disposed in said surface between said isolation TSV and said active semiconductor device, said surface dopant impurity region having a dopant concentration different from said substrate; and
said isolation TSV surrounded laterally by a surrounding dopant impurity region that forms sidewalls of said isolation TSV, said surrounding dopant impurity region being one of a P-type dopant impurity region coupled to ground and an N-type dopant impurity region coupled to VDD.
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Abstract
Through silicon via (TSV) isolation structures are provided and suppress electrical noise such as may be propagated through a semiconductor substrate when caused by a signal carrying active TSV such as used in 3D integrated circuit packaging. The isolation TSV structures are surrounded by an oxide liner and surrounding dopant impurity regions. The surrounding dopant impurity regions may be P-type dopant impurity regions that are coupled to ground or N-type dopant impurity regions that may advantageously be coupled to VDD. The TSV isolation structure is advantageously disposed between an active, signal carrying TSV and active semiconductor devices and the TSV isolation structures may be formed in an array that isolates an active, signal carrying TSV structure from active semiconductor devices.
57 Citations
20 Claims
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1. A semiconductor device comprising:
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an active semiconductor device formed on a surface of a semiconductor substrate; an isolation through silicon via (TSV) extending through said semiconductor substrate and laterally spaced from said active semiconductor device and next to a surface dopant impurity region of a first dopant impurity type disposed in said surface between said isolation TSV and said active semiconductor device, said surface dopant impurity region having a dopant concentration different from said substrate; and said isolation TSV surrounded laterally by a surrounding dopant impurity region that forms sidewalls of said isolation TSV, said surrounding dopant impurity region being one of a P-type dopant impurity region coupled to ground and an N-type dopant impurity region coupled to VDD. - View Dependent Claims (2, 3, 4, 5, 6, 7, 8, 9, 10)
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11. A method for forming a semiconductor device, said method comprising:
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providing a semiconductor substrate with a surface having an active semiconductor device disposed thereon and a surface dopant impurity region of a first dopant impurity type disposed therein, said surface dopant impurity region having a dopant concentration different from said substrate; forming a through silicon via (TSV) opening next to said surface dopant impurity region and extending downwardly from said surface and into said semiconductor substrate, said surface dopant impurity region disposed between said TSV opening and said active semiconductor device; forming a surrounding dopant impurity region surrounding said TSV opening, said surrounding dopant impurity region being one of a P-type dopant impurity region and an N-type dopant impurity region; and electrically coupling said surrounding dopant impurity region by one of coupling said P-type dopant impurity region to ground when said surrounding dopant impurity comprises a P-type dopant impurity region, and coupling said N-type dopant impurity region to VDD when said surrounding dopant impurity comprises an N-type dopant impurity region. - View Dependent Claims (12, 13, 14, 15, 16)
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17. A method for forming a semiconductor device, said method comprising:
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providing a semiconductor substrate with a surface having an active semiconductor device disposed thereon; forming a plurality of through silicon vias (TSV) extending through said semiconductor substrate, said plurality of TSVs including an active TSV including a conductive structure carrying an electrical signal therein, an array of first TSV isolation structures surrounded by corresponding first surrounding dopant impurity regions and an array of second TSV isolation structures surrounded by corresponding second surrounding dopant impurity regions; and wherein said active TSV is separated from said active semiconductor device by at least some of said first TSV isolation structures and said second TSV isolation structures. - View Dependent Claims (18, 19, 20)
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Specification