Method and apparatus for using an area X-ray detector as a point detector in an X-ray diffractometer

• US 8,548,123 B2
• Filed: 04/29/2010
• Issued: 10/01/2013
• Est. Priority Date: 04/29/2010
• Status: Active Grant

• Current Assignee: Bruker AXS Incorporated (Bruker Corporation)
• Original Assignee: Bruker AXS Incorporated (Bruker Corporation)
• Inventors: He, Bob Baoping
• Primary Examiner(s): SONG, HOON K
• Application Number:
  US12/769,837
• Publication Number:
  US 20110268251A1
• Time in Patent Office: 1,251 Days
• Field of Search: 378 70- 85
• US Class Current: 378/73
• CPC Class Codes: G01N 23/207 Diffractometry using detectors, e.g. using a probe in a central position and one or more displaceable detectors in circumferential positions

Abstract

An area detector used in a two-dimensional system is used as a point detector in Bragg-Brentano and other geometries by providing the area detector with a mask the limits the area through which X-rays can enter the detector. Secondary X-ray optics and a monochromator that are part of the diffractometer geometry are attached to the area detector mask to allow a fast and easy switch between the two-dimensional detector mode and the point detector mode. A concave detector mask is used with a spherical detector in order to reduce the secondary beam path and increase detector efficiency and the opening in the detector mask can be offset from the mask center to achieve high 2θ angle measurements. Single channel bypath electronics are used to disregard the dimensional position of each X-ray count to increase the efficiency and speed of the system.

Claims

1. A method for converting a two-dimensional X-ray diffractometer having an area detector with a two-dimensional detection region to detect X-rays diffracted from a sample into an X-ray diffractometer that uses a point detector, comprising:

(a) providing a mask fabricated from a radiopaque material having a sufficient size to cover the entire two-dimensional detection region and a single opening therein through which X-rays diffracted from the sample can reach the area detector and which has an area substantially less than the two-dimensional detection region; and

(b) mounting the mask over the detection region of the detector prior to measuring X-rays, such that the relative position of the mask and the detector remains fixed during said measuring.

2. The method of claim 1 wherein the X-ray diffractometer has a Bragg-Brentano geometry.

3. The method of claim 1 wherein the X-ray diffractometer has a parallel geometry.

4. The method of claim 1 wherein the X-ray diffractometer has a grazing incidence geometry.

5. The method of claim 1 further comprising mechanically attaching X-ray optics to the mask to process X-rays diffracted from the sample when the mask is attached to the area detector.

6. The method of claim 1 wherein the area detector has a curved two-dimensional detection region and step (a) comprises providing a mask with a curved surface that matches the curved two-dimensional detection region in order to reduce an X-ray beam path between the sample and the area detector.

7. The method of claim 1 wherein the mask has a center and wherein the opening in the mask is offset from the center of the mask.

8. The method of claim 7 further comprising attaching a monochromator to the mask so that X-rays diffracted from the sample pass through the monochromator before reaching the area detector.

9. The method of claim 1 further comprising detecting X-ray counts generated by the area detector without registering a position on the detector of the each X-ray count in order to increase detection speed.

10. Apparatus for converting a two-dimensional X-ray diffractometer having an area detector with a two-dimensional detection region to detect X-rays diffracted from a sample into an X-ray diffractometer that uses a point detector, comprising:

a mask fabricated from a radiopaque material having a sufficient size to cover the entire two-dimensional detection region and a single opening therein through which X-rays diffracted from the sample can reach the area detector and which has an area substantially less than the two-dimensional detection region; and

at least one removable fastener for mounting the mask over the detection region of the detector prior to measuring X-rays, such that the relative position of the mask and the detector remains fixed during said measuring.

11. The apparatus of claim 10 wherein the X-ray diffractometer has a Bragg-Brentano geometry.

12. The apparatus of claim 10 wherein the X-ray diffractometer has a parallel geometry.

13. The apparatus of claim 10 wherein the X-ray diffractometer has a grazing incidence geometry.

14. The apparatus of claim 10 further comprising X-ray optics that process X-rays diffracted from the sample and means for mechanically attaching the X-ray optics to the mask.

15. The apparatus of claim 10 wherein the area detector has a curved two-dimensional detection region and wherein the mask has a curved surface that matches the curved two-dimensional detection region in order to reduce an X-ray beam path between the sample and the area detector.

16. The apparatus of claim 10 wherein the mask has a center and the opening is offset from the center of the mask.

17. The apparatus of claim 16 further comprising a monochromator and means for attaching the monochromator to the mask so that X-rays diffracted from the sample pass through the monochromator before reaching the area detector.

18. The apparatus of claim 10 further a detector that detects X-ray counts generated by the area detector without registering a position on the detector of the each X-ray count in order to increase detection speed.