Thermal resistor test apparatus

• US 8,550,708 B2
• Filed: 06/29/2011
• Issued: 10/08/2013
• Est. Priority Date: 12/28/2010
• Status: Expired due to Fees

• Current Assignee: Hong Fu Jin Precision Industry (Shenzhen) Co., Ltd. (Hon Hai Precision Industry Co., Ltd.), Hon Hai Precision Industry Co., Ltd.
• Original Assignee: Hong Fu Jin Precision Industry (Shenzhen) Co., Ltd. (Hon Hai Precision Industry Co., Ltd.), Hon Hai Precision Industry Co., Ltd.
• Inventors: Xie, Ling-Yu, Xie, Xing-Ping
• Primary Examiner(s): Jagan, Mirellys
• Application Number:
  US13/172,171
• Publication Number:
  US 20120163414A1
• Time in Patent Office: 832 Days
• Field of Search: 374/185, 374/163, 374/101
• US Class Current: 374/185
• CPC Class Codes: G01K 15/005 Calibration
• CPC Class Codes: G01K 7/16 using resistive elements resistive elements per se H01C, H01L

Abstract

A test apparatus for a thermal resistor includes a control device, a temperature processing circuit, a voltage regulating circuit and a temperature detecting circuit. The control device stores a plurality of predetermined voltage values and outputs control signals according to those predetermined values. The temperature processing circuit receives the control signals and outputs a pulse width modulation (PWM) signal according to the control signal. The voltage regulating circuit receives the PWM signal and outputs a first direct current (DC) voltage to heat the thermal resistor. The temperature detecting circuit detects temperature signals and current signals from the thermal resistor. The control device receives the temperature signals and current signals of the thermal resistor and generates a resistance-temperature graph of the thermal resistor.

Claims

1. A thermal resistor test apparatus for a thermal resistor comprising:

a control device adapted to store a plurality of predetermined voltage values and output control signals according to the plurality of predetermined voltage values;

a temperature processing circuit adapted to receive the control signals and output a pulse width modulation (PWM) signal according to the control signal;

a voltage regulating circuit adapted to receive the PWM signal and output a first direct current (DC) voltage to heat the thermal resistor;

a temperature detecting circuit adapted to detect temperature signals and current signals of the thermal resistor;

a conversion circuit adapted to convert a voltage level of the temperature signals and current signals which is identified by the control device;

wherein the control device is adapted to receive the temperature signals and current signals which have been converted from the temperature detecting circuit via the temperature processing circuit and the conversion circuit, and generate a resistance-temperature graph of the thermal resistor according to the temperature signals and the current signals; and

a power supply circuit adapted to provide working voltages to the temperature detecting circuit, the temperature processing circuit and the voltage regulating circuit.

2. The thermal resistor test apparatus of claim 1, wherein the power supply circuit comprises a second voltage regulator and a zener diode;

the second voltage regulator comprises a second voltage regulator input terminal, a second voltage regulator ground terminal and a second voltage regulator output terminal;

the zener diode comprises a zener diode anode and a zener diode cathode;

the second voltage regulator input terminal is electrically connected to a voltage adapter;

the second voltage regulator output terminal is adapted to output a third DC voltage;

the second voltage regulator output terminal is electrically connected to the zener diode cathode via a sixth resistor;

the zener diode anode is electrically connected to the second voltage regulator ground terminal; and

a connection point between the zener diode and the sixth resistor is adapted to output a fourth DC voltage.

3. The thermal resistor test apparatus of claim 1, wherein the conversion circuit comprises a voltage level conversion chip having a first voltage level signal receiving terminal, a first voltage level signal transmitting terminal, a second voltage level signal receiving terminal and a second voltage level signal transmitting terminal;

the first voltage level signal receiving terminal is adapted to receive the control signals from the control device;

the first voltage level signal transmitting terminal is adapted to transmit the control signal converted by the voltage level conversion chip to the control signal receiving terminal;

the second voltage level signal receiving terminal is adapted to receive the temperature signals and voltage signals from the feedback signal receiving terminal; and

the second voltage level signal transmitting terminal is adapted to transmit the temperature signals and voltage signals converted by the voltage level conversion chip to the control device.

4. The thermal resistor test apparatus of claim 1, wherein the temperature detecting circuit comprises a temperature sensor and a first resistor;

the temperature sensor comprises a temperature signal output terminal;

the first resistor comprises a first resistor first terminal and a first resistor second terminal;

the thermal resistor comprises a variable resistor unit and a heating unit;

the first DC voltage is adapted to heat the variable resistor unit via the heating unit;

the first resistor first terminal is adapted to receive a second DC voltage;

the first resistor second terminal is grounded via the variable resistor unit; and

the temperature sensor is adapted to detect temperature signals of the variable resistor unit and transmit the temperature signals to the temperature processing circuit via the temperature signal output terminal.

5. The thermal resistor test apparatus of claim 4, wherein the temperature processing circuit comprises a microcontroller;

the microcontroller comprises a first voltage signal collecting terminal, a second voltage signal collecting terminal and a temperature signal collecting terminal;

the first voltage signal collecting terminal is electrically connected to the first resistor first terminal to collect a first electric potential;

the second voltage signal collecting terminal is electrically connected to the first resistor second terminal to collect a second electric potential; and

the temperature signal collecting terminal is electrically connected to the temperature signal output terminal.

6. The thermal resistor test apparatus of claim 5, wherein the microcontroller further comprises an indication signal output terminal;

and the indication signal output terminal is grounded via a LED and a second resistor that are electrically connected in series.

7. The thermal resistor test apparatus of claim 5, wherein the microcontroller further comprises a first pulse signal output terminal, a control signal receiving terminal and a feedback signal receiving terminal;

the first pulse signal output terminal is adapted to output the PWM signal;

the control signal receiving terminal is adapted to receive the control signal; and

the feedback signal receiving terminal is adapted to output the temperature signals and voltage signals of the variable resistor unit.

8. The thermal resistor test apparatus of claim 7, wherein the voltage regulating circuit comprises an integrated operational amplifier and a first voltage regulator;

the integrated operational amplifier comprises a pulse signal input terminal, a second pulse signal output terminal, a DC voltage input terminal and a DC voltage output terminal;

the first voltage regulator comprises a control terminal and a voltage output terminal;

the pulse signal input terminal is electrically connected to the first pulse signal output terminal via a third resistor;

the second pulse signal output terminal is electrically connected to the DC voltage input terminal via a fourth resistor and a fifth resistor that are electrically connected in series;

the DC voltage output terminal is electrically connected to the control terminal; and

the voltage output terminal is grounded via the heating unit to output the first DC voltage to heat the variable resistor unit.

9. A thermal resistor test apparatus for a thermal resistor comprising:

a control device adapted to store a plurality of predetermined voltage values and outputs control signals according to the plurality of predetermined voltage values;

a temperature processing circuit adapted to receive the control signals via a conversion circuit, and output a pulse width modulation (PWM) signal according to the control signal;

a voltage regulating circuit adapted to receive the PWM signal and output a first direct current (DC) voltage to heat the thermal resistor;

a temperature detecting circuit adapted to detect temperature signals and current signals of the thermal resistor; and

a power supply circuit adapted to provide working voltages to the temperature detecting circuit, the temperature processing circuit and the voltage regulating circuit;

wherein the conversion circuit is adapted to convert a voltage level of the temperature signals and current signals which is identified by the control device;

the temperature detecting circuit is adapted to transmit the temperature signals and current signals to the control device via the temperature processing circuit and the conversion circuit; and

the control device is adapted to receive the temperature signals and current signals which have been converted of the thermal resistor and generate a resistance-temperature graph of the thermal resistor according to the temperature signals and the current signals.

10. The thermal resistor test apparatus of claim 9, wherein the power supply circuit comprises a second voltage regulator and a zener diode;

the second voltage regulator comprises a second voltage regulator input terminal, a second voltage regulator ground terminal and a second voltage regulator output terminal;

the zener diode comprises a zener diode anode and a zener diode cathode;

the second voltage regulator input terminal is electrically connected to a voltage adapter;

the second voltage regulator output terminal is adapted to output a third DC voltage;

the second voltage regulator output terminal is electrically connected to the zener diode cathode via a sixth resistor;

the zener diode anode is electrically connected to the second voltage regulator ground terminal; and

a connection point between the zener diode and the sixth resistor is adapted to output a fourth DC voltage.

11. The thermal resistor test apparatus of claim 9, wherein the temperature detecting circuit comprises a temperature sensor and a first resistor;

the temperature sensor comprises a temperature signal output terminal;

the first resistor comprises a first resistor first terminal and a first resistor second terminal;

the thermal resistor comprises a variable resistor unit and a heating unit;

the first DC voltage is adapted to heat the variable resistor unit via the heating unit;

the first resistor first terminal is adapted to receive a second DC voltage;

the first resistor second terminal is grounded via the variable resistor unit; and

the temperature sensor is adapted to detect temperature signals of the variable resistor unit and transmit the temperature signals to the temperature processing circuit via the temperature signal output terminal.

12. The thermal resistor test apparatus of claim 11, wherein the temperature processing circuit comprises a microcontroller;

the microcontroller comprises a first voltage signal collecting terminal, a second voltage signal collecting terminal and a temperature signal collecting terminal;

the first voltage signal collecting terminal is electrically connected to the first resistor first terminal to collect a first electric potential;

the second voltage signal collecting terminal is electrically connected to the first resistor second terminal to collect a second electric potential; and

the temperature signal collecting terminal is electrically connected to the temperature signal output terminal.

13. The thermal resistor test apparatus of claim 12, wherein the microcontroller further comprises an indication signal output terminal;

and the indication signal output terminal is grounded via a LED and a second resistor that are electrically connected in series.

14. The thermal resistor test apparatus of claim 12, wherein the microcontroller further comprises a first pulse signal output terminal, a control signal receiving terminal and a feedback signal receiving terminal;

the first pulse signal output terminal is adapted to output the PWM signal;

the control signal receiving terminal is adapted to receive the control signal; and

the feedback signal receiving terminal is adapted to output temperature signals and voltage signals of the variable resistor unit.

15. The thermal resistor test apparatus of claim 14, wherein the voltage regulating circuit comprises an integrated operational amplifier and a first voltage regulator;

the integrated operational amplifier comprises a pulse signal input terminal, a second pulse signal output terminal, a DC voltage input terminal and a DC voltage output terminal;

the first voltage regulator comprises a control terminal and a voltage output terminal;

the pulse signal input terminal is electrically connected to the first pulse signal output terminal via a third resistor;

the second pulse signal output terminal is electrically connected to the DC voltage input terminal via a fourth resistor and a fifth resistor that are electrically connected in series;

the DC voltage output terminal is electrically connected to the control terminal; and

the voltage output terminal is grounded via the heating unit to output the first DC voltage to heat the variable resistor unit.