Home network characterization method and system

• US 8,558,552 B2
• Filed: 09/24/2010
• Issued: 10/15/2013
• Est. Priority Date: 09/24/2010
• Status: Active Grant

• Current Assignee: Viavi Solutions, Inc. (Lumentum Holdings Inc.)
• Original Assignee: JDS Uniphase Corporation (Lumentum Holdings Inc.)
• Inventors: Chappell, Daniel K., Jones, Richard Earl Jr., Gaines, Eddie B.
• Primary Examiner(s): Hollington, Jermele M
• Assistant Examiner(s): PRETLOW, DEMETRIUS R
• Application Number:
  US12/889,969
• Publication Number:
  US 20120074952A1
• Time in Patent Office: 1,117 Days
• Field of Search: 324/534
• US Class Current: 324/534
• CPC Class Codes: G01R 31/11 using pulse reflection methods
• CPC Class Codes: H04B 3/46 Monitoring; Testing

Abstract

A method of characterizing a wiring network is implemented in a system which includes a test controller and at least two probes. On commands from the test controller, at least one of the probes changes its impedance between the nominal impedance of the wiring network and a mismatch impedance. Reflectometry measurements are performed before and after of switching the impedance of the second probe. At the first probe, an RF signal is generated and a reflected signal is measured. Then, the impedance of the second probe is changed, and again an RF signal is generated and a reflected signal is measured at the first probe. Additionally, a frequency response may be measured at the second probe. The results of the measurements are used for characterization of a transmission line between the first and second probes.

Claims

1. A method of characterizing a wiring network having a nominal impedance, comprising:

connecting first and second probes to the wiring network at first and second different locations;

at the first probe, generating a first frequency sweep and measuring a first sweep response generated by the wiring network reflecting the first frequency sweep, wherein an impedance of the second probe is equal to the nominal impedance;

changing the impedance of the second probe between the nominal impedance and a mismatch impedance different from the nominal impedance;

at the first probe, generating a second frequency sweep and measuring a second sweep response generated by the wiring network reflecting the second frequency sweep, wherein the impedance of the second probe is equal to the mismatch impedance;

at the second probe, generating a third frequency sweep and measuring a third sweep response generated by the wiring network reflecting the third frequency sweep, and wherein the impedance of the first probe is equal to the nominal impedance;

changing the impedance of the first probe between the nominal impedance and a mismatch impedance different from the nominal impedance;

at the second probe, generating a fourth frequency sweep and measuring a fourth sweep response generated by the wiring network reflecting the fourth frequency sweep, and wherein the impedance of the first probe is equal to the mismatch impedance; and

,

processing the first, second, third, and fourth sweep responses so as to provide characterization of a transmission line between the first and second probes.

2. A method as defined in claim 1 comprising:

connecting a third probe to the wiring network at a third location different from the first and second locations;

changing an impedance of the third probe between the nominal impedance and a mismatch impedance different from the nominal impedance;

at the first probe, generating two RF signals, one before and another after the changing the impedance of the third probe, and measuring two reflected signals generated by the wiring network reflecting the two RF signals.

3. A method as defined in claim 2 comprising, for each of the first, second, and third probes, changing the impedance of the probe between the nominal impedance and a mismatch impedance different from the nominal impedance and performing frequency sweeps by each of the two other probes before and after the changing of the impedance.

4. A method as defined in claim 1 further comprising:

at the second probe, measuring a first frequency response, wherein the first frequency response is a first test frequency sweep transmitted from the first probe and changed by the wiring network on transmission from the first probe to the second probe.

5. A method as defined in claim 4 further comprising:

at the first probe, measuring a second frequency response, wherein the second frequency response is a second test frequency sweep transmitted from the second probe and changed by the wiring network on transmission from the second probe to the first probe.

6. A method as defined in claim 1 wherein the characterization of the transmission line between the first and second probes includes a distance between the first and second probes.

7. A system for characterizing a wiring network, the system comprising:

a test controller comprising;

a user interface for receiving input from a user, and

a controller processor for generating commands based on the input from the user;

a first probe comprising;

an RF transmitter for transmitting an RF signal into the wiring network in response to one of the commands from the test controller,

a receiver for receiving a reflected signal from the wiring network, the reflected signal generated by the wiring network in response to the RF signal, and

a measuring circuit for measuring the reflected signal so as to obtain measurements of the reflected signal; and

,

a second probe external to the test controller, comprising;

an RF transmitter for transmitting an RF signal into the wiring network in response to one of the commands from the test controller,

a receiver for receiving the commands from the test controller, and

an impedance switch for changing an impedance of the second probe between a nominal impedance and a mismatch impedance different from the nominal impedance, in response to one of the commands from the test controller;

wherein the test controller is configured to command;

the first probe to perform a first reflectometry test when the impedance of the second probe is equal to the nominal impedance,

the second probe to change its impedance between the nominal impedance and the mismatch impedance, and

the first probe to perform a second reflectometry test when the impedance of the second probe is equal to the mismatch impedance; and

,

wherein the test controller is configured to process the measurements of the reflected signals obtained by the first probe in the first and second reflectometry tests so as to provide a characterization of the wiring network.

8. A system as defined in claim 7 wherein the first probe comprises an impedance switch for changing an impedance of the first probe between the nominal impedance and a mismatch impedance different from the nominal, and the second probe comprises a receiver for receiving reflected signals from the wiring network.

9. A system as defined in claim 7 comprising a network tester comprising a casing, the first probe, and the test controller, wherein the first probe and the test controller are within the casing.

10. A system as defined in claim 7 further comprising a third probe, wherein the test controller includes instructions for identifying a three-way splitter if the first probe is connected to an input port of the three-way splitter and second and third probes are connected to two output ports of the three-way splitter.

11. A system as defined in claim 7 wherein the first probe is configured to generate a frequency sweep including the RF signal and to measure a sweep response including the reflected signal, wherein the sweep response is generated by the wiring network reflecting the frequency sweep.

12. A system as defined in claim 7 wherein the second probe comprises a measuring circuit for measuring a first test signal transmitted from the first probe so as to obtain first test measurements, and wherein the test controller is configured to command the first probe to transmit the first test signal into the wiring network and the second probe to measure the first test signal received from the wiring network and to report the first test measurements to the test controller.

13. A system as defined in claim 12 wherein the first probe comprises a measuring circuit for measuring a second test signal transmitted from the second probe so as to obtain second test measurements, and wherein the test controller is configured to command the second probe to transmit a second test signal into the wiring network and the first probe to measure the second test signal received from the wiring network and to report the second test measurements to the test controller.