Three dimensional integration and methods of through silicon via creation
First Claim
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1. A method comprising:
- patterning a photoresist layer on a structure to define an opening and expose a first planar area on a sacrificial substrate layer, the exposed first planar area aligned vertically with a first conductor embedded in the structure;
etching to the exposed first planar area to form a cavity having a first depth in the structure;
removing a portion of the photoresist to increase the size of the opening to define a second planar area on the sacrificial substrate layer;
forming a doped portion in the sacrificial substrate layer, the doped portion aligned vertically with a second conductor embedded in the structure different from the first conductor;
etching the cavity to increase the depth of the cavity, the first conductor being exposed in response to the etching of the cavity; and
etching the doped portion to expose an underlying planar area, and etching the underlying planar area to increase the planar area and depth of a portion of the cavity, the second conductor being exposed in response to increasing the planar area and depth.
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Abstract
A method includes patterning a photoresist layer on a structure to define an opening and expose a first planar area on a sacrificial substrate layer, etching to the exposed first planar area to form a cavity having a first depth in the structure, removing a portion of the photoresist to increase the size of the opening to define a second planar area on the sacrificial substrate layer, forming a doped portion in the sacrificial substrate layer, and etching the cavity to increase the depth of the cavity to expose a first conductor in the structure and to increase the planar area and depth of a portion of the cavity to expose a second conductor in the structure.
59 Citations
7 Claims
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1. A method comprising:
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patterning a photoresist layer on a structure to define an opening and expose a first planar area on a sacrificial substrate layer, the exposed first planar area aligned vertically with a first conductor embedded in the structure; etching to the exposed first planar area to form a cavity having a first depth in the structure; removing a portion of the photoresist to increase the size of the opening to define a second planar area on the sacrificial substrate layer; forming a doped portion in the sacrificial substrate layer, the doped portion aligned vertically with a second conductor embedded in the structure different from the first conductor; etching the cavity to increase the depth of the cavity, the first conductor being exposed in response to the etching of the cavity; and etching the doped portion to expose an underlying planar area, and etching the underlying planar area to increase the planar area and depth of a portion of the cavity, the second conductor being exposed in response to increasing the planar area and depth. - View Dependent Claims (2, 3, 4, 5, 6, 7)
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Specification