PVT-free calibration circuit for TDC resolution in ADPLL

• US 8,570,082 B1
• Filed: 02/27/2013
• Issued: 10/29/2013
• Est. Priority Date: 02/27/2013
• Status: Active Grant

• Current Assignee: Taiwan Semiconductor Manufacturing Company Limited
• Original Assignee: Taiwan Semiconductor Manufacturing Company Limited
• Inventors: Kuo, Feng Wei, Chen, Huan-Neng, Jou, Chewn-Pu, Yen, Kuang-Kai, Liao, Hsien-Yuan, Hsiung, Lee Tsung, Staszewski, Robert Bogdan
• Primary Examiner(s): HOUSTON, ADAM D
• Application Number:
  US13/778,478
• Time in Patent Office: 244 Days
• Field of Search: 327/147, 327/158
• US Class Current: 327/158
• CPC Class Codes: H03L 1/00 Stabilisation of generator output against variations of physical values, e.g. power supply
• CPC Class Codes: H03L 2207/50 All digital phase-locked loop
• CPC Class Codes: H03L 7/16 Indirect frequency synthesis, i.e. generating a desired one of a number of predetermined frequencies using a frequency- or phase-locked loop
• CPC Class Codes: H03L 7/18 using a frequency divider or counter in the loop H03L7/20, H03L7/22 take precedence

Abstract

The present disclosure relates to an all digital phase locked loop (APDLL) that can account for variations in PVT conditions, and a related method of formation. In some embodiments, the ADPLL has a controllable time-to-digital converter (TDC) having a plurality of variable delay elements. The controllable TDC is determines a phase difference between a frequency reference signal and a local oscillator clock signal and to generate a phase error therefrom. A digitally controlled oscillator (DCO) varies a phase of the local oscillator clock signal based upon the phase error. A calibration unit determines an effect of variations in PVT (process, voltage, and temperature) conditions based upon the phase error and to generate a TDC tuning word that adjusts a delay introduced by one or more of the plurality of variable delay elements to account for the variations in PVT conditions.

Claims

1. An all digital phase locked loop (ADPLL), comprising:

a controllable time-to-digital converter (TDC) configured to determine a phase difference between a frequency reference signal and a local oscillator clock signal and to generate a variable phase therefrom;

a digitally controlled oscillator (DCO) configured to vary the phase of the local oscillator clock signal based upon the variable phase; and

a calibration unit configured to determine an effect of variations in PVT (process, voltage, and temperature) conditions based upon the variable phase, and to generate a TDC tuning word that adjusts a resolution of the controllable TDC to account for the effect of variations in PVT conditions.

2. The ADPLL of claim 1, further comprising:

a phase detector configured to determine a phase error comprising a difference between the variable phase and a reference phase received from a reference phase accumulator; and

a digital loop filter is configured to receive a phase error and to generate a control word from the phase error, which controls operation of the DCO.

3. The ADPLL of claim 2, further comprising:

a control unit configured to turn off power to the calibration unit if the phase error is within a first threshold value of an acceptable phase error.

4. The ADPLL of claim 2, further comprising:

a memory element configured to store one or more TDC tuning words if the phase error is within a first threshold value of an acceptable phase error.

5. The ADPLL of claim 2, wherein the calibration unit is configured to vary the resolution of the controllable TDC in a manner proportional to the phase error.

6. The ADPLL of claim 2, wherein the calibration unit comprises:

a multiplexor configured to receive the phase error and an inverted phase error having an opposite sign of the phase error;

a logical NOR gate configured to generate a control signal provides an output of the multiplexor to a first filtering element configured to generate an error in the TDC tuning word; and

a second filtering element configured to receive the error in the TDC tuning word and to generate an updated TDC tuning word from the error in the TDC tuning word.

7. The ADPLL of claim 2, wherein the digitally controlled TDC comprises:

a TDC core configured to receive the TDC tuning word, the local oscillator clock signal, and the frequency reference signal, and to determine a time difference between the local oscillator clock signal and the frequency reference signal that varies as a function of the TDC tuning word; and

a normal TDC configured to compare an output of the TDC core to a target resolution, wherein if the target resolution is not equal to the TDC resolution the normal TDC varies a value of the variable phase based upon the comparison.

8. The ADPLL of claim 7, wherein the TDC core comprises:

a first delay chain comprising a plurality of delay elements connected in series, wherein the first delay chain is configured to receive the frequency reference signal;

a second delay chain comprising a plurality of delay elements connected in series, wherein the second delay chain is configured to receive the local oscillator clock signal;

a variable delay chain connected in parallel with the second delay chain and comprising a plurality of programmable delay elements; and

a variable capacitor chain connected in parallel with the second delay chain and comprising a plurality of switchable capacitors.

9. The ADPLL of claim 8, wherein:

the TDC tuning word is configured to selectively operate a number of the programmable delay elements or the digitally controlled switch capacitors to vary achieve a resolution corresponding to the phase error.

10. The ADPLL of claim 7, wherein the TDC core comprises:

a first delay chain comprising a plurality of delay elements connected in series, wherein the first delay chain is configured to receive the clock signal;

a second delay chain comprising a plurality of delay elements connected in series, wherein the second delay chain is configured to receive the reference signal;

a variable delay chain connected in parallel with the second delay chain and comprising a plurality of programmable delay elements; and

a variable capacitor chain connected in parallel with the second delay chain and comprising a plurality of switchable capacitors.

11. The ADPLL of claim 1,

wherein the controllable time-to-digital converter (TDC) comprises a plurality of variable delay elements;

and

wherein the calibration unit is configured to vary the resolution of the controllable TDC by adjusting a value of a delay introduced by one or more of the plurality of variable delay elements.

12. The APDLL of claim 1, wherein the calibration unit is configured to determine a number of stages by dividing a maximum period of the DCO by a target TDC resolution.

13. An all digital phase locked loop (ADPLL), comprising:

a controllable time-to-digital converter (TDC) having a plurality of variable delay elements, wherein the controllable TDC is configured to determine a phase difference between a frequency reference signal and a local oscillator clock signal and to generate a variable phase therefrom;

a phase detector configured to determine a phase error comprising a difference between the variable phase and a reference phase received from a reference phase accumulator;

a digitally controlled oscillator (DCO) configured to vary the phase of the local oscillator clock signal based upon the phase error; and

a calibration unit configured to determine an effect of variations in PVT (process, voltage, and temperature) conditions based upon the phase error, and to generate a TDC tuning word that adjusts a delay introduced by one or more of the plurality of variable delay elements to mitigate the effect of the variations in PVT conditions.

14. The ADPLL of claim 13, wherein the TDC tuning word comprises a multi-bit digital word.

15. A method, comprising:

providing power to an all digital phase locked loop (APDLL) comprising a controllable time-to-digital converter (TDC) comprising a plurality of variable delay element;

operating the controllable TDC to determining a phase difference between a frequency reference signal and a local oscillator clock signal and to generate a variable phase therefrom;

determining an effect of variations in PVT (process, voltage, and temperature) conditions based upon the variable phase; and

generating a TDC tuning word that adjusts a resolution of the controllable TDC to mitigate an effect of the variations in PVT conditions.

16. The method of claim 15, wherein the TDC tuning word adjusts a delay introduced by one or more of the plurality of variable delay elements within the controllable TDC to mitigate the effect of the variations in PVT conditions.

17. The method of claim 16, further comprising:

determining a maximum period of a digitally controlled oscillator configured to generate the local oscillator clock signal;

determining a target TDC resolution; and

dividing the maximum period of the digitally controlled oscillator by the target resolution to determine a number of active variable delay elements in the controllable TDC.

18. The method of claim 15, further comprising:

determining a phase error comprising a difference between the variable phase and a reference phase received from a reference phase accumulator; and

determining a value of the TDC tuning word based upon the phase error.

19. The method of claim 18, wherein the resolution is adjusted in a manner proportional to the phase error.

20. The method of claim 18, further comprising:

storing the TDC tuning word if the phase error is within a first threshold value of an acceptable phase error.