Lens heating compensation systems and methods
First Claim
1. A method of calibrating a photolithographic system, comprising:
- generating a cold lens contour for a reticle design;
generating at least one hot lens contour for the reticle design;
characterizing aberrations induced by a corrective system in a correction model; and
optimizing a process window of the photolithographic system using the correction model, wherein optimizing the process window includes controlling the corrective system such that variations in parameters of one or more features of the reticle design obtained from the cold lens contour and the at least one hot lens contour lie within a predetermined limit over an optimal amount of photolithographic system process settings,wherein generating the cold lens contour includes using a lens model based on measurements obtained while a lens of the photolithographic system is maintained within a nominal operating temperature range,wherein each hot lens contour is generated using a corresponding lens heating model, wherein the lens heating model characterizes light-induced heating of the lens in a photolithographic process, andwherein optimizing the process window includes minimizing variations in critical dimensions caused by lens heating by inducing other variations in critical dimensions caused by lens aberrations.
2 Assignments
0 Petitions
Accused Products
Abstract
Methods for calibrating a photolithographic system are disclosed. A cold lens contour for a reticle design and at least one hot lens contour for the reticle design are generated from which a process window is defined. Aberrations induced by a lens manipulator are characterized in a manipulator model and the process window is optimized using the manipulator model. Aberrations are characterized by identifying variations in critical dimensions caused by lens manipulation for a plurality of manipulator settings and by modeling behavior of the manipulator as a relationship between manipulator settings and aberrations. The process window may be optimized by minimizing a cost function for a set of critical locations.
-
Citations
34 Claims
-
1. A method of calibrating a photolithographic system, comprising:
-
generating a cold lens contour for a reticle design; generating at least one hot lens contour for the reticle design; characterizing aberrations induced by a corrective system in a correction model; and optimizing a process window of the photolithographic system using the correction model, wherein optimizing the process window includes controlling the corrective system such that variations in parameters of one or more features of the reticle design obtained from the cold lens contour and the at least one hot lens contour lie within a predetermined limit over an optimal amount of photolithographic system process settings, wherein generating the cold lens contour includes using a lens model based on measurements obtained while a lens of the photolithographic system is maintained within a nominal operating temperature range, wherein each hot lens contour is generated using a corresponding lens heating model, wherein the lens heating model characterizes light-induced heating of the lens in a photolithographic process, and wherein optimizing the process window includes minimizing variations in critical dimensions caused by lens heating by inducing other variations in critical dimensions caused by lens aberrations. - View Dependent Claims (2, 3, 4, 5, 6, 7, 8, 9, 10, 11, 12, 13, 14, 15, 16, 17)
-
-
18. A device manufacturing method of calibrating a photolithographic system, comprising:
-
using a projection system to expose a target portion of a layer of radiation sensitive material which at least partially covers a substrate with a projection beam of radiation having a cross section, comprising; using patterning means to endow the projection beam with a pattern in the cross-section; generating a cold projection system contour for the patterning means; generating at least one hot projection system contour for the patterning means; characterizing aberrations induced by a projection system correction system in a correction model; and optimizing a process window using the correction model, wherein optimizing the process window includes calculating correction settings for the projection system correction system such that variations in parameters of one or more features of the reticle design obtained from the cold projection system contour and the at least one hot projection system contour lie within a predetermined limit over an optimal amount of photolithographic system process settings, and manipulating the projection system of the photolithographic system according to the calculated correction settings, wherein generating the cold projection system contour includes using a lens model based on measurements obtained while a lens of the photolithographic system is maintained within a nominal operating temperature range, wherein each hot projection system contour is generated using a corresponding lens heating model, wherein the lens heating model characterizes light-induced heating of the lens in a photolithographic process, and wherein optimizing the process window includes minimizing variations in critical dimensions caused by lens heating by inducing other variations in critical dimensions caused by lens aberrations. - View Dependent Claims (19)
-
-
20. A non-transitory computer readable medium bearing a computer program for calibrating a photolithographic system, the computer program, when executed, causing a computer to perform the steps of:
-
generating a cold lens contour for a reticle design; generating at least one hot lens contour for the reticle design; characterizing aberrations induced by a lens manipulator in a manipulator model; and optimizing a process window of the photolithographic system using the manipulator model, wherein optimizing the process window includes controlling the lens manipulator such that variations in parameters of one or more features of the reticle design obtained from the cold lens contour and the at least one hot lens contour lie within a predetermined limit over an optimal amount of photolithographic system process setting, wherein generating the cold lens contour includes using a model based on measurements obtained while the lens is maintained within a nominal operating temperature range, wherein each hot lens contour is generated using a corresponding lens heating model, wherein the lens heating model characterizes light-induced heating of the lens in a photolithographic process, and wherein optimizing the process window includes minimizing variations in critical dimensions caused by lens heating by inducing other variations in critical dimensions caused by lens aberrations. - View Dependent Claims (21, 22, 23, 24, 25, 26, 27, 28, 29, 30, 31, 32, 33, 34)
-
Specification