Methods of modeling a transistor and apparatus used therein

• US 8,572,546 B2
• Filed: 02/13/2012
• Issued: 10/29/2013
• Est. Priority Date: 05/20/2011
• Status: Expired due to Fees

• Current Assignee: Electronics and Telecommunications Research Institute
• Original Assignee: Electronics and Telecommunications Research Institute
• Inventors: Shin, Jaeheon, Cheong, Woo-Seok, Hwang, Chi-Sun, Chung, Sung Mook
• Primary Examiner(s): Chiang, Jack
• Assistant Examiner(s): Bowers, Brandon
• Application Number:
  US13/371,487
• Publication Number:
  US 20120297351A1
• Time in Patent Office: 624 Days
• Field of Search: 716/106, 716/136
• US Class Current: 716/136
• CPC Class Codes: G06F 30/367 Design verification, e.g. using simulation, simulation program with integrated circuit emphasis [SPICE], direct methods or relaxation methods

Abstract

Methods of modeling a transistor are provided. The method includes the steps of (a) extracting reference mobility values of a channel layer of a transistor including a gate electrode, a source region and a drain region using a reference gate voltage, a reference drain current and a reference drain voltage, (b) fitting a mobility function including model parameters on the reference mobility values to extract the model parameters, and (c) putting the extracted model parameters into a drain current modeling function to calculate a drain current flowing through the channel layer between the drain region and the source region under a bias condition defined by an arbitrary gate voltage applied to the gate electrode and an arbitrary drain voltage applied to the drain region. Related apparatuses are also provided.

Claims

1. A method of modeling a transistor, the method comprising performing, by an apparatus including a memory unit, the steps of:

extracting reference mobility values of a channel layer of a transistor including a gate electrode, a source region and a drain region using a reference gate voltage, a reference drain current and a reference drain voltage;

fitting a mobility function including model parameters on the reference mobility values to extract the model parameters; and

putting the extracted model parameters into a drain current modeling function to calculate a drain current flowing through the channel layer between the drain region and the source region under a bias condition defined by an arbitrary gate voltage applied to the gate electrode and an arbitrary drain voltage applied to the drain region;

wherein the mobility function is expressed by the following equation,

2. The method of claim 1, wherein the drain current modeling function is expressed by the following equation,

3. The method of claim 2, further comprising:

additionally and repeatedly performing the step of extracting the reference mobility values and the step of extracting the model parameters against different channel layers at least once to extract a plurality of model parameter data sets; and

storing a memory unit with the plurality of model parameter data sets.

4. The method of claim 3, further comprising selecting one set of the plurality of model parameter data sets,

wherein the drain current is calculated using the selected of model parameter data set.

5. The method of claim 1, wherein the reference mobility values are extracted using the following equation,

6. The method of claim 5, wherein the reference drain voltage is within the range of about 0.001 Volts to about 1.0 Volts.

7. The method of claim 1, further comprising applying the reference gate voltage and the reference drain voltage to the gate electrode and the drain region respectively to measure the reference drain current flowing through the channel layer between the drain region and the source region, prior to extraction of the reference mobility values.

8. The method of claim 1, wherein the transistor includes a thin film transistor.

9. The method of claim 1, wherein the channel layer has an amorphous structure.

10. The method of claim 1, wherein the channel layer includes an organic semiconductor material or an oxide semiconductor material.

11. An apparatus used in modeling a transistor, the apparatus comprising:

a reference mobility extraction unit for extracting reference mobility values of a channel layer of the transistor including a gate electrode, a source region and a drain region using a reference gate voltage applied to the gate electrode and a reference drain current flowing through the channel layer in response to the reference gate voltage;

a fitting unit for extracting model parameters by fitting a mobility function of the model parameters on the reference mobility values; and

a drain current modeling unit for calculating a drain current flowing through the channel layer by putting an arbitrary gate voltage applied to the gate electrode, an arbitrary drain voltage applied to the drain region and the model parameters into a drain current modeling function.

12. The apparatus of claim 11, wherein the drain current modeling unit additionally puts a channel length of the transistor, a channel width of the transistor, a gate capacitance between the channel layer and the gate electrode, an arbitrary drain voltage applied to the drain region, and a turn on voltage of the transistor into the drain current modeling function.

13. An apparatus used in modeling a transistor, the apparatus comprising:

a reference mobility extraction unit for extracting reference mobility values of a channel layer of the transistor including a gate electrode, a source region and a drain region using a reference gate voltage applied to the gate electrode and a reference drain current flowing through the channel layer in response to the reference gate voltage;

a fitting unit for extracting model parameters by fitting a mobility function of the model parameters on the reference mobility values; and

a drain current modeling unit for calculating a drain current flowing through the channel layer by putting an arbitrary gate voltage applied to the gate electrode, an arbitrary drain voltage applied to the drain region and the model parameters into a drain current modeling function;

wherein the drain current modeling unit additionally puts a channel length of the transistor, a channel width of the transistor, a gate capacitance between the channel layer and the gate electrode, an arbitrary drain voltage applied to the drain region, and a turn on voltage of the transistor into the drain current modeling function,

wherein the fitting unit extracts the model parameters by fitting a mobility function on the reference mobility values,

wherein the mobility function is expressed by the following equation,

14. The apparatus of claim 13:

wherein the number of the transistor is two or more,

wherein the channel layers of the plurality of transistors are formed of different material layers from each other, and

wherein the reference mobility extraction unit and the fitting unit extract a plurality of model parameter sets including the model parameters.

15. The apparatus of claim 14, further comprising a memory unit storing the plurality of model parameter sets therein.