Apparatus and system for implementing variable speed scan testing

• US 8,578,226 B2
• Filed: 08/17/2010
• Issued: 11/05/2013
• Est. Priority Date: 08/17/2010
• Status: Expired due to Fees

• Current Assignee: Eigenix Co.
• Original Assignee: Eigenix Co.
• Inventors: Chung, Sung Soo
• Primary Examiner(s): CHU, GABRIEL L
• Application Number:
  US12/806,594
• Publication Number:
  US 20120047412A1
• Time in Patent Office: 1,176 Days
• Field of Search: None
• US Class Current: 714/731
• CPC Class Codes: G01R 31/31727 Clock circuits aspects, e.g. test clock circuit details, timing aspects for signal generation, circuits for testing clocks G01R31/31725 takes precedence; concerning scan test G01R31/318552, for tester hardware G01R31/31922
• CPC Class Codes: G01R 31/318552 Clock circuits details
• CPC Class Codes: G01R 31/318594 Timing aspects clock circuits G01R31/318552
• CPC Class Codes: G06F 30/392 Floor-planning or layout, e.g. partitioning or placement
• CPC Class Codes: G06F 30/398 Design verification or optimisation, e.g. using design rule check [DRC], layout versus schematics [LVS] or finite element methods [FEM] optical proximity correction [OPC] design processes G03F1/36

Abstract

In an embodiment of the invention, variable test clock circuitry is provided within an integrated circuit desired to be tested. The variable test clock frequency implements a test clock control register that receives serial test data from a device tester and is configured to serially pass the received test data to scan test chains within the integrated circuit. The test clock control register stores test clock information. The test clock information is provided to a test clock generator where the test clock generator then produces test clock signals at a predetermined frequency. The test clock signal is then provided as a test clock frequency for the scan test chains within the integrated circuit. Methods are also disclosed for operating the variable test clock frequency.

Claims

1. A method for performing a scan test comprising:

shifting a test vector that is at least n+m bits long into a clock control register that is m bits long, wherein n bits corresponds to scan test stimulus information and m bits correspond to clock information and wherein m bits of clock information are stored in the clock control register;

shifting n bits of the test vector into a register of scan chain in an integrated circuit;

generating a test clock signal at a predetermined frequency responsive to the m bits of clock information;

generating a launch signal responsive to the test clock signal; and

generating a capture signal responsive to the test clock signal, wherein the capture signal initiates operation to capture a response pattern of the integrated circuit.

2. The method of claim 1, wherein the test vector is n+m+p bits long, wherein the time required to shift p bits corresponds to a delay for synchronizing the clock control register with the register.

3. The method of claim 1, further comprising loading a test instruction into an instruction register, wherein the instruction initiates the generation of the launch and capture signals.

4. The method of claim 1, further comprising shifting out of the register of scan chain the captured response pattern of the integrated circuit.

5. The method of claim 4, further comprising shifting out of the clock control register the clock information.

6. The method of claim 5, further comprising shifting n bits of a second test vector into a register of the scan chain in the integrated circuit while shifting out the captured response pattern.

7. The method of claim 6, further comprising shifting m bits of the test vector into the clock control register while shifting out the captured response pattern.

8. The method of claim 1, wherein the time between the launch and capture signals is responsive to the predetermined frequency of the test clock signal.

9. The method of claim 4, wherein the captured response pattern of the integrated circuit is compared to an expected response pattern.

10. The method of claim 1, wherein the predetermined frequency is chosen from among 2^m frequencies.