Method, apparatus and system providing adjustment of pixel defect map
First Claim
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1. An imager device comprising:
- an array of pixel image sensors for providing a plurality of pixel output signals;
a memory for storing a pixel defect map, the stored map having data on a plurality of locations, each location corresponding to a pixel image sensor in the array; and
a processor for determining if a pixel defect cluster is detected at a first location using said pixel output signals corresponding to the first location and at least one neighboring location in the array and, if a pixel defect cluster is detected at the first location based on analyzing more than one frame of an image, updating the stored pixel defect map based on a type of the pixel defect cluster,wherein the processor removes the pixel defect cluster at the first location from the stored map if the type of the pixel defect cluster at the first location is different from the type of a defect cluster that was previously present at the first location in the stored map.
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Abstract
A method, apparatus and system that allows for the identification of defective pixels, for example, defective pixel clusters, in an imager device. The method, apparatus and system determine, during use of the imager device, that a pixel defect, e.g., cluster defect, exists and accurately maps the location of the defective pixel. By analyzing more than one frame of an image, the method increases the accuracy of the defect mapping, which is used to improve the quality of the resulting image data.
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Citations
18 Claims
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1. An imager device comprising:
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an array of pixel image sensors for providing a plurality of pixel output signals; a memory for storing a pixel defect map, the stored map having data on a plurality of locations, each location corresponding to a pixel image sensor in the array; and a processor for determining if a pixel defect cluster is detected at a first location using said pixel output signals corresponding to the first location and at least one neighboring location in the array and, if a pixel defect cluster is detected at the first location based on analyzing more than one frame of an image, updating the stored pixel defect map based on a type of the pixel defect cluster, wherein the processor removes the pixel defect cluster at the first location from the stored map if the type of the pixel defect cluster at the first location is different from the type of a defect cluster that was previously present at the first location in the stored map. - View Dependent Claims (2, 3, 4, 5, 6, 7, 8, 9, 10)
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11. An imager device comprising:
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an array of pixel image sensors for providing a plurality of pixel output signals; a memory for storing a pixel defect map, the stored map having saved data on a plurality of locations, each location corresponding to a pixel image sensor in the array; and a processor for updating the stored pixel defect map using the pixel output signals to locate current pixel defects in accordance with pixel defect criterias, wherein for every current pixel defect, if the corresponding location in the stored map was previously marked as defective, the processor removes the defect mark for the corresponding location in the map when the saved data for the corresponding location in the map is different from current data of said respective current pixel defect. - View Dependent Claims (12, 13, 14, 15, 16, 17, 18)
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Specification