Test point design for a high speed bus
First Claim
1. A test point design comprising:
- a. a circuit board comprising a plurality of layers including a power plane, a ground plane, and a dielectric plane between the power plane and the ground plane, the circuit board further comprises a differential pair of signal lines including a first signal line and a second signal line; and
b. a pair of test point pads including a first test point pad connected to the first signal line and a second test point pad connected to second signal line, wherein a first portion of the power plane and a first portion of the ground plane below the first test point pad are removed, and a first portion of the dielectric plane below the first test point is not removed, and a second portion of the power plane and a second portion of the ground plane below the second test point pad are removed, and a second portion of the dielectric plane below the second test point is not removed, wherein the first portions of the power plane and the ground plane that are removed, and the first portion of the dielectric plane that is not removed are the portions of the power plane, dielectric plane and the ground plane that are aligned underneath the first test point pad, and the second portions of the power plane and the ground plane that are removed, and the second portion of the dielectric plane that is not removed are the portions of the power plane, dielectric plane and the ground plane that are aligned underneath the second test point pad, and wherein the removed portions remain void of any material.
1 Assignment
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Accused Products
Abstract
A circuit board includes a pair of differential signal lines and a pair of test point pads, one test point pad coupled to one of the signal lines and another of the test point pads coupled to another of the signal lines. The two test point pads are staggered relative to each other and the two signal lines. The circuit board includes a plurality of conductive layers and a plurality of insulating layers. The conductive layers can be etched into conductive patterns, or traces, for connecting the electronic components, which are soldered to the circuit board. The conductive layers may be selectively connected together by vias. One or more of the conductive layers may be a metal plane for providing a ground plane and/or a power plane. To minimize or eliminate the capacitance generated between the test point pad and an underlying ground plane and/or power plane, portions of the ground plane and/or the portion of the power plane directly aligned with each test point pad are removed.
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Citations
11 Claims
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1. A test point design comprising:
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a. a circuit board comprising a plurality of layers including a power plane, a ground plane, and a dielectric plane between the power plane and the ground plane, the circuit board further comprises a differential pair of signal lines including a first signal line and a second signal line; and b. a pair of test point pads including a first test point pad connected to the first signal line and a second test point pad connected to second signal line, wherein a first portion of the power plane and a first portion of the ground plane below the first test point pad are removed, and a first portion of the dielectric plane below the first test point is not removed, and a second portion of the power plane and a second portion of the ground plane below the second test point pad are removed, and a second portion of the dielectric plane below the second test point is not removed, wherein the first portions of the power plane and the ground plane that are removed, and the first portion of the dielectric plane that is not removed are the portions of the power plane, dielectric plane and the ground plane that are aligned underneath the first test point pad, and the second portions of the power plane and the ground plane that are removed, and the second portion of the dielectric plane that is not removed are the portions of the power plane, dielectric plane and the ground plane that are aligned underneath the second test point pad, and wherein the removed portions remain void of any material. - View Dependent Claims (2, 3, 4, 5, 6, 7, 8, 9, 10, 11)
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Specification