System and method for programmable automatic testing of power supplied

• US 8,589,110 B2
• Filed: 03/03/2009
• Issued: 11/19/2013
• Est. Priority Date: 03/03/2009
• Status: Expired due to Fees

• Current Assignee: Synergistic Technologies Solutions Incorporated
• Original Assignee: Synergistic Technologies Solutions Incorporated
• Inventors: Liu, Guang, Choi, Alex Kurnia
• Primary Examiner(s): Kundu, Sujoy
• Assistant Examiner(s): BETSCH, REGIS J
• Application Number:
  US12/380,663
• Publication Number:
  US 20100225466A1
• Time in Patent Office: 1,722 Days
• Field of Search: 702/117, 702/118, 702/121, 324/764.01
• US Class Current: 702/118
• CPC Class Codes: G01R 31/2834 Automated test systems [ATE]; using microprocessors or computers G01R31/317 takes precedence; ATE for detection of defective computer hardware G06F11/2736

Abstract

A cost-effective system architecture and apparatus for programmable automatic power supply testing. The system utilizes board level interface between various system testing modules and an Automatic Test Controller (ATC). The ATC receives coded test requests from the software on an industrial PC and control the various testing modules inside ATC to execute the tests. Test results were sent back to the PC and saved in a result file. A single industrial PC can control two or more ATC'"'"'s and test two or more power supply units simultaneously. The ATC based test system is lower cost than the conventional Automatic Test Equipment which uses device level interface and standardized test devices.

Claims

1. A system for programmable automatic testing of a plurality of power supply units comprising:

a computer that hosts application software and a user interface (UI) for programmable automatic testing of the plurality of power supply units, having a plurality of communication links connecting to a plurality of devices;

a plurality of automatic test controllers (ATCs) with each one receiving test commands and parameter limits from the computer via a communication link, wherein the plurality of ATCs providing power and supplying a programmable test load, each ATC for connecting to and testing a power supply unit under test (UUT) from the plurality of power supply units;

a programmable power source providing a programmable source of power to the plurality of ATCs;

a sync box that provides communication between the programmable power source and all connected plurality of ATCs via communication links such that all connected plurality of ATCs can share the same programmable power source for UUT testing;

the plurality of ATCs receiving via the communication links a synchronization signal from the sync box so the programmable power source is applied to all ATC connected UUTs at the right instance;

the ATCs each controlling an internal electronic load module to apply the programmable test load consisting of a load type and level to the connected UUT for testing, controlling various internal measurement modules to measure requested power supply parameters of the UUT according to the test commands, determining the passing or failing of the UUT according to the test data and parameter limits, and sending the Pass/Fail information to the computer for display and storage.

2. The system for programmable automatic testing of power supplies of claim 1 wherein the plurality of devices connected to the computer includes one or more of:

a barcode scanner that scans the barcode on the UUTs and sends them to the computer so the test record of a UUT is identified with its barcode;

a printer connected to the computer for printing out error message for a failed UUT so as to provide clue for production line repair workers.

3. An automatic test controller (ATC) apparatus for programmable automatic testing of a power supply unit under test (UUT) wherein the ATC comprises:

a processor as the main control device for the automatic test controller;

a power analyzer module that is connected to the processor, wherein the power analyzer module measures the input voltage, current, real and apparent power, total harmonic distortion (THD) and power factor at the input of the UUT;

an electronic load module that is connected to the output of the UUT, with the electronic load linked to the processor via pulse width modulation (PWM) channels and general purpose input/output (GPIO) pins, wherein the desired voltage or current for the power supply testing is set by the pulse width on the PWM channels, and the load type is set by the GPIO pins;

a multi-channel direct current (DC) measurement module that is used to measure the output parameters of the UUT, having at least two channels measuring the output voltage and current, two other channels measuring the output from a ripple/noise measurement module, and communicating the measurement results to the processor via a board level synchronous peripheral interface (SPI) port connection;

the ripple/noise measurement module wherein the input is connected to the output of the power supply UUT, and the outputs of the ripple/noise measurement module comprising two or more channels are connected to the multi-channel DC measurement module;

an isolated communication link between the processor on the ATC and the computer, wherein the ATC both receives coded test information/command and transmit test results via this isolated communication link;

an isolated communication link between the processor on the ATC and a Sync Box, wherein the programmable power source setting request is sent from the ATC to the Sync Box;

a solid state relay that is connected between the programmable power source output and the power analyzer module in the ATC, wherein the solid state relay can be controlled to turn on either at the zero crossing or at the peak of the AC voltage waveform, and the solid state relay is controlled by the processor via a GPIO pin;

an inrush current measurement module that catches the peak input current to the UUT, wherein the output of the inrush measurement module is fed to an ADC pin on the processor.

4. The ATC apparatus in claim 3 further comprises:

a peak voltage detecting circuit connected to the output of the UUT, where the peak voltage of the UUT is captured and fed to the processor via an ADC channel;

a first DC voltage source connected to the output of the UUT for Over-Voltage Protection (OVP) test, wherein the voltage level of this DC voltage source is controlled by a PWM signal from the processor;

a second DC voltage source used to provide a bias voltage for a special test situation, wherein the voltage level of this DC voltage source is controlled by a PWM signal from the processor.

5. The ATC apparatus in claim 4 wherein the special test situation is a battery charger UUT and the second DC voltage source provides the voltage to emulate a battery during charger startup.

6. The ATC apparatus in claim 3 further comprising one or more of:

at least one uncommitted relay that is controlled by the processor via a GPIO pin;

one or more LED'"'"'s that is used to provide user signals, wherein at least one LED of one colors indicating PASS and another Led of a different color indicating FAIL, and still another LED indicating whether the power is applied to the UUT;

an audible alert device that gives out a short beep when a test set is successfully completed, and gives out multiple long beeps when a test failed;

a Test START switch interface that feeds the external starting signal to a GPIO pin on the DSP, indicating users command to start testing;

a User Overwrite switch interface that passes external User Overwrite signal to a GPIO pin on the DSP, allowing an operator to enter fault condition when a fault condition is observed by the operator;

a DSP controller firmware programming interface that is connected between the DSP and an external serial programmer, wherein this interface allow field update of the software after the automatic test system has been deployed in the field;

a light sensor interface to sense the lighted indicator on some UUTs.

7. The ATC apparatus of claim 6 wherein the uncommitted relays perform one or more of the following:

the uncommitted relay being used to select the output voltage level of those power supply UUTs that have selectable output voltages;

the uncommitted relay being used to short a component on a power supply UUT to create a fault condition on the UUT for fault protection testing.

8. A method for using an automatic test controller (ATC) apparatus for programmable automatic testing of a power supply unit under test (UUT), comprising:

providing an automatic test controller (ATC) which has a main processor and a plurality of internal modules to perform the testing of a power supply unit under test (UUT) connected to the ATC;

using board level communication links within the ATC to communicate between the main processor and the various modules;

using a computer with user interface to pass test commands to the ATC and receive test results from the ATC via a communication link;

using a programmable power source to provide power to the UUT under ATC control;

using a Sync Box, wherein the programmable power source setting request is sent from the ATC to the Sync Box;

using a solid state relay to control the precise instance when the power is applied to the input of the UUT;

using a power analyzer module to measure input voltage, current, real power, apparent power, power factor, total harmonic distortion (THD);

using an electronic load module to provide different load types and levels to the output of the UUT, wherein the desired voltage or current for the power supply testing is set by the pulse width on the PWM channels;

measuring the output voltage and current of the UUT using a multi-channel direct current (DC) measurement module having at least two channels measuring the output voltage and current, two other channels measuring the output from a ripple/noise measurement module;

wherein the outputs of the ripple/noise measurement module comprising two or more channels are connected to the multi-channel DC measurement module;

measuring the peak input current to the UUT using an inrush current measurement module.

9. The method of claim 8, further comprising one or more of:

using a peak voltage detection circuit to measure the output overshoot voltage of the UUT.

10. The method of claim 8, further comprising:

using one or more uncommitted relays to trigger external devices for special test conditions;

using a light sensor to detect the light indicator on the UUT;

using a first programmable DC voltage source for over voltage protection (OVP) test of the UUT;

using a second programmable DC voltage source to provide bias for special test requirement of the UUT;

using a set of LEDs and a buzzer to provide visual and audible indication of the test status;

using an isolated input voltage sensor to provide input voltage phase angle for inrush current test.

11. A method for programmable automatic testing of a plurality of power supply units, comprising:

providing computer user interface for users to generate test sequence files by selecting at least one test set and specifying parameters and their corresponding limits for each test set;

using a plurality of automatic test controllers (ATCs) with each one receiving test commands and parameter limits from the computer via a communication link, wherein the plurality of ATCs providing power and supplying a programmable test load, each ATC for connecting to and testing a power supply unit under test (UUT) from the plurality of power supply units;

providing a protocol for the communications between the computer and the plurality of ATCs such that the test sets are processed one by one, until the complete sequence has been processed;

providing a programmable power source providing a programmable source of power to the plurality of ATCs;

providing a sync box that provides communication between the programmable power source and all connected plurality of ATCs via communication links such that all connected plurality of ATCs can share the same programmable power source for UUT testing;

receiving by the ATCs via the communication links a synchronization signal from the sync box so the programmable power source is applied to all ATC connected UUTs at the right instance;

controlling by each ATC an internal electronic load module to apply the programmable test load consisting of a load type and level to the connected UUT for testing, controlling various internal measurement modules to measure requested power supply parameters of the UUT according to the test commands, determining the passing or failing of the UUT according to the test data and parameter limits, and sending the Pass/Fail information to the computer for display and storage.

12. The method of claim 11, further comprising:

loading a test sequence file on to the computer;

starting a test by sending a Test START signal to all connected ATCs;

passing the first test set information from the computer to the plurality of ATCs via communication links;

controlling plurality of ATCs to apply the desired load type/level and other test conditions on the UUTs;

controlling the plurality of ATCs to measure the specified test parameters of the UUTs;

comparing the measured parameters against the corresponding limits and determining passing or failing of the test;

passing the measured parameters and the PASS/FAIL information from the ATC to the computer via the communication link;

sending the subsequent test set information in the test sequence to the plurality of ATCs after receiving results of the previous test set from the plurality of ATCs;

displaying the test result of the previous test set for all UUTs on the user interface;

continuing to process all the test sets included in the test sequence file loaded to the computer;

ending the test at the completion of the last test set in the test sequence by displaying an overall PASS/FAIL result for each UUT.

13. The method of claim 11, further comprising:

Providing an option in the user interface wherein a user can select excluding some data to be sent back to the computer to speed up the processing time, with “

PASS/FAIL”

being the minimum data allowable.

14. The method of claim 11, further comprising:

categorizing all power supply test types into a plurality of test sets, with each test set requiring a specific power source output and load condition applied to the connected UUT;

placing all the measurement, control modules and a main processor into a single enclosure forming an ATC for testing of power supplies;

having the main processor to communicate with the measurement and control modules via board level communication links.

15. The method of claim 14, further comprising one or more of the following:

defining a startup test set wherein the power source is applied to the UUT at the peak of the AC voltage waveform, and the input inrush current, output voltage overshoot, startup time of the UUT are measured;

defining an idle test set wherein the no-load input power, input voltage and input current of the UUT are measured;

defining a constant voltage (CV) region test set wherein the load is set to constant current (CC) or constant resistance (CR) mode, and the input voltage, current, power and power factor, THO and output voltage, current, voltage ripple and noise, and power supply efficiency are measured;

defining a constant current (CC) region test set wherein the load is set to constant voltage (CV) or constant resistance (CR) mode, and the input voltage, current, power and power factor, THD and output voltage, current, voltage ripple and noise, and power supply efficiency are measured;

defining an under-voltage lockout (UVLO) test set wherein the input voltage is set below the minimum operating voltage of the UUT and the output voltage is measured;

defining a short circuit (SC) test set wherein the load is set to short circuit condition, and the input current, voltage, real and apparent power, power factor, THO and output average current are measured;

defining an over-current protection (OCP) test set wherein the load current is increased by small steps until the UUT output is shut off, and the over-current protection trip point current and voltage are measured;

defining an over-voltage protection (OVP) test set wherein the DC source inside the ATC applies voltage to the output of the UUT in small incremental steps until the UUT output is shut off, and the voltage and current at the OVP trip point are measured;

defining a line regulation test set wherein two different input voltages are applied to the UUT with full load and the output voltages of the UUT at two different input voltages are measured;

defining a load regulation test set wherein two different load levels are applied to the output of the UUT, and the voltage and current are measured for both load conditions;

defining a power down test set wherein the output voltage overshoot and holdup time of the UUT are measured when the input power to the UUT is turned off;

defining a supporting function wherein a user specified delay can be executed, and a load discharge function can be performed at the end of a test to avoid electric shock hazard due to the residual charge on high voltage bulk capacitors on some UUTs.

16. The method of claim 11, wherein the communication method between the computer and the ATCs for programmable automatic testing of power supplies, comprising the steps of:

establishing the communication link between the computer and all the connected ATCs at the beginning of a test;

loading the pre-programmed test sequence file and setting up a test result file to be stored on the computer;

sending a Sequence Header in the sequence file to the connected ATCs;

waiting for acknowledgement from all the connected ATCs;

waiting for Test START signal from the ATCs once acknowledgements are received from all connected ATCs;

scanning the barcodes of the connected UUTs;

sending first test set information to the ATCs;

waiting for the ATCs to execute the first test set and send back the test result;

saving and displaying the first test set results and send the information for the second test set to the ATCs;

waiting for the ATCs to execute the second test set and send back the test result;

saving and displaying the second test set results and send the information for the third test set to the ATCs;

repeating the process until the last test set result is saved and overall test result is displayed;

looping back to wait for the Test START signal again from the ATCs for testing of the next batch of power supply UUTs.