Frequency specific closed loop feedback control of integrated circuits

• US 8,593,169 B2
• Filed: 09/16/2011
• Issued: 11/26/2013
• Est. Priority Date: 04/16/2002
• Status: Expired due to Term

• Current Assignee: Meta Platforms, Inc. (f/k/a Facebook, Inc.)
• Original Assignee: Intellectual Ventures Funding LLC (Intellectual Ventures LLC)
• Inventors: Koniaris, Kleanthes G., Burr, James B.
• Primary Examiner(s): Hollington, Jermele M
• Application Number:
  US13/235,301
• Publication Number:
  US 20120001651A1
• Time in Patent Office: 802 Days
• Field of Search: None
• US Class Current: 324/762.01
• CPC Class Codes: G01R 31/2621 for testing field effect transistors, i.e. FET's
• CPC Class Codes: G05B 13/021 in which a variable is automatically adjusted to optimise the performance
• CPC Class Codes: G06F 1/3203 Power management, i.e. event-based initiation of a power-saving mode
• CPC Class Codes: G06F 1/324 by lowering clock frequency
• CPC Class Codes: G06F 1/3296 by lowering the supply or operating voltage
• CPC Class Codes: H03K 3/012 Modifications of generator to improve response time or to decrease power consumption
• CPC Class Codes: H03K 3/0315 Ring oscillators
• CPC Class Codes: Y02D 10/00 Energy efficient computing, e.g. low power processors, power management or thermal management

Abstract

Systems and methods for frequency specific closed loop feedback control of integrated circuits. In one embodiment, a plurality of controllable inputs to an integrated circuit is adjusted to achieve a frequency specific predetermined value of a dynamic operating indicator of the integrated circuit at the desired specific operating frequency. The predetermined value is stored in a data structure within a computer usable media. The data structure comprises a plurality of frequency specific predetermined values for a variety of operating frequencies. An operating condition of an integrated circuit is controlled via closed loop feedback based on dynamic operating indicators of the measured behavior of the integrated circuit.

Claims

1. A method, comprising:

accessing a first memory location to obtain an operating frequency value of a processing device corresponding to a desired level of power consumption by the processing device;

operating the processing device at an operating frequency related to the operating frequency value;

measuring one or more operating parameters associated with operation of the processing device during operation of the processing device at the operating frequency to obtain corresponding one or more operating parameter values;

storing the one or more operating parameter values in a second set of memory locations;

accessing a third set of memory locations to obtain one or more operating parameter target values;

comparing the one or more operating parameters values to corresponding ones of the one or more operating parameter target values; and

adjusting a voltage supplied to the processing device responsive to the comparing to cause a level of power consumption by the processing device to approach the desired level of power consumption by the processing device.

2. The method as recited in claim 1, wherein:

the one or more operating parameters include a temperature of the processing device.

3. The method as recited in claim 1, wherein:

the voltage supplied to the processing device includes a body bias voltage.

4. The method as recited in claim 1, wherein:

the voltage supplied to the processing device includes an operating voltage.

5. The method as recited in claim 4, wherein:

the desired level of power consumption corresponds to a lowest level of power consumption achievable for the processing device while operating properly at the operating frequency and with the operating voltage supplied to the processing device.

6. The method as recited in claim 4, wherein:

the operating frequency corresponds to a greatest operating frequency achievable for the processing device while operating properly and with the operating voltage supplied to the processing device.

7. The method as recited in claim 1, wherein:

the comparing includes determining one or more differences between the one or more operating parameter values and the corresponding ones of the one or more operating parameter target values.

8. The method as recited in claim 1, wherein:

the one or more operating parameters includes oscillations of a ring oscillator during a time interval.

9. The method as recited in claim 1, wherein:

the one or more operating parameters includes a leakage current.

10. An apparatus, comprising:

an integrated circuit; and

a memory operable to store an operating frequency value for the integrated circuit corresponding to a desired level of power consumption by the integrated circuit, operable to store one or more operating parameter values corresponding to one or more operating parameters in a second set of memory locations, and operable to store one or more operating parameter target values;

wherein the integrated circuit is operable to compare the one or more operating parameter values to corresponding ones of the one or more operating parameter target values, the integrated circuit includes first circuitry configured to measure the one or more operating parameters to obtain the one or more operating parameter values, and the integrated circuit includes second circuitry configured to control a voltage supplied to the integrated circuit responsive to a result from the comparison of the one or more operating parameter values to the corresponding ones of the one or more operating parameter target values to cause a level of power consumption by the integrated circuit to approach the desired level of power consumption by the integrated circuit during operation of the integrated circuit at an operating frequency related to the operating frequency value.

11. The apparatus as recited in claim 10, wherein:

the integrated circuit includes a processing device.

12. The apparatus as recited in claim 11, wherein:

the integrated circuit includes the memory.

13. The apparatus as recited in claim 11, wherein:

the processing device includes a microprocessor.

14. The apparatus as recited in claim 10, wherein:

the one or more operating parameters include a temperature of the integrated circuit.

15. The apparatus as recited in claim 10, wherein:

the voltage supplied to the integrated circuit includes a body bias voltage.

16. The apparatus as recited in claim 10, wherein:

the voltage supplied to the integrated circuit includes an operating voltage.

17. The apparatus as recited in claim 16, further comprising:

a variable voltage supply operable to supply the operating voltage to the integrated circuit responsive to the control by the second circuitry.

18. The apparatus as recited in claim 16, wherein:

the desired level of power consumption corresponds to a lowest level of power consumption achievable for the integrated circuit while operating properly at the operating frequency and with the operating voltage supplied to the integrated circuit.

19. The apparatus as recited in claim 16, wherein:

the operating frequency corresponds to a greatest operating frequency achievable for the integrated circuit while operating properly and with the operating voltage supplied to the integrated circuit.

20. The apparatus as recited in claim 10, wherein:

the integrated circuit is also operable to determine one or more differences between the one or more operating parameter values and the corresponding ones of the one or more operating parameter target values.