Automatic internal trimming calibration method to compensate process variation
First Claim
Patent Images
1. An integrated circuit having an automatic timing trimming capability, comprising:
- an interface control block that receives a chip select signal, an external reference signal, and an automatic trimming enable signal and generates an internal chip control signal and an internal reference signal according to the external reference signal;
an internal timing circuit and a read fuse information block, the internal timing circuit being adapted to receive fuse information from the read fuse information block and generate a read-speed timing reference signal according to the fuse information and the internal chip control signal; and
a timing result combination and classification die corner circuit that receives the read-speed timing reference signal and the internal reference signal and generates a plurality of samples of the external reference signal according to the read-speed timing reference signal.
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Abstract
A method is described for performing an automatic internal trimming operation that can compensate process variation and supply voltage variation in an integrated circuit. A reference signal is applied when the integrated circuit is in an automatic internal trimming mode, and integrated circuit timing is trimmed into a predetermined target range after applying predefined reference cycles.
62 Citations
5 Claims
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1. An integrated circuit having an automatic timing trimming capability, comprising:
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an interface control block that receives a chip select signal, an external reference signal, and an automatic trimming enable signal and generates an internal chip control signal and an internal reference signal according to the external reference signal; an internal timing circuit and a read fuse information block, the internal timing circuit being adapted to receive fuse information from the read fuse information block and generate a read-speed timing reference signal according to the fuse information and the internal chip control signal; and a timing result combination and classification die corner circuit that receives the read-speed timing reference signal and the internal reference signal and generates a plurality of samples of the external reference signal according to the read-speed timing reference signal. - View Dependent Claims (2, 3, 4, 5)
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Specification