System and method for improved testing of electronic devices

• US 8,598,888 B2
• Filed: 05/04/2010
• Issued: 12/03/2013
• Est. Priority Date: 05/04/2010
• Status: Expired due to Fees

• Current Assignee: Electro Scientific Industries Incorporated (MKS Instruments Incorporated)
• Original Assignee: Electro Scientific Industries Incorporated (MKS Instruments Incorporated)
• Inventors: Cooke, Vernon
• Primary Examiner(s): VALONE, THOMAS F
• Application Number:
  US12/773,549
• Publication Number:
  US 20110273184A1
• Time in Patent Office: 1,309 Days
• Field of Search: 324/537
• US Class Current: 324/537
• CPC Class Codes: G01R 31/01 Subjecting similar articles in turn to test, e.g. "go/no-go" tests in mass production; Testing objects at points as they pass through a testing station testing of cables continuously passing the testing apparatus G01R31/59; testing dielectric strength or breakdown voltage G01R31/12
• CPC Class Codes: G01R 31/2893 Handling, conveying or loading, e.g. belts, boats, vacuum fingers G01R31/2867 takes precedence; handling semiconductor devices or wafers during manufacture or treatment H01L21/67

Abstract

An improved method of testing and sorting electronic devices uses two or more test stations and two or more sorting stations applied to a single track to improve system throughput. Applying two or more test stations and two or more sorting stations to a single track accomplishes improved system throughput while increasing system cost less than would be expected if a duplicate track was installed for each test station.

Claims

1. A method of handling devices using a system, said system having a track for transporting said devices along a route, the method comprising:

providing said system with a first station adjacent to a first position along said route and a second station adjacent to a second position along said route; and

indexing said track at least once to simultaneously transport a first portion of said devices and a second portion of said devices along said route to said first and second positions, respectively, from said first and second positions, respectively, or successively to and from said first and second positions, respectively,

wherein each indexing is performed such that, for each index, said first and second portions of said devices are transported a pitch distance that is greater than a distance between the first position and the second position along the route.

2. The method of claim 1 wherein said device is an electronic device.

3. The method of claim 2 wherein said electronic device is a light emitting diode.

4. The method of claim 1 wherein said track is rotary.

5. The method of claim 1 wherein said track is linear.

6. The method of claim 1 wherein said system has more than one track.

7. The method of claim 2 wherein said electronic device is a passive electronic component.

8. The method of claim 1, wherein said pitch distance is an integer multiple of said distance between said first position and said second position along said route.

9. The method of claim 8, wherein said pitch distance is three times said distance between said first position and said second position along said route.

10. The method of claim 1, wherein said first station is a first test station and said second station is a second test station and wherein said method further comprises:

transporting, with said track, said first portion of said devices to said first position and said second portion of said devices to said second position;

testing said first portion of said devices with said first test station to obtain first test results;

testing said second portion of said devices with said second test station to obtain second test results; and

after testing said first and second portions of said devices, transporting, with said track, said first portion of said devices from said first position and said second portion of said devices from said second position,

wherein at least one selected from the group consisting of transporting said first and second portions of said devices to respective ones of said first and second positions and transporting said first and second portions of said devices from respective ones of said first and second positions comprises performing said indexing.

11. The method of claim 10, further comprising testing said first and second portions simultaneously.

12. The method of claim 1, wherein said first station is a first sorting station and said second station is a second sorting station and wherein said method further comprises:

transporting, with said track, said first portion of said devices to said first position and said second portion of said devices to said second position, wherein said transporting said first and second portions of said devices to respective ones of said first and second positions comprises performing said indexing;

sorting said first portion of said devices with said first sorting station based upon first test results previously obtained from a first test station; and

sorting said second portion of said devices with said second sorting station based upon second test results previously obtained from a second test station.

13. The method of claim 12, further comprising sorting said first and second portions simultaneously.

14. A system for handling devices, comprising:

a track operative to transport said devices along a route by indexing;

a first station arranged adjacent to a first position along said route; and

a second station arranged adjacent to a second position along said route;

wherein said track is operative to be indexed by a pitch distance at least once to simultaneously transport a first portion of said devices and a second portion of said devices along said route, to said first and second positions, respectively, from said first and second positions, respectively, or successively to and from said first and second positions, respectively, wherein said pitch distance is greater than a distance between the first position and the second position along the route.

15. The system of claim 14 wherein said track is rotary.

16. The system of claim 14 wherein said track is linear.

17. The system of claim 14 further comprising more than one track and at least one set of additional stations arranged adjacent to each track.

18. The system of claim 14, wherein said first station is a first test station and said second station is a second test station, wherein the first and second test stations are configured to test at least one selected from the group consisting of an electrical property and an optical property of the first and second portions of the devices, respectively.

19. The system of claim 14, wherein said first station is a first sort station and said second station is a second sort station, wherein the first and second sort stations are configured to sort the first and second portions of the devices, respectively, based upon test results previously obtained for the first and second portions of the devices, respectively.

20. The system of claim 14, wherein said pitch distance is an integer multiple of said distance between said first position and said second position along said route.