Detection and mitigation of particle contaminants in MEMS devices
First Claim
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1. A MEMS device comprising:
- a substrate supporting a set of MEMS device structures;
a conductive shield layer partially covering a surface of the substrate and leaving an uncovered potential trap region;
a conductive gate layer embedded within the substrate, the conductive gate layer having a first extended portion underlying the potential trap region; and
a controller coupled to the conductive shield layer and the conductive gate layer, the controller including circuitry to place the same electrical potential on both the conductive shield layer and the conductive gate layer such that the potential trap region becomes a substantially field-free region when the same electrical potential is placed on both the conductive shield layer and the conductive gate layer.
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Abstract
Detecting and/or mitigating the presence of particle contaminants in a MEMS device involves converting benign areas in which particles might become trapped undetectably by electric fields during test to field-free regions by extending otherwise non-functional conductive shield and gate layers and placing the same electrical potential on the conductive shield and gate layers. Particle contaminants can then be moved into detection locations remote from the potential trap areas and having particle detection structures by providing some mechanical disturbance.
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Citations
20 Claims
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1. A MEMS device comprising:
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a substrate supporting a set of MEMS device structures; a conductive shield layer partially covering a surface of the substrate and leaving an uncovered potential trap region; a conductive gate layer embedded within the substrate, the conductive gate layer having a first extended portion underlying the potential trap region; and a controller coupled to the conductive shield layer and the conductive gate layer, the controller including circuitry to place the same electrical potential on both the conductive shield layer and the conductive gate layer such that the potential trap region becomes a substantially field-free region when the same electrical potential is placed on both the conductive shield layer and the conductive gate layer. - View Dependent Claims (2, 3, 4, 5, 6, 7)
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8. A method of producing a MEMS device, the MEMS device including a substrate supporting a set of MEMS device structures, the method comprising:
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forming a conductive gate layer embedded within the substrate, the conductive gate layer having a first extended portion underlying a potential trap region; and forming a conductive shield layer partially covering a surface of the substrate and leaving the potential trap region uncovered, wherein the conductive shield layer and the conductive gate layer are configured such that the potential trap region becomes a substantially field-free region when the same electrical potential is placed on both the conductive shield layer and the conductive gate layer. - View Dependent Claims (9, 10, 11, 12, 13, 14)
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15. A method of detecting particle contaminants in a MEMS device having a substrate supporting a set of MEMS device structures, a conductive shield layer partially covering a surface of the substrate and leaving an uncovered potential trap region, and a conductive gate layer embedded within the substrate and having a first extended portion underlying the potential trap region, the method comprising:
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placing the same electrical potential on both the conductive shield layer and the conductive gate layer such that the potential trap region becomes a substantially field-free region; and providing a mechanical disturbance to the MEMS device to move any particles from the potential trap region to at least one particle detection structure. - View Dependent Claims (16, 17, 18, 19, 20)
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Specification