Temperature measurement and control for laser and light-emitting diodes

• US 8,605,763 B2
• Filed: 03/31/2010
• Issued: 12/10/2013
• Est. Priority Date: 03/31/2010
• Status: Active Grant

• Current Assignee: Microsoft Technology Licensing LLC (Microsoft Corporation)
• Original Assignee: Microsoft Corporation
• Inventors: Castillo, Leo Del, Yee, Dawson
• Primary Examiner(s): Park, Kinam
• Application Number:
  US12/751,877
• Publication Number:
  US 20110243167A1
• Time in Patent Office: 1,350 Days
• Field of Search: 372 381- 3802, 372/38.07, 372 34- 36, 372/29.015, 372/29.011
• US Class Current: 372/34
• CPC Class Codes: H01S 5/02415 by using a thermo-electric cooler [TEC], e.g. Peltier element
• CPC Class Codes: H01S 5/0617 using memorised or pre-programmed laser characteristics
• CPC Class Codes: H01S 5/06804 by monitoring an external parameter, e.g. temperature
• CPC Class Codes: H01S 5/0683 by monitoring the optical output parameters
• CPC Class Codes: H01S 5/06837 Stabilising otherwise than by an applied electric field or current, e.g. by controlling the temperature
• CPC Class Codes: H05B 45/14 using electrical feedback from LEDs or from LED modules
• CPC Class Codes: H05B 45/18 using temperature feedback

Abstract

The existing diodes in an LED or laser diode package are used to measure the junction temperature of the LED or laser diode. The light or laser emissions of a diode are switched off by removing the operational drive current applied to the diode package. A reference current, which can be lower the operational drive current, is applied to the diode package. The resulting forward voltage of the diode is measured using a voltage measurement circuit. Using the inherent current-voltage-temperature relationship of the diode, the actual junction temperature of the diode can be determined. The resulting forward voltage can be used in a feedback loop to provide temperature regulation of the diode package, with or without determining the actual junction temperature. The measured forward voltage of a photodiode or the emissions diode in a diode package can be used to determine the junction temperature of the emissions diode.

Claims

1. A method of operating an emission diode for junction temperature determination, comprising:

characterizing the emission diode by measuring an operating temperature of the emission diode when producing emissions at a predetermined wavelength;

setting a target operating temperature equal to the measured operating temperature;

providing a drive current to the emission diode at a level sufficient to enable emissions by the emission diode;

removing the drive current from the emission diode;

providing a reference current to the emission diode at a level less than the drive current level after removing the drive current from the emission diode;

determining a forward voltage level of the emission diode under application of the reference current; and

controlling an operating temperature of the emission diode based on the forward voltage level and the target operating temperature.

2. A method according to claim 1, wherein controlling the operating temperature of the emission diode includes:

comparing the forward voltage level of the emission diode to a reference voltage level corresponding to the target operating temperature for the emission diode;

if the forward voltage level of the emission diode is higher than the reference voltage level, heating the emission diode; and

if the forward voltage level of the emission diode is lower than the reference voltage level, cooling the emission diode.

3. A method according to claim 1, wherein controlling the operating temperature of the emission diode includes:

determining a junction temperature of the emission diode based on the forward voltage level and the reference current level;

comparing the junction temperature of the emission diode to the target operating temperature for the emission diode;

heating the emission diode if the junction temperature is lower than the target operating temperature; and

cooling the emission diode if the junction temperature is higher than the target operating temperature.

4. A method according to claim 1, wherein determining a junction temperature of the emission diode includes:

accessing a lookup table; and

determining the junction temperature from an entry in the lookup table containing the measured forward voltage level.

5. A method according to claim 1, wherein characterizing the emission diode includes:

measuring the forward voltage of the emissions diode at a plurality of known temperatures; and

generating the lookup table with entries containing the measured forward voltages and the corresponding known temperature.

6. A method according to claim 1, wherein the emission diode is in a package with a photodiode, the method further comprising:

providing the reference current to the photodiode; and

determining a forward voltage level of the photodiode under application of the reference current;

wherein controlling the operating temperature of the emission diode is based on the forward voltage level of the emission diode and the forward voltage level of the photodiode.

7. A method according to claim 1, wherein the drive current is a first drive current, the method further comprising:

characterizing the emission diode;

determining that the first drive current causes emissions by the emission diode at a predetermined wavelength; and

setting the level of the first drive current as an output of a first diode driver circuit for the emission diode.

8. A method according to claim 7, wherein the emission diode is a first emission diode, the method further comprising:

characterizing a second emission diode;

determining that a second drive current causes emissions by the second emission diode at the predetermined wavelength, a level of the second drive current being different than the level of the first drive current;

setting the level of the second drive current as an output of a second diode driver circuit for the second emission diode;

providing the second drive current to the second emission diode to cause emissions by the second emission diode at the predetermined wavelength;

providing the reference current to the second emission diode after removing the second drive current from the second emission diode;

determining a forward voltage level of the second emission diode under application of the reference current; and

controlling an operating temperature of the second emission diode based on the forward voltage level of the second emission diode.

9. A method according to claim 1, further comprising:

applying the drive current to the emission diode after providing the reference current.

10. A method according to claim 1, wherein the reference current is not sufficient to cause emissions by the emission diode.

11. A method according to claim 1, wherein the emission diode is a laser diode.

12. A method according to claim 1, wherein the emission diode is a light-emitting diode.

13. An emission diode driver, comprising:

at least one current source, the at least one current source supplies a drive current for an emission diode coupled to the emission diode driver and a reference current for the emission diode;

at least one voltage measurement circuit, the at least one voltage measurement circuit measures a forward voltage of the emission diode while the reference current is applied to the emission diode; and

at least one control circuit that controls an operating temperature of a diode package based on the measured forward voltage of the emission diode and a target operating temperature that is equal to a characterized operating temperature of the emission diode when producing emissions at a predetermined wavelength.

14. An emission diode driver according to claim 13, wherein:

the at least one control circuit includes a temperature controller;

the at least one control circuit compares the measured forward voltage of the emission diode to a reference voltage level corresponding to the target operating temperature for the diode package; and

the temperature controller heats the diode package if the measured forward voltage of the photodiode is higher than the reference voltage level and cools the diode package if the measured forward voltage of the photodiode is lower than the reference voltage level.

15. An emission diode driver according to claim 13, wherein:

the at least one control circuit includes a temperature controller and a lookup table;

the at least one control circuit determines a junction temperature of the emission diode from an entry in the lookup table containing the measured forward voltage and compares the junction temperature to the target operating temperature for the diode package; and

the temperature controller heats the diode package if the junction temperature is lower than the target operating temperature and cools the diode package if the junction temperature is higher than the target operating temperature.

16. An emission diode driver according to claim 13, wherein:

the emission diode is in a package with a photodiode;

the at least one current source removes the drive current from the emission diode while supplying the reference current to the emission diode;

the at least one current source supplies the reference current to the photodiode after removing the drive current;

the at least one voltage measurement circuit measures a forward voltage of the photodiode while the reference current is applied to the photodiode; and

the at least one control circuit controls the operating temperature of the diode package based on the measured forward voltage of the photodiode and the measured forward voltage of the emission diode.

17. A method of operating an emission diode in a diode package with a photodiode, comprising:

characterizing the emission diode package by measuring an operating temperature of the emission diode when producing emissions at a predetermined wavelength;

setting a reference forward voltage for the photodiode based on the measured operating temperature of the emission diode;

providing a drive current to the emission diode at a level sufficient to enable emissions by the emission diode;

removing the drive current from the emission diode;

providing a reference current to the photodiode at a level less than the drive current level after removing the drive current from the emission diode;

determining a forward voltage level of the photodiode under application of the reference current; and

controlling an operating temperature of the emission diode based on comparing the forward voltage level of the photodiode to the reference forward voltage.

18. A method according to claim 17, wherein setting the reference forward voltage for the photodiode based on the measured operating temperature comprises:

measuring a forward voltage of the photodiode when the emission diode is at the measured operating temperature for producing emissions at the predetermined wavelength.

19. A method according to claim 18, wherein characterizing the emission diode package includes:

measuring the forward voltage of the photodiode at a plurality of known temperatures for the emission diode; and

generating the lookup table with entries containing the measured forward voltages of the photodiode and the corresponding known temperature.