Methods and apparatus for hybrid outlier detection
First Claim
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1. A test data analysis system for analyzing test data for multiple components fabricated on a wafer, comprising:
- a memory configured to store the test data; and
a hybrid outlier system having access to the memory and configured to, for each of a plurality of test data for each of a plurality of components;
select a central component from the plurality of components;
identify a plurality of local components in a local area near the central component;
determine a derived value of the test data for the plurality of local components;
compare the test data for the central component to the derived value for the plurality of local components; and
identify whether the test data for the central component represents a hybrid outlier according to the comparison of the test data for the central component to the derived value for the plurality of local components.
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Abstract
Methods and apparatus for data analysis according to various aspects of the present invention are configured to identify statistical outliers in test data for components, including hybrid outliers representing outliers within subsets of larger data populations. A method and apparatus according to various aspects of the present invention may operate in conjunction with a test system having a tester, such as automatic test equipment (ATE) for testing semiconductors.
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Citations
21 Claims
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1. A test data analysis system for analyzing test data for multiple components fabricated on a wafer, comprising:
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a memory configured to store the test data; and a hybrid outlier system having access to the memory and configured to, for each of a plurality of test data for each of a plurality of components; select a central component from the plurality of components; identify a plurality of local components in a local area near the central component; determine a derived value of the test data for the plurality of local components; compare the test data for the central component to the derived value for the plurality of local components; and identify whether the test data for the central component represents a hybrid outlier according to the comparison of the test data for the central component to the derived value for the plurality of local components. - View Dependent Claims (2, 3, 4, 5, 6, 7)
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8. A computer-implemented method for analyzing test data for multiple components fabricated on a wafer, comprising:
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selecting a central component from the multiple components; identifying a plurality of local components in a local area near the central component; determining a derived value of the test data for the plurality of local components via a computer; comparing the test data for the central component to the derived value for the plurality of local components; and identifying whether the test data for the central component represents a hybrid outlier according to the comparison of the test data for the central component to the derived value for the plurality of local components. - View Dependent Claims (9, 10, 11, 12, 13, 14)
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15. A non-transitory computer-readable medium containing computer instructions stored therein for causing a computer processor to perform analysis on test data for components on a wafer, wherein the instructions cause the computer to:
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select a central component; identify a plurality of local components in a local area near the central component; determine a derived value of the test data for the plurality of local components; compare the test data for the central component to the derived value for the plurality of local components; and identify whether the test data for the central component represents a hybrid outlier according to the comparison of the test data for the central component to the derived value for the plurality of local components. - View Dependent Claims (16, 17, 18, 19, 20, 21)
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Specification