Organic light emitting diode display device and method of driving the same

• US 8,610,437 B2
• Filed: 08/16/2010
• Issued: 12/17/2013
• Est. Priority Date: 08/14/2009
• Status: Active Grant

• Current Assignee: Samsung Display Company Limited (Samsung Electronics Co. Ltd.)
• Original Assignee: Samsung Display Company Limited (Samsung Electronics Co. Ltd.)
• Inventors: Oh, Eun-Jung
• Primary Examiner(s): Hollington, Jermele M
• Application Number:
  US12/805,713
• Publication Number:
  US 20110037744A1
• Time in Patent Office: 1,219 Days
• Field of Search: None
• US Class Current: 324/522
• CPC Class Codes: G09G 2300/0426 Layout of electrodes and connections
• CPC Class Codes: G09G 3/006 Electronic inspection or testing of displays and display drivers, e.g. of LED or LCD displays testing individual LED's G01R31/2635; testing lamps G01R31/44; testing of optical features of LCD displays G02F1/1309
• CPC Class Codes: G09G 3/3208 organic, e.g. using organic light-emitting diodes [OLED]

Abstract

An organic light emitting diode display device that includes a first substrate, a second substrate, a sealing material sealing a space between the first and second substrates and applied along an edge of the second substrate, an interconnection disposed inside the sealing material, and a test unit connected to both ends of the interconnection and configured to measure a preset voltage applied to the interconnection and compare the measured voltage with a reference voltage to determine whether a crack occurred in the sealing material or not. Further, the same effect can be obtained by measuring and comparing currents instead of the voltages.

Claims

1. An organic light emitting diode display device, comprising:

a first substrate;

a second substrate;

a sealing material sealing a space between the first and second substrates and applied along an edge of the second substrate;

an interconnection disposed inside the sealing material; and

a test unit connected to both ends of the interconnection, said test unit measures a preset voltage applied to the interconnection, compares the measured voltage with a reference voltage and determines whether or not a crack occurred in the sealing material.

2. The organic light emitting diode display device according to claim 1, wherein the reference voltage is the preset voltage applied to the interconnection.

3. The organic light emitting diode display device according to claim 1, wherein the reference voltage is a voltage measured at a previous point of time.

4. The organic light emitting diode display device according to claim 3, wherein the test unit includes:

a power supply section connected to both ends of the interconnection and configured to apply the preset voltage;

a measuring section connected to said both ends of the interconnection and configured to measure the applied preset voltage; and

a determination section configured to compare the reference voltage with the measured voltage to determine whether or not a crack occurred in the sealing member, depending on whether or not the reference voltage and the measured voltage are identical.

5. The organic light emitting diode display device according to claim 4, wherein the test unit further includes a display section configured to display the reference voltage, the measured voltage, whether or not the reference voltage and the measured voltage are identical, and whether or not a crack occurred in the sealing material.

6. The organic light emitting diode display device according to claim 2, wherein the test unit includes:

a power supply section connected to both ends of the interconnection and configured to apply the preset voltage;

a measuring section connected to both ends of the interconnection and configured to measure the applied preset voltage; and

a determination section configured to compare the reference voltage with the measured voltage to determine whether or not a crack occurred in the sealing member, depending on whether or not the reference voltage and the measured voltage are identical.

7. The organic light emitting diode display device according to claim 6, wherein the test unit further includes a display section configured to display the reference voltage, the measured voltage, whether or not the reference voltage and the measured voltage are identical, and whether or not a crack occurred in the sealing material.

8. The organic light emitting diode display device according to claim 1, further comprising:

a display area including organic light emitting diodes formed between the first and second substrates; and

a non-display area that is a region of the first substrate extending beyond the second substrate,

wherein the test unit is disposed in the non-display area.

9. A method for driving an organic light emitting diode display device, comprising:

applying a preset voltage through both ends of an interconnection disposed inside a sealing material for sealing first and second substrate of the organic light emitting diode display device;

measuring a voltage at said both ends of the interconnection; and

comparing the measured voltage with a reference voltage to determine whether or not a crack occurred in the sealing material, depending on whether or not the measured voltage and reference voltage are identical.

10. The method according to claim 9, wherein when the reference voltage is identical to the measured voltage, it is determined that a crack did not occur in the sealing material, and when the reference voltage is not identical to the measured voltage, it is determined that a crack occurred in the sealing material.

11. The method according to claim 9, wherein the reference voltage is the preset voltage.

12. The method according to claim 9, wherein the reference voltage is a voltage measured at a previous point of time.

13. An organic light emitting diode display device, comprising:

a first substrate;

a second substrate;

a sealing material sealing a space between the first and second substrates and applied along an edge of the second substrate;

an interconnection disposed inside the sealing material; and

a test unit connected to both ends of the interconnection, said test unit measures a preset current applied to the interconnection, compares the measured current with a reference current and determines whether or not a crack occurred in the sealing material.

14. The organic light emitting diode display device according to claim 13, wherein the reference current is the preset current.

15. The organic light emitting diode display device according to claim 13, wherein the reference current is a current measured at a previous point of time.

16. The organic light emitting diode display device according to claim 14, wherein the test unit includes:

a power supply section connected to both ends of the interconnection and configured to apply the preset current;

a measuring section connected to said both ends of the interconnection and configured to measure the applied preset current; and

a determination section configured to compare the reference current with the measured current, and to determine whether or not a crack occurred in the sealing member, depending on whether or not the reference current and the measured current are identical.

17. The organic light emitting diode display device according to claim 16, wherein the test unit further includes a display section configured to display the reference current, the measured current, whether or not the reference current and the measured current are identical, and whether or not a crack occurred in the sealing material.

18. The organic light emitting diode display device according to claim 13, further comprising:

a display area including organic light emitting diodes formed between the first and second substrates; and

a non-display area that is a region of the first substrate extending beyond the second substrate,

wherein the test unit is disposed in the non-display area.

19. A method for driving an organic light emitting diode display device, comprising:

applying a preset current through both ends of an interconnection disposed inside a sealing material;

measuring a current at said both ends of the interconnection; and

comparing the measured current with a reference current to determine whether or not a crack occurred in the sealing material, depending on whether or not the measured current and the reference current are identical.

20. The method according to claim 19, wherein when the reference current is identical to the measured current, it is determined that a crack did not occur in the sealing material, and when the reference current is not identical to the measured current, it is determined that a crack occurred in the sealing material.

21. The method according to claim 19, wherein the reference current is the preset current.

22. The method according to claim 19, wherein the reference current is a current measured at a previous point of time.