Marking method for the reject marking of test elements
First Claim
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1. A marking method for marking test elements, comprising:
- providing test elements adapted to detect at least one analyte in a sample;
providing at least some of the test elements with a defect marking which contains digital information indicating the test elements are defective or non-defective, wherein the test elements include at least one radiation-sensitive material;
exposing the test elements to at least one radiation, the radiation being adapted to induce said marking in the form of at least one optically detectable change in the at least one radiation-sensitive material; and
wherein the at least one radiation-sensitive material is a test material of the test elements, wherein the test material defines the analytical functionality of a field of the test element and is adapted to change at least one of a measurable electrical property and a measurable optical property when the at least one analyte is present in the sample.
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Abstract
The test elements are provided that are adapted to detect at least one analyte in a sample. At least some of the test elements are provided with a defect marking which contains information about defectiveness of the test elements. The test elements include at least one radiation-sensitive material. The test elements are exposed to at least one radiation, the radiation being adapted to induce marking in the form of at least one optically detectable change in the radiation-sensitive material.
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Citations
26 Claims
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1. A marking method for marking test elements, comprising:
- providing test elements adapted to detect at least one analyte in a sample;
providing at least some of the test elements with a defect marking which contains digital information indicating the test elements are defective or non-defective, wherein the test elements include at least one radiation-sensitive material;
exposing the test elements to at least one radiation, the radiation being adapted to induce said marking in the form of at least one optically detectable change in the at least one radiation-sensitive material; and
wherein the at least one radiation-sensitive material is a test material of the test elements, wherein the test material defines the analytical functionality of a field of the test element and is adapted to change at least one of a measurable electrical property and a measurable optical property when the at least one analyte is present in the sample. - View Dependent Claims (2)
- providing test elements adapted to detect at least one analyte in a sample;
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3. A marking system for marking defective test elements, comprising:
at least one test element adapted to detect at least one analyte in a sample, the at least one test element including a test field and at least one marking field formed separately from the test field, the at least one marking field comprising a radiation-sensitive material;
a marking device adapted to provide the at least one test element with a defect marking which contains digital information indicating the at least one test element is defective or non-defective, wherein the marking device includes at least one radiation source for exposing the at least one test element to at least one radiation, the radiation being adapted to induce marking in the form of at least one optically detectable change in the radiation-sensitive material; and
wherein the at least one radiation-sensitive material is a test material of the test elements, wherein the test material defines the analytical functionality of a field of the test element and is adapted to change at least one of a measurable electrical property and a measurable optical property when the at least one analyte is present in the sample.- View Dependent Claims (4, 5, 6, 7, 8, 9, 10, 11, 12)
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13. A marking method for marking test elements, comprising:
- providing test elements adapted to detect at least one analyte in a sample;
providing at least some of the test elements with a reject marking in response to determining the test elements are defective, wherein the test elements include a radiation-sensitive test material adapted to change at least one of a measurable electrical property and a measurable optical property when the at least one analyte is present in the sample; and
exposing the test elements to at least one radiation, the radiation being adapted to induce said marking in the form of at least one optically detectable change in the radiation-sensitive test material. - View Dependent Claims (14, 15, 16, 17, 18, 19, 20, 21, 22, 23, 24, 25)
- providing test elements adapted to detect at least one analyte in a sample;
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26. A marking system for marking defective test elements, comprising:
at least one test element adapted to detect at least one analyte in a sample, the at least one test element including a radiation-sensitive test material adapted to change at least one of a measurable electrical property and a measurable optical property when the at least one analyte is present in the sample; and
a marking device adapted to provide the at least one test element with a reject marking in response to determining the at least one test element is defective, wherein the marking device includes at least one radiation source for exposing the at least one test element to at least one radiation, the radiation being adapted to induce marking in the form of at least one optically detectable change in the radiation-sensitive test material.
Specification