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Marking method for the reject marking of test elements

  • US 8,618,511 B2
  • Filed: 09/18/2008
  • Issued: 12/31/2013
  • Est. Priority Date: 09/19/2007
  • Status: Active Grant
First Claim
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1. A marking method for marking test elements, comprising:

  • providing test elements adapted to detect at least one analyte in a sample;

    providing at least some of the test elements with a defect marking which contains digital information indicating the test elements are defective or non-defective, wherein the test elements include at least one radiation-sensitive material;

    exposing the test elements to at least one radiation, the radiation being adapted to induce said marking in the form of at least one optically detectable change in the at least one radiation-sensitive material; and

    wherein the at least one radiation-sensitive material is a test material of the test elements, wherein the test material defines the analytical functionality of a field of the test element and is adapted to change at least one of a measurable electrical property and a measurable optical property when the at least one analyte is present in the sample.

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