Identification of integrated circuits

• US 8,620,982 B2
• Filed: 04/02/2013
• Issued: 12/31/2013
• Est. Priority Date: 05/11/2009
• Status: Expired due to Fees

• Current Assignee: Empire Technology Development LLC (Allied Inventors Management, LLC), Regents of the University of California (University of California)
• Original Assignee: Empire Technology Development LLC (Allied Inventors Management, LLC)
• Inventors: Potkonjak, Miodrag, Koushanfar, Farinaz
• Primary Examiner(s): SUN, SCOTT C
• Application Number:
  US13/855,421
• Publication Number:
  US 20130226477A1
• Time in Patent Office: 273 Days
• Field of Search: None
• US Class Current: 708/446
• CPC Class Codes: G01R 19/25 using digital measurement techniques
• CPC Class Codes: G01R 31/2851 Testing of integrated circuits [IC] G01R31/317 takes precedence; testing individual devices G01R31/26; testing printed circuits G01R31/2801
• CPC Class Codes: G06F 15/00 Digital computers in general details G06F1/00 – G06F13/00; Data processing equipment in general
• CPC Class Codes: G06F 21/73 by creating or determining hardware identification, e.g. serial numbers

Abstract

Techniques are generally described for generating an identification number for an integrated circuit (IC). In some examples, methods for generating an identification of an IC may comprise selecting circuit elements of the IC, evaluating measurements of an attribute of the IC for the selected circuit elements, wherein individual measurements are associated with corresponding input vectors previously applied to the IC, solving a plurality of equations formulated based at least in part on the measurements taken of the attribute of the IC for the selected circuit elements to determine scaling factors for the selected circuit elements, and transforming the determined scaling factors for the selected circuit elements to generate an identification number of the IC. Additional variants and embodiments may also be disclosed.

Claims

1. A method for identifying integrated circuits, the method comprising:

selecting one or more circuit elements of an integrated circuit;

evaluating measurements of one or more attributes for the selected one or more circuit elements, wherein the measurements are associated with corresponding input vectors applied to the integrated circuit;

formulating one or more equations based at least in part on the measurements of the one or more attributes;

solving the one or more equations to determine scaling factors for the selected one or more circuit elements, wherein the scaling factors reflect a relationship between nominal values for the attributes and measured values for the attributes;

transforming the determined scaling factors for the selected one or more circuit elements to generic transformed scaling factors; and

generating an identification number of the integrated circuit based on the transformed scaling factors.

2. The method of claim 1, wherein the one or more attributes for the selected one or more circuit elements comprise at least one of a leakage current, a time delay between an input and output of the one or more circuit elements, a switching power, a parasitic capacitance, an inductance, a resistance, a gain, an offset voltage, a threshold voltage, an operating temperature, a power consumption, or an idle current.

3. The method of claim 1, wherein the one or more equations include a corresponding error term based at least in part on an error in the measurements, and wherein solving the one or more equations comprises:

utilizing an objective function to minimize a norm of the error terms of the one or more equations.

4. The method of claim 1, wherein transforming the determined scaling factors comprises:

selecting one or more of the scaling factors; and

mapping the one or more selected scaling factors to corresponding binary codes;

wherein generating the identification number includes generating the identification number of the integrated circuit using the mapped binary codes.

5. The method of claim 1, further comprising:

selecting a first set of one or more circuit elements that are to be used to generate the identification number;

identifying a first set of one or more scaling factors corresponding to the first set of circuit elements;

mapping the first set of one or more scaling factors to a first binary value;

selecting a second set of one or more circuit elements that are not to be used to generate the identification number; and

mapping the second set of one or more circuit elements to a second binary value, wherein generating the identification number includes generating of an indicator string based on the first and second binary values.

6. The method of claim 1, wherein transforming comprises:

generating a probability distribution function of the scaling factors;

partitioning a graph of the probability distribution function into individual segments such that each of the individual segments has approximately equal area or width;

assigning respective binary codes to the individual segments such that the individual segments are associated with a respective one of the binary codes; and

assigning the respective binary codes to the scaling factors included in the individual segments based on the binary codes assigned to the individual segments;

wherein generating the identification number includes generating the identification number of the integrated circuit using the binary codes assigned to the individual scaling factors.

7. The method of claim 1, further comprising evaluating a collision probability that includes a determination of a probability of a first integrated circuit having a same identification number as a second integrated circuit.

8. The method of claim 1, wherein selecting the one or more circuit elements comprises selecting a first plurality of circuit elements, and wherein the generated identification number is a first identification number, and the method further comprises:

evaluating a collision probability that includes a determination of a probability of a first integrated circuit having a same identification number as a second integrated circuit;

determining that the collision probability is higher than a threshold collision probability;

selecting a second plurality of circuit elements based on the determination that the collision probability is higher than the threshold collision probability, wherein the second plurality of circuit elements includes more circuit elements than the first plurality of circuit elements; and

generating a second identification number of the integrated circuit, such that the second identification number has a lower collision probability than the first identification number.

9. A computing device effective to identify integrated circuits the computing device comprising:

a memory effective to store an identification number for an integrated circuit;

a processor configured in communication with the memory;

the processor effective to;

select one or more circuit elements of the integrated circuit;

evaluate measurements of one or more attributes for the selected one or more circuit elements, wherein the measurements are associated with corresponding input vectors applied to the integrated circuit;

formulate one or more equations based at least in part on the measurements of the one or more attributes;

solve the one or more equations to determine scaling factors for the selected one or more circuit elements, wherein the scaling factors reflect a relationship between nominal values for the attributes and the measured values for the attributes;

transform the determined scaling factors for the selected one or more circuit elements to generate transformed scaling factors; and

generate the identification number of the integrated circuit based on the transformed scaling factors.

10. The computing device of claim 9, wherein the one or more attributes for the selected one or more circuit elements comprise at least one of a leakage current, a time delay between an input and output of the one or more circuit elements, a switching power, a parasitic capacitance, an inductance, a resistance, a gain, an offset voltage, a threshold voltage, an operating temperature, a power consumption, or an idle current.

11. The computing device of claim 9, wherein the one or more equations include a corresponding error term based at least in part on an error in the measurements, and wherein the processor is effective to solve the one or more equations by utilization of an objective function to minimize a norm of the error terms of the one or more equations.

12. The computing device of claim 9, wherein the processor is configured to transform the determined scaling factors by being configured to:

select one or more of the scaling factors; and

map the one or more selected scaling factors to corresponding binary codes;

wherein to generate the identification number, the processor is configured to generate the identification number of the integrated circuit using the mapped binary codes.

13. The computing device of claim 9, wherein the processor is further configured to:

select a first set of one or more circuit elements that are to be used to generate the identification number;

identify a first set of one or more scaling factors that correspond to the first set of circuit elements;

map the first set of one or more scaling factors to a first binary value;

select a second set of one or more circuit elements that are not to be used to generate the identification number, and

map the second set of one or more circuit elements to a second binary value;

wherein to generate the identification number, the processor is configured to generate the identification number through generation of an indicator string based on the first and second binary values.

14. The computing device of claim 9, wherein the processor is further configured to transform the determined scaling factors by being configured to:

generate a probability distribution function of the scaling factors;

partition a graph of the probability distribution function into individual segments such that each of the individual segments has approximately equal area or width;

assign respective binary codes to the individual segments such that the individual segments are associated with a respective one of the binary codes; and

assign the respective binary codes to the scaling factors included in the individual segments based on the binary codes assigned to the individual segments;

wherein to generate the identification number, the processor is configured to generate the identification number of the integrated circuit using the binary codes assigned to the scaling factors.

15. The computing device of claim 9, wherein the processor is further effective to:

evaluate a collision probability that includes a determination of a probability of a first integrated circuit having a same identification number as a second integrated circuit.

16. The computing device of claim 9, wherein the processor is configured to select the one or more circuit elements by selection of a first plurality of circuit elements, and wherein the generated identification number is a first identification number, the processor further effective to:

evaluate a collision probability that includes a determination of a probability of a first integrated circuit having a same identification number as a second integrated circuit;

determine that the collision probability is higher than a threshold collision probability;

select a second plurality of circuit elements based on the determination that the collision probability is higher than the threshold collision probability, wherein the second plurality of circuit elements includes more circuit elements than the first plurality of circuit elements; and

generate a second identification number of the integrated circuit, such that the second identification number has a lower collision probability than the first identification number.

17. A combination of an integrated circuit and a computing device, the computing device effective to identify integrated circuits, the combination comprising:

the integrated circuit, wherein the integrated circuit is associated with an identification number and includes one or more circuit elements; and

the computing device, where the computing device includes;

a processor effective to;

select one or more circuit elements of the integrated circuit;

the integrated circuit effective to;

receive one or more input vectors at inputs of the one or more circuit elements; and

generate outputs of the one or more circuit elements in response to the one or more input vectors;

the processor further effective to;

evaluate measurements of one or more attributes for the selected one or more circuit elements, wherein the measurements are associated with corresponding input vectors applied to the integrated circuit;

formulate one or more equations based at least in part on the measurements;

solve the one or more equations to determine scaling factors for the selected one or more circuit elements, wherein the scaling factors reflect a relationship between nominal values for the attributes and the measured values for the attributes;

transform the determined scaling factors for the selected one or more circuit elements to generate transformed scaling factors; and

generate the identification number of the integrated circuit based on the transformed scaling factors.

18. The combination of claim 17, wherein the one or more attributes for the selected one or more circuit elements comprise at least one of a leakage current, a time delay between an input and output of the one or more circuit elements, a switching power, a parasitic capacitance, an inductance, a resistance, a gain, an offset voltage, a threshold voltage, an operating temperature, a power consumption, or an idle current.

19. The combination of claim 17, wherein the processor is configured to transform the determined scaling factors by being configured to:

select one or more of the scaling factors; and

map the one or more selected scaling factors to corresponding binary codes;

wherein to generate the identification number, the processor is configured to

generate the identification number of the integrated circuit using the mapped binary codes.

20. The combination of claim 17, wherein the processor is further configured to:

select a first set of one or more circuit elements that are to be used to generate the identification number;

identify a first set of one or more scaling factors that correspond to the first set of circuit elements;

map the first set of one or more scaling factors to a first binary value;

select a second set of one or more circuit elements that are not to be used to generate the identification number; and

map the second set of one or more circuit elements to a second binary value;

wherein to generate the identification number, the processor is configured to generate the identification number through generation of an indicator string based on the first and second binary values.

21. An apparatus arranged to determine an identification number of an integrated circuit (IC) including circuit elements, the apparatus comprising:

a storage medium configured to store programming instructions; and

a processor coupled to the storage medium and configured to execute the programming instructions to perform or cause to be performed;

initiate an application of input vectors to one or more of the circuit elements included in the IC;

evaluate measurement values responsive to the application of input vectors, wherein the measurement values correspond to values measured for one or more attributes of the one or more circuit elements in response to the application of input vectors;

formulate a plurality of equations based on the corresponding measurement values, wherein each of the plurality of equations includes one or more scaling factors of the corresponding one or more circuit elements where the scaling factors reflect a relationship between nominal values for the attributes and the measurement values for the attributes;

solve the plurality of equations to determine the one or more scaling factors of the corresponding one or more circuit elements; and

transform the determined one or more scaling factors to generate the identification number of the IC.

22. A method for a computing device to generate an identification number of an integrated circuit (IC) including circuit elements, the method comprising:

initiating an application of input vectors to one or more of the circuit elements included in the IC;

evaluating measurement values responsive to the application of input vectors, wherein the measurement values correspond to values measured for one or more attributes of the one or more circuit elements in response to the application of input vectors;

formulating a plurality of equations based on the corresponding measurement values, wherein each of the plurality of equations includes one or more scaling factors of the corresponding one or more circuit elements, where the scaling factors reflect a relationship between nominal values for the attributes and the measurement values for the attributes;

solving the plurality of equations to determine the one or more scaling factors of the corresponding one or more circuit elements; and

transforming the determined one or more scaling factors to generate the identification number of the IC.