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Storage device temperature sensing

  • US 8,628,239 B2
  • Filed: 07/15/2010
  • Issued: 01/14/2014
  • Est. Priority Date: 07/15/2009
  • Status: Expired due to Fees
First Claim
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1. A test slot assembly comprising:

  • a housing configured to receive and to support a storage device;

    a temperature sensing assembly associated with the housing and configured to measure a temperature of the storage device by way of physical contact; and

    a clamping mechanism that is different from the housing;

    wherein a least a portion of the clamping mechanism is adjustable between a first position and a second position;

    wherein the clamping mechanism when in the first position is configured to cause the temperature sensing assembly to be disengaged from the storage device;

    wherein the clamping mechanism when in the second position is configured to perform a clamping action that moves the temperature sensing assembly into contact with the storage device and to clamp the storage device against movement relative to the housing in response to pressure between the clamping mechanism and the housing; and

    wherein the clamping mechanism is adjacent to a portion of a sidewall of the housing, and wherein the temperature sensing assembly is adjacent to the clamping mechanism such that the clamping mechanism is positioned between the portion of the sidewall and the temperature sensing assembly.

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