Method and apparatus for measuring isoelectric point using field effect transistor
First Claim
1. A method for measuring an isoelectric point, comprising:
- providing a field effect transistor comprising a substrate, source and drain electrodes disposed on the substrate and spaced apart from each other, and a channel region between the source and drain electrodes;
providing a first electrolyte solution having a first concentration to the channel region of the field effect transistor and measuring a first current value of the channel region between the source and drain electrodes;
providing a second electrolyte solution having a second concentration greater than the first concentration and measuring a second current value of the channel region between the source and drain electrodes; and
determining the isoelectric points of the field effect transistor or materials disposed on the field effect transistor using a difference between the first and second current values.
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Abstract
Provided are a method and apparatus for measuring an isoelectric point using a field effect transistor. The method includes providing a field effect transistor including a substrate, source and drain electrodes disposed on the substrate and spaced apart from each other, and a channel region between the source and drain electrodes, providing a first electrolyte solution having a first concentration to the channel region of the field effect transistor and measuring a first current value of the channel region between the source and drain electrodes, providing a second electrolyte solution having a second concentration greater than the first concentration and measuring a second current value of the channel region between the source and drain electrodes, and determining the isoelectric point of the field effect transistor or a material disposed on the field effect transistor using a difference between the first and second current values.
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Citations
20 Claims
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1. A method for measuring an isoelectric point, comprising:
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providing a field effect transistor comprising a substrate, source and drain electrodes disposed on the substrate and spaced apart from each other, and a channel region between the source and drain electrodes; providing a first electrolyte solution having a first concentration to the channel region of the field effect transistor and measuring a first current value of the channel region between the source and drain electrodes; providing a second electrolyte solution having a second concentration greater than the first concentration and measuring a second current value of the channel region between the source and drain electrodes; and determining the isoelectric points of the field effect transistor or materials disposed on the field effect transistor using a difference between the first and second current values. - View Dependent Claims (2, 3, 4, 5, 6, 7, 8, 9, 10, 11, 12, 13, 14, 15, 16, 17)
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18. An apparatus for measuring an isoelectric point, comprising:
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a field effect transistor comprising a substrate, source and drain electrodes disposed on the substrate and spaced apart from each other, and a channel region between the source and drain electrodes; a first electrolyte solution supply unit for supplying a first electrolyte solution having a first concentration to the channel region; a second electrolyte solution supply unit for supplying a second electrolyte solution having a second concentration to the channel region, wherein the second electrolyte solution has a same pH as the first electrolyte solution and the first concentration is less than the second concentration; and a current measuring unit measuring a first current value and a second current value flowing along the channel region when the first and second electrolyte solutions are supplied, respectively; wherein the apparatus is configured to determine the isoelectric points of the FET or materials disposed on the FET using a difference between the first current value and the second current value of the current measuring unit. - View Dependent Claims (19, 20)
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Specification