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Test meter for use with a dual chamber, multi-analyte test strip with opposing electrodes

  • US 8,632,664 B2
  • Filed: 10/27/2009
  • Issued: 01/21/2014
  • Est. Priority Date: 10/27/2009
  • Status: Active Grant
First Claim
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1. A test meter for use with a dual-chamber, multi-analyte test strip, the test meter comprising:

  • a test strip receiving module with;

    a first electrical connector configured for contacting a first analyte contact pad of a first working electrode of the dual-chamber, multi-analyte test strip;

    a second electrical connector configured for contacting a second analyte contact pad of a second working electrode of the dual-chamber, multi-analyte test stripa third electrical connector configured for establishing an operational electrical contact to a first counter/reference contact pad of a first counter/reference electrode layer of the dual-chamber, multi-analyte test strip; and

    a fourth electrical connector configured for establishing an operational electrical contact to a second counter/reference contact pad of a second counter/reference electrode layer of the dual-chamber, multi-analyte test strip; and

    a signal processing module,wherein the signal processing module is configured to receive a first signal via the first electrical connector and the third electrical connector and employ the first signal for the determination of a first analyte in a bodily fluid sample applied to the dual-chamber, multi-analyte test strip; and

    wherein the signal processing module is also configured to receive a second signal via the second electrical connector and fourth electrical connector and employ the second signal for the determination of a second analyte in the bodily fluid sample applied to the dual-chamber, multi-analyte test strip, andwherein the third electrical connector is configured to contact the first counter/reference contact pad in an opposing manner with respect to the contact of the fourth electrical connector and the second counter/reference contact pad; and

    wherein the third electrical connector and the fourth electrical connector are in an opposing configuration, andwherein the test strip receiving module is configured for operationally receiving a multi-analyte test strip with;

    a first insulating layer;

    a first electrically conductive layer disposed on the first insulating layer, the electrically conductive layer including the first working electrode with the first analyte contact pad;

    a first patterned spacer layer positioned above the first electrically conductive layer, the patterned spacer layer defining a first sample-receiving chamber therein that overlies the first working electrode, the first sample-receiving chamber having a first end opening and a second end opening;

    a first counter/reference electrode layer overlying and exposed to the first sample receiving chamber, the first counter/reference electrode layer configured in an opposing relationship to the first working electrode and having the first counter/reference contact pad;

    a counter/reference insulating layer disposed over the first counter/reference electrode layer,a second counter/reference electrode layer disposed over the counter/reference insulating layer the second counter/reference electrode layer having the second counter/reference contact pad,a second patterned spacer layer positioned above the second counter/reference electrode layer, the second patterned spacer layer defining asecond sample-receiving chamber therein with a first end opening and a second end opening;

    a second electrically conductive layer disposed above the second patterned spacer layer, the second electrically conductive layer including the second working electrode with the second analyte contact pad;

    a second insulating layer disposed above the second electrically conductive layer;

    a first analyte reagent layer disposed on at least a portion of the first working electrode within the first sample-receiving chamber; and

    a second analyte reagent layer disposed on at least a portion of the second working electrode within the second sample-receiving chamber;

    wherein the second sample-receiving chamber overlies the second working electrode, andwherein the second counter/reference electrode layer is exposed to the second sample receiving chamber and configured in an opposing relationship to the second working electrode.

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