Hand-held scanner systems and methods for reading point of care test results

• US 8,638,441 B2
• Filed: 04/07/2010
• Issued: 01/28/2014
• Est. Priority Date: 04/07/2009
• Status: Active Grant

• Current Assignee: Nexus Dx, Inc. (Sphingotec GMBH)
• Original Assignee: Nexus Dx, Inc. (Sphingotec GMBH)
• Inventors: Egan, Richard, Lidgard, Graham, Booker, David
• Primary Examiner(s): NGUYEN, SANG H
• Application Number:
  US12/756,157
• Publication Number:
  US 20100315644A1
• Time in Patent Office: 1,392 Days
• Field of Search: 356/445, 356/244, 356/246, 356 72- 73, 435/7.25, 435/7.94, 435/287.2, 436/514, 436/606, 436/810, 422 56- 60
• US Class Current: 356/445
• CPC Class Codes: G01N 21/01 Arrangements or apparatus for facilitating the optical investigation
• CPC Class Codes: G01N 21/84 Systems specially adapted for particular applications
• CPC Class Codes: G01N 21/8483 Investigating reagent band test-element handling not specific to a test method G01N33/4875; analytical elements specific to chemical analysis of biological material G01N33/52; autometer with reagent band G01N35/04
• CPC Class Codes: G01N 2201/0446 Multicell plate, sequential
• CPC Class Codes: G01N 2201/126 Microprocessor processing
• CPC Class Codes: G01N 33/487 of liquid biological material
• CPC Class Codes: G16H 10/40 for data related to laboratory analysis, e.g. patient specimen analysis
• CPC Class Codes: Y02A 90/10 Information and communication technologies [ICT] supporting adaptation to climate change, e.g. for weather forecasting or climate simulation

Abstract

A diagnostic assay system including a test device and a scanning device are described. In one implementation, the scanning device includes a source of electromagnetic radiation, an optics assembly, a detector, and a microprocessor disposed within a chassis. The test device and scanning device may be configured to be movable relative to each other during operation of the scanning device.

Claims

1. A diagnostic assay system comprising:

a test device including a test strip having one or more test lines and one or more indicia, and a scanning device comprising;

i) a source of electromagnetic radiation;

ii) an optics assembly disposed to direct the electromagnetic radiation;

iii) a detector disposed to receive an emission or reflection from the test strip, wherein;

the detector is a single detector configured to detect the emission or reflection from the one or more test lines and emission or reflection from the one or more indicia;

or

the detector comprises a first detector configured to detect the emission or reflection from the one or more test lines and a second detector configured to detect the emission or reflection from the one or more indicia;

iv) a microprocessor; and

v) a chassis;

wherein the test device and scanning device are configured to be movable relative to each other during operation of the scanning device and wherein the microprocessor is configured to generate test result data based at least in part on the indicia and one or more of the test lines.

2. The system of claim 1, wherein the indicia are positioned adjacent to the one or more test lines such that each indicia corresponds with a test line.

3. The system of claim 1, wherein the test device further comprises a body having a window, wherein the body is configured so that the one or more test lines may be exposed to an output from the source through the window.

4. The system of claim 1, wherein the detector is a single detector configured to detect an emission or radiation from the one or more test lines and from the one or more indicia.

5. The system of claim 1, wherein the test device and scanning device are configured to be freely movable relative to each other in at least one plane.

6. The system of claim 1, wherein the chassis is configured as a hand-held chassis and further comprises a test device interface near a distal region of the chassis.

7. The system of claim 6, further comprising a shield coupled to the test device interface, wherein the shield is configured to surround an aperture of the scanning device such that the shield blocks ambient light from entering the scanning device through the aperture.

8. The system of claim 6, wherein the hand-held chassis comprises parallel rails extending distally from the distal region of the chassis near the test device interface.

9. The system of claim 8, wherein the test device comprises a pair of longitudinal channels shaped to receive the parallel rails of the hand-held chassis.

10. The system of claim 1, wherein the microprocessor is configured to generate the test result data so as to compensate for relative movement between the test device and the scanning device.

11. The system of claim 10, wherein the compensation includes compensation for variable speed during the relative movement between the test device and the scanning device.

12. The system of claim 1, wherein the microprocessor is configured to generate the test result data so as to compensate for a relative angular offset between the test strip and the scanning device.

13. The system of claim 1, wherein the test lines have immobilized thereto a capture moiety.

14. The system of claim 1, wherein the test device includes a substrate, and the substrate further comprises one or more control lines.

15. The system of claim 1, wherein the detector comprises a charge couple device (CCD).

16. A method of assaying a sample to detect an analyte of interest, the method comprising the steps of:

providing a sample from a sample collection device to a test device, wherein the test device comprises one or more test lines having immobilized thereto a capture moiety specifically binding directly or indirectly one or more analytes of interest, and wherein one or more indicia are positioned on a surface of the test device adjacent the one or more test lines;

moving the test device relative to a scanning device;

reading one or more of the test lines and one or more of the indicia, said reading further comprising;

detecting emission or reflection from the one or more test lines and from the one or more indicia at a single detector of the scanning device;

or

detecting emission or reflection from the one or more test lines at a first detector of the scanning device and detecting emission or reflection from the one or more indicia at a second detector of the scanning device;

generating test result data based at least in part on the reading; and

storing the test result data in a memory.

17. The method of claim 16, wherein at least one of the single detector, the first detector, and the second detector is a charge couple device (CCD).