Error compensation in a spectrometer
First Claim
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1. A method comprising:
- obtaining a measurement of at least a portion of a path length for a signal traveling through a spectrometer during a measurement scan of a material;
obtaining a detector signal corresponding to the measurement scan; and
compensating for one or more errors in the detector signal based on the measurement, wherein the compensating comprises correcting the detector signal based on the measurement;
wherein obtaining the measurement comprises obtaining a measurement of at least one optic distance in one or more heads of the spectrometer; and
wherein compensating for the one or more errors in the detector signal comprises;
determining a change in the at least one optic distance; and
correcting the detector signal based on the change in the at least one optic distance.
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Abstract
A method for compensating for errors in a spectrometer is provided that includes measuring at least a portion of a path length for a signal traveling through the spectrometer during a measurement scan of a material. A detector signal corresponding to the measurement scan is generated. Compensation for errors in the detector signal is provided based on the measurement of the path length.
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Citations
21 Claims
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1. A method comprising:
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obtaining a measurement of at least a portion of a path length for a signal traveling through a spectrometer during a measurement scan of a material; obtaining a detector signal corresponding to the measurement scan; and compensating for one or more errors in the detector signal based on the measurement, wherein the compensating comprises correcting the detector signal based on the measurement; wherein obtaining the measurement comprises obtaining a measurement of at least one optic distance in one or more heads of the spectrometer; and wherein compensating for the one or more errors in the detector signal comprises; determining a change in the at least one optic distance; and correcting the detector signal based on the change in the at least one optic distance. - View Dependent Claims (2, 3, 4)
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5. A method comprising:
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obtaining a measurement of at least a portion of a path length for a signal traveling through a spectrometer during a measurement scan of a material; obtaining a detector signal corresponding to the measurement scan; and compensating for one or more errors in the detector signal based on the measurement, wherein the compensating comprises correcting the detector signal based on the measurement; wherein obtaining the measurement comprises obtaining measurements of optic distances in one or more heads of the spectrometer, the measurements including; a measurement of a first optic distance between an emitter and a beam splitter; a measurement of a second optic distance between the emitter and a mirror; a measurement of a third optic distance between a detector and the beam splitter; and a measurement of a fourth optic distance between the detector and an edge of a first of the one or more heads. - View Dependent Claims (6, 7)
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8. A system comprising:
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a spectrometer comprising; an emitter configured to generate an emitter signal; a plurality of optical components configured to guide the emitter signal through the spectrometer; a detector configured to generate a detector signal based on the emitter signal; and a path length evaluator configured to generate a measurement of at least a portion of a path length for the emitter signal; and an analyzer configured to correct the detector signal based on the measurement; wherein the path length evaluator comprises at least one laser encoder configured to measure at least one optic distance between a first object and a second object in a first head of the spectrometer. - View Dependent Claims (9, 10, 11, 12)
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13. A spectrometer comprising:
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an emitter configured to generate an emitter signal; a plurality of optical components configured to guide the emitter signal through the spectrometer; a detector configured to generate a detector signal based on the emitter signal; and a path length evaluator configured to measure at least a portion of a path length for the emitter signal; wherein the path length evaluator comprises at least one laser encoder configured to measure at least one optic distance between a first object and a second object in a head of the spectrometer. - View Dependent Claims (14, 15, 16, 17, 18)
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19. An apparatus comprising:
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at least one distance converter configured to receive a measured distance corresponding to a measurement scan in a spectrometer and to convert the measured distance into a distance correction, wherein the measured distance comprises a measurement of at least a portion of a path length for a signal used by the spectrometer during the measurement scan; and a detector data corrector configured to receive the distance correction, to receive a detector signal corresponding to the measurement scan, and to apply the distance correction to the detector signal; wherein the at least one distance converter comprises a Z-distance converter configured to determine a variation in a Z-distance during the measurement scan and to determine a change in a mean value of the Z-distance for the measurement scan; wherein the Z-distance converter is configured to convert the measured distance into the distance correction by determining a difference between an expected delay in the detector signal and an actual delay in the detector signal due to the variation in the Z-distance and the change in the mean value of the Z-distance; and wherein the distance correction comprises the difference between the expected delay and the actual delay. - View Dependent Claims (20, 21)
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Specification