Memory architectures and techniques to enhance throughput for cross-point arrays
First Claim
1. An integrated circuit comprising:
- a front-end-of-the-line (FEOL) logic layer including active circuitry fabricated FEOL on a substrate; and
arrays of memory elements, each memory element coupled between back-end-of-the-line (BEOL) array lines that electrically couple the memory elements with the active circuitry;
wherein the memory elements are fabricated in at least one BEOL layer directly above the FEOL logic layer within a memory element region having a boundary defined by a periphery of the memory elements and positioned in a plane parallel to the substrate and the BEOL array lines;
wherein the active circuitry includes a plurality of FEOL array line decoders disposed in the FEOL logic layer within a decoder region defined by a periphery of the plurality of the FEOL array line decoders located between the substrate and the memory elements;
wherein a quantity of the plurality of FEOL array line decoders corresponds to a quantity of memory elements in the memory arrays of the memory elements configured to provide a throughput value;
wherein the memory element region and the decoder region substantially overlap; and
wherein the decoder region is less than or equal to the memory element region.
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Accused Products
Abstract
Embodiments of the invention relate generally to semiconductors and memory technology, and more particularly, to systems, integrated circuits, and methods to implement memory architectures configured to enhance throughput for cross point arrays including memory elements, such as memory elements based on third dimensional memory technology. In at least some embodiments, an integrated circuit includes arrays that include memory elements being formed BEOL above a FEOL logic layer within a boundary in a plane parallel to a substrate, and array lines. Further, the integrated circuit includes array line decoders disposed in the logic layer within a region located coextensive with the boundary and between the substrate and the arrays. In some embodiments, the disposition of peripheral circuitry, such as the array line decoders, under the arrays can preserve or optimize die efficiency for throughput enhancement.
148 Citations
26 Claims
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1. An integrated circuit comprising:
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a front-end-of-the-line (FEOL) logic layer including active circuitry fabricated FEOL on a substrate; and arrays of memory elements, each memory element coupled between back-end-of-the-line (BEOL) array lines that electrically couple the memory elements with the active circuitry; wherein the memory elements are fabricated in at least one BEOL layer directly above the FEOL logic layer within a memory element region having a boundary defined by a periphery of the memory elements and positioned in a plane parallel to the substrate and the BEOL array lines; wherein the active circuitry includes a plurality of FEOL array line decoders disposed in the FEOL logic layer within a decoder region defined by a periphery of the plurality of the FEOL array line decoders located between the substrate and the memory elements; wherein a quantity of the plurality of FEOL array line decoders corresponds to a quantity of memory elements in the memory arrays of the memory elements configured to provide a throughput value; wherein the memory element region and the decoder region substantially overlap; and wherein the decoder region is less than or equal to the memory element region. - View Dependent Claims (2, 3, 4, 5, 6, 7, 8, 9, 10, 11, 12, 13, 14, 15, 16, 17, 18, 19)
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20. A device comprising:
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active circuitry including multiple array line decoders fabricated front-end-of-the-line (FEOL) on a substrate; and multiple memory arrays including memory elements, each memory element coupled between back-end-of-the-line (BEOL) array lines associated with corresponding memory arrays that electrically couple the memory elements with the array line decoders; wherein the memory elements fabricated BEOL directly above the array line decoders within a memory region having a boundary defined by a periphery of the memory elements and positioned in a plane parallel to the substrate; wherein the multiple array line decoders are disposed within a decoder region defined by a periphery of the plurality of the FEOL array line decoders located coextensive with the boundary; wherein the multiple memory arrays are each addressable by different array line decoders; wherein the memory region and the decoder region substantially overlap; and wherein the decoder region is less than or equal to the memory element region. - View Dependent Claims (21, 22, 23, 24, 25, 26)
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Specification