Wide and deep oxide trench in a semiconductor substrate with interspersed vertical oxide ribs
First Claim
1. A method of forming a large deep oxide trench in a semiconductor substrate comprising:
- a) forming, in the semiconductor substrate, a plurality of interim trenches separated by a corresponding number of remaining semiconductor mesas between the interim trenches;
b) oxidizing the remaining semiconductor mesas until they are substantially converted to oxide by thermal oxidation; and
c) filling up any remaining spaces of the interim trenches with insulating material.
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Accused Products
Abstract
A semiconductor device structure with an oxide-filled large deep trench (OFLDT) portion having trench size TCS and trench depth TCD is disclosed. A bulk semiconductor layer (BSL) is provided with a thickness BSLT>TCD. A large trench top area (LTTA) is mapped out atop BSL with its geometry equal to OFLDT. The LTTA is partitioned into interspersed, complementary interim areas ITA-A and ITA-B. Numerous interim vertical trenches of depth TCD are created into the top BSL surface by removing bulk semiconductor materials corresponding to ITA-B. The remaining bulk semiconductor materials corresponding to ITA-A are converted into oxide. If any residual space is still left between the so-converted ITA-A, the residual space is filled up with oxide deposition. Importantly, the geometry of all ITA-A and ITA-B should be configured simple and small enough to facilitate fast and efficient processes of oxide conversion and oxide filling.
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Citations
5 Claims
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1. A method of forming a large deep oxide trench in a semiconductor substrate comprising:
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a) forming, in the semiconductor substrate, a plurality of interim trenches separated by a corresponding number of remaining semiconductor mesas between the interim trenches; b) oxidizing the remaining semiconductor mesas until they are substantially converted to oxide by thermal oxidation; and c) filling up any remaining spaces of the interim trenches with insulating material. - View Dependent Claims (2, 3)
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4. A wide and deep oxide trench in a semiconductor substrate comprising vertical oxide ribs, being made of thermal oxide, interspersed throughout the wide and deep oxide trench;
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wherein any remaining spaces between the vertical oxide ribs are filled with deposited oxide; and wherein the vertical oxide ribs contain a small notch at their bottoms. - View Dependent Claims (5)
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Specification