Needle head

• US 8,643,361 B2
• Filed: 05/19/2011
• Issued: 02/04/2014
• Est. Priority Date: 07/14/2010
• Status: Active Grant

• Current Assignee: Sensirion AG (Sensirion Holding AG)
• Original Assignee: Sensirion AG (Sensirion Holding AG)
• Inventors: Graf, Markus, Fitzi, Martin, Eggenberger, Hans, Schanz, Christoph
• Primary Examiner(s): Assouad, Patrick
• Assistant Examiner(s): BROWN, LAMARR A
• Application Number:
  US13/068,743
• Publication Number:
  US 20120013326A1
• Time in Patent Office: 992 Days
• Field of Search: 324/149, 324/514, 324/762.05, 324/762.02, 324/758.03, 324/757.03, 324/754.01, 324/756.04, 324/755.11, 324/756.01
• US Class Current: 324/149
• CPC Class Codes: G01N 33/0006 Calibrating gas analysers

Abstract

The present idea refers to a needle head, its use in a probe arrangement, and a method for electrically contacting multiple electronic components. The needle head comprises a body with a lower surface, needle electrodes emerging from the lower surface, and multiple outlets arranged in the lower surface. A channel is arranged between an inlet in the body and the outlets for conveying a medium from the inlet to the outlets. By this means, electronic components arranged in close distance under the lower surface of the needle head are directly exposed to the medium which provides a test environment during a test of the electronic components.

Claims

1. A needle head for electrically contacting an electronic component, comprising

a body with a lower surface,

needle electrodes emerging from said lower surface,

multiple outlets arranged in said lower surface, and

a channel between an inlet in said body and said outlets for conveying a medium from said inlet to said outlets.

2. A needle head according to claim 1, wherein said needle electrodes are arranged in needle bores in said lower surface, said needle bores forming openings in said lower surface separate form said outlets.

3. A needle head according to claim 2, wherein each needle electrode is arranged in a separate needle bore in said lower surface, and wherein a combined area of needle bores and outlets covers an area less than a third of said lower surface.

4. A needle head according to claim 1, wherein said needle electrodes are arranged in subgroups with each subgroup being designed for contacting an individual electronic component, said subgroups being arranged in groups, said groups being arranged in at least one row, and one of said outlets being arranged between each two neighbouring groups of the same row.

5. A needle head according to claim 1, wherein each outlet is formed by an elongated hole.

6. A needle head according to claim 1, wherein said inlet is arranged in a side surface of said body.

7. A needle head according to claim 1, wherein said body comprises a frame made out of metal and forming at least sidewalls of said body, and wherein said at least one inlet is arranged in said side walls.

8. A needle head according to claim 2, wherein said body comprises a layered needle holder with a bottom layer including said outlets and said needle bores, with said bottom layer forming said lower surface of said body, and with a top layer for holding said needle electrodes said top layer including an aperture forming part of said channel.

9. A needle head according to claim 8, wherein an intermediate layer in form of a frame is arranged between said bottom layer and said top layer for forming a chamber together with the top and the bottom layer, and wherein said layers are made out of ceramics.

10. A probe arrangement, comprising

a panel with a lower surface,

a channel in said panel for conveying a medium,

at least one outlet arranged in said lower surface of said panel and connected to said channel, and

a needle head according to claim 1 arranged in an opening of said panel.

11. A probe arrangement according to claim 10, wherein said channel of said panel is connected to said channel of said needle head.

12. A probe arrangement according to claim 10, comprising an outlet in said opening of said panel, and an inlet arranged in a side surface of said body of said needle head, wherein said outlet in said opening and said inlet at said side surface are aligned.

13. A probe arrangement according to claim 10, comprising means for heating or cooling the panel.

14. A probe arrangement according to claim 10, comprising means for heating or cooling the needle head.

15. A probe arrangement, comprising

a panel with a lower surface,

a channel in said panel for conveying a medium,

a needle head according to claim 1 arranged in an opening of said panel,

wherein said channel of said panel is connected to said channel of said needle head.

16. A probe arrangement according to claim 15, comprising at least one outlet arranged in said lower surface of said panel and connected with said channel of said panel.

17. A probe arrangement according to claim 15, comprising an outlet in said opening of said panel, and an inlet arranged in a side surface of said body of said needle head, wherein said outlet in said, opening and said inlet at said side surface are aligned.

18. A probe arrangement according to claim 15, comprising means for heating or cooling the panel.

19. A probe arrangement according to claim 15, comprising means for heating or cooling the needle head.

20. A method for electrically contacting multiple electronic components, comprising

providing a wafer including said electronic components,

providing a needle head according to claim 1,

supplying said inlet of said needle head with said medium,

bringing said electronic components simultaneously into contact with said needle electrodes,

measuring signals accessible at said needle electrodes.