Crosstalk suppression in wireless testing of semiconductor devices
First Claim
Patent Images
1. An apparatus, comprising:
- an integrated circuit integrated on a semiconductor material die and adapted to be at least partly tested wirelessly, the integrated circuit comprising circuitry comprising at least one programmable element adapted to store an indication of the radio communication frequency such that the circuitry is configurable, based at least in part on a value programmed in the programmable element, to define a radio communication frequency to be used for wirelessly communicating a radio signal having a test signal modulated thereon to the integrated circuit for a wireless test of the integrated circuit,wherein the semiconductor material die is a first semiconductor material die formed from a semiconductor material wafer, and wherein the integrated circuit is a first integrated circuit, and wherein the semiconductor material wafer further comprises a second semiconductor material die comprising a second integrated circuit, and wherein the circuitry that is configurable to define a radio communication frequency is adapted to allow defining the radio communication frequency independently of a definition of a radio communication frequency to be used for wirelessly communicating a radio signal having a test signal modulated thereon to the second integrated circuit for a wireless test of the second integrated circuit.
3 Assignments
0 Petitions
Accused Products
Abstract
An integrated circuit integrated on a semiconductor material die and adapted to be at least partly tested wirelessly, wherein circuitry for setting a selected radio communication frequencies to be used for the wireless test of the integrated circuit are integrated on the semiconductor material die.
15 Citations
12 Claims
-
1. An apparatus, comprising:
-
an integrated circuit integrated on a semiconductor material die and adapted to be at least partly tested wirelessly, the integrated circuit comprising circuitry comprising at least one programmable element adapted to store an indication of the radio communication frequency such that the circuitry is configurable, based at least in part on a value programmed in the programmable element, to define a radio communication frequency to be used for wirelessly communicating a radio signal having a test signal modulated thereon to the integrated circuit for a wireless test of the integrated circuit, wherein the semiconductor material die is a first semiconductor material die formed from a semiconductor material wafer, and wherein the integrated circuit is a first integrated circuit, and wherein the semiconductor material wafer further comprises a second semiconductor material die comprising a second integrated circuit, and wherein the circuitry that is configurable to define a radio communication frequency is adapted to allow defining the radio communication frequency independently of a definition of a radio communication frequency to be used for wirelessly communicating a radio signal having a test signal modulated thereon to the second integrated circuit for a wireless test of the second integrated circuit. - View Dependent Claims (2, 3, 4, 5, 6)
-
-
7. A semiconductor material wafer comprising:
a plurality of semiconductor material dies including a first semiconductor material die and a second semiconductor material die, each of the first and second semiconductor material dies having circuits integrated thereon, and each of the circuits including a programmable element that stores a respective indication of a radio communication frequency to be used for wirelessly communicating a radio signal having a test signal modulated thereon to the circuit, wherein the radio communication frequency for each of the first and second semiconductor material dies is different than radio communication frequencies for other semiconductor material dies of the plurality of semiconductor material dies. - View Dependent Claims (8, 9)
-
10. A method for wirelessly testing integrated circuits integrated on at least two distinct semiconductor material dies, comprising:
-
providing a semiconductor wafer that includes a plurality of semiconductor material dies including a first semiconductor material die and a second semiconductor material die, each of the first and second semiconductor material dies having circuits integrated thereon, each of the circuits of the first and second semiconductor material dies including a programmable element configured to store an indication of a radio communication frequency for a respective die; and programming each of the programmable elements of the circuits of the first and second semiconductor materials dies to store an indication of a radio communication frequency for wirelessly communicating a radio signal having a test signal modulated thereon to the circuit including the programmable element, wherein the radio communication frequency for each of the first and second semiconductor material dies is unique to that die. - View Dependent Claims (11, 12)
-
Specification