Scanning systems

• US 8,644,453 B2
• Filed: 02/25/2009
• Issued: 02/04/2014
• Est. Priority Date: 02/28/2008
• Status: Active Grant

• Current Assignee: Rapiscan Systems Incorporated (OSI Systems Incorporated)
• Original Assignee: Rapiscan Systems Incorporated (OSI Systems Incorporated)
• Inventors: Morton, Edward James
• Primary Examiner(s): Song, Hoon
• Assistant Examiner(s): FOX, DANIELLE A
• Application Number:
  US12/919,485
• Publication Number:
  US 20110116599A1
• Time in Patent Office: 1,805 Days
• Field of Search: 378/86
• US Class Current: 378/86
• CPC Class Codes: G01N 23/201 by measuring small-angle scattering
• CPC Class Codes: G01V 5/224 Multiple energy techniques using one type of radiation, e.g. X-rays of different energies

Abstract

The present application discloses methods and systems for scanning an object. The scanning system provides a first detector region having a thickness of at least 2 mm and a second detector region having a thickness of at least 5 mm. The second detector region is arranged to receive radiation that has passed through the first detector region. The method includes irradiating the object with radiation having a peak energy of a least 1 MeV, and detecting the first profile radiation after it has interacted with or passed through the object in order to provide information relating to the object.

Claims

1. A scanning method for scanning an object comprising:

providing a first detector region having a thickness of at least 2 mm and a second detector region having a thickness of at least 5 mm wherein the second detector region is arranged to receive radiation that has passed through the first detector region;

irradiating the object with radiation having a peak energy of at least 1 MeV;

detecting the first profile radiation after it has interacted with or passed through the object in order to provide information relating to the object, wherein detecting the first profile radiation comprises;

detecting the first profile radiation at the first detector region;

receiving the first profile radiation that has passed through the first detector region at the second detector region;

detecting the first profile radiation at the second detector region;

the scanning method further comprising;

irradiating the object with radiation having a second energy profile, relatively lower than the first energy profile, and having a peak energy of at least 0.5 MeV;

detecting the second profile radiation after it has interacted with or passed through the object in order to provide information relating to the object, wherein detecting the second profile radiation comprises;

detecting the second profile radiation at the first detector region;

receiving the second profile radiation that has passed through the first detector region at the second detector region; and

detecting the second profile radiation at the second detector region.

2. The method of claim 1 comprising positioning the first detector region between the object and the second detector region.

3. The method of claim 1 comprising determining information relating to the object based upon information from the first and second detector regions relating to the first and second energy profile radiation.

4. The method of claim 3 comprising determining information by inputting the information from the first and second detector regions relating to the first and second energy profile radiation into a least squares minimization technique to obtain information relating to the object.

5. The method of claim 3 comprising calculating the ratio, (A/B)₁/(A/B)₂ in order to the determine information relating to the object based upon the calculated ratio, wherein A is indicative of the amount of radiation detected at the first detector region, B is indicative of the amount of radiation detected at the first detector region, (A/B)₁ is the ratio of first profile radiation detected at the first detector region relative to first profile radiation detected at the second detector region, and (A/B)₂ is the ratio of second profile radiation detected at the first detector region relative to second profile radiation detected at the second detector region.

6. The method of claim 1 comprising irradiating and detecting the first profile radiation before the second profile radiation, or vice versa.

7. The method of claim 1 wherein irradiating the object comprises irradiating the object in discrete bursts.

8. The method of claim 7 comprising sending detected information received in response to a burst from the detector regions before the next burst occurs.

9. The method of claim 7 wherein the low energy profile radiation comprises 3 MeV x-ray radiation and the high energy profile radiation comprises 6 MeV x-ray radiation.

10. The method of claim 1 comprising configuring the first detector region and the second detector region to detect a predetermined amount of radiation relative to each other.

11. The method of claim 10 comprising configuring the first detector region and the second detector region to detect substantially the same amount of radiation as each other.

12. The method of claim 10 comprising configuring any one or more of size, shape or material of the or each detector region so that the first detector region and the second detector region detect the predetermined amount of radiation relative to each other.

13. The method of claim 1 comprising providing a first detector including the first detector region and a second detector including the second detector region.

14. The method of claim 1 comprising irradiating the object with radiation at more than two energy profiles, such as at three energy profiles or four energy profiles or five energy profiles or six energy profiles or seven energy profiles.

15. A method of scanning overlapping objects comprising using the method of claim 1 to determine information relating to each overlapping object in a region of the object which does not overlap another object and using the determined information to calculate a reference detection value or values relating to a value or values expected to be detected in the region in which the objects overlap in the absence of further objects that are not present outside the overlapping region and using the method of claim 1 to ascertain information relating to the region in which the objects overlap and comparing the ascertained information to the expected values to determine whether an additional object is present within the region in which the objects overlap.

16. A scanning system for scanning an object comprising:

a variable energy level radiation source arranged to irradiate an object with radiation having a plurality of different energy profiles including a first energy profile having a peak energy of at least 1 MeV and a second relatively lower energy profile having a peak energy of at least 0.5 MeV, a detector arrangement arranged to detect radiation after it has interacted with or passed through the object, wherein the detector arrangement comprises a first detector region having a thickness of at least 2 mm and arranged to detect radiation and a second detector region having a thickness of at least 5 mm and arranged to detect radiation wherein the second detector region is arranged to receive radiation that has passed through the first detector region and further comprising a controller, wherein the controller is arranged to calculate the ratio, (A/B)₁/(A/B)₂ in order to the determine information relating to the object based upon the calculated ratio, wherein (A/B)₁ is the ratio of first profile radiation detected at the first detector region relative to first profile radiation detected at the second detector region and (A/B)₂ is the ratio of second profile radiation detected at the first detector region relative to second profile radiation detected at the second detector region.

17. The scanning system of claim 16 wherein the controller is further arranged to coordinate timing of irradiation events such that detected information obtained in response to an irradiation event is sent from the detector regions before the next event occurs.

18. The scanning system of claim 16 wherein the first detector region is positioned between the object and the second detector region.

19. The scanning system of claim 16 wherein the controller is further arranged to determine information relating to the object based upon information from the first and second detector regions relating to the first and second energy profile radiation.

20. The scanning system of claim 19 wherein the controller is arranged to determine information by inputting the information from the first and second detector regions relating to the first and second energy profile radiation into a least squares minimization technique to obtain information relating to the object.

21. The scanning system of claim 16 comprising a plurality of detector arrays, each detector array comprising a first detector region and a second detector region.

22. The scanning system of claim 21 comprising a concentrator and switch arranged to coherently relay gathered information from the detector regions.

23. The scanning system of claim 16 wherein the first detector region and the second detector region are configured to detect substantially the same amount of radiation as each other.