Impedance variability analysis to identify lead-related conditions

• US 8,644,931 B2
• Filed: 07/25/2008
• Issued: 02/04/2014
• Est. Priority Date: 06/02/2008
• Status: Active Grant

• Current Assignee: Medtronic Incorporated (Medtronic Plc)
• Original Assignee: Medtronic Incorporated (Medtronic Plc)
• Inventors: Stadler, Robert W., Gunderson, Bruce D., Patel, Amisha S.
• Primary Examiner(s): Koharski, Christopher D
• Assistant Examiner(s): VOORHEES, CATHERINE M
• Application Number:
  US12/180,304
• Publication Number:
  US 20090299432A1
• Time in Patent Office: 2,020 Days
• Field of Search: 607/28, 607 7- 8, 600/547
• US Class Current: 607/28
• CPC Class Codes: A61N 1/36521 the parameter being derived from measurement of an electrical impedance
• CPC Class Codes: A61N 1/3706 Pacemaker parameters stimulation threshold A61N1/371

Abstract

In general, the disclosure relates to techniques for calculating mean impedance values and impedance variability values to detect a possible condition with a lead or device-lead pathway or connection. In one example, a device may be configured to determine an impedance value for an electrical path based on a plurality of measured impedance values for the electrical path, wherein the electrical path comprises a plurality of electrodes, and to determine an impedance variability value based on at least one of the plurality of measured impedance values. The device may be further configured to determine a threshold value based on the determined impedance value and the impedance variability value, compare a newly measured impedance value for the electrical path to the threshold value, and indicate a possible condition of the electrical path based on the comparison.

Claims

1. A method comprising:

obtaining a plurality of measured impedance values for an electrical path that are measured over multiple periods of time, wherein the electrical path comprises a plurality of electrodes for at least one of stimulation or sensing;

obtaining a central tendency of the plurality of measured impedance values for the electrical path;

determining an impedance value for the electrical path based on the central tendency;

determining an impedance variability value based on at least a difference between one of the plurality of measured impedance values and the determined impedance value, wherein the one of the plurality of measured impedance values comprises either a maximum or a minimum impedance value measured during one of the multiple periods of time, and wherein the impedance variability value indicates an expected level of variability for impedance measurements for the electrical path;

determining an impedance threshold value based on the determined impedance value and the impedance variability value;

comparing a newly measured impedance value for the electrical path to the impedance threshold value; and

indicating a possible condition of the electrical path based on the comparison.

2. The method of claim 1, wherein the plurality of measured impedance values comprises a first plurality of measured impedance values, wherein the electrical path comprises a first electrical path, wherein the central tendency comprises a first central tendency, wherein the impedance value comprises a first impedance value, wherein the impedance variability value comprises a first impedance variability value, wherein the multiple periods of time comprises a first multiple periods of time, and wherein the threshold value comprises a first threshold value, the method further comprising:

obtaining a second plurality of measured impedance values for a second electrical path that are measured over a second multiple periods of time;

obtaining a second central tendency of the second plurality of measured impedance values for the second electrical path;

determining a second impedance value for the second electrical path based on the second central tendency;

determining a second impedance variability value based on a difference between at least one of the second plurality of measured impedance values and the determined second impedance value, wherein the one of the second plurality of measured impedance values comprises either a maximum or a minimum impedance value measured during one of the second multiple periods of time;

determining a second threshold value based on the second determined impedance value and the second impedance variability value;

comparing a newly measured impedance value for the second electrical path to the second threshold value; and

indicating a possible condition of the second electrical path based on the comparison to the second threshold value.

3. The method of claim 1, further comprising:

determining multiple impedance values based on the plurality of measured impedance values for the electrical path over a defined time period the multiple periods of time to obtain an adapted value of the determined impedance value; and

determining multiple impedance variability values based on differences between the plurality of measured impedance values and the multiple determined impedance values over the multiple periods of time to obtain an adapted value of the impedance variability value.

4. The method of claim 1, wherein indicating the possible condition comprises generating an indication to a user of the possible condition.

5. The method of claim 1, wherein:

determining the impedance value comprises determining a mean maximum impedance value based on a central tendency of maximum impedance values of the plurality of measured impedance values for the electrical path that are measured over the multiple periods of time;

determining the impedance variability value comprises determining a maximum impedance variability value based on a difference between at least one of the maximum impedance values of the plurality of measured impedance values and the mean maximum impedance value at a particular point in time;

determining the impedance threshold value comprises determining a maximum impedance threshold value based on the mean maximum impedance value and the maximum impedance variability value; and

comparing the newly measured impedance value comprises comparing a newly measured maximum impedance value to the maximum impedance threshold value.

6. The method of claim 5, wherein comparing the newly measured maximum impedance value to the maximum impedance threshold value comprises determining whether the newly measured maximum impedance value exceeds the maximum impedance threshold value.

7. The method of claim 1, further comprising:

when the newly measured impedance value is below the impedance threshold value and comprises either the maximum or the minimum impedance value measured during one of the multiple periods of time, determining an updated impedance variability value based on the impedance variability value and a difference between the newly measured impedance value and the determined impedance value, such that impedance variability values may adapt over time; and

when the newly measured impedance value is below the impedance threshold value and comprises either the maximum or the minimum impedance value measured during one of the multiple periods of time, determining an updated impedance value based on the determined impedance value and the newly measured impedance value, such that determined impedance values may adapt over time.

8. The method of claim 7, further comprising:

repeating, over the multiple time periods of time, the determining of the impedance value, the determining of the impedance variability value, the determining of the impedance threshold value, the comparing of the newly measured impedance value to the impedance threshold value, the determining of the updated impedance variability value, and the determining of the updated impedance value.

9. The method of claim 8, wherein indicating the possible condition occurs when multiple newly measured impedance values have each crossed a respective impedance threshold value during at least two of the multiple time periods of time.

10. The method of claim 1, further comprising:

constraining the impedance variability value based on the determined impedance value.

11. The method of claim 1, further comprising:

obtaining a central tendency of a plurality of difference ranges between maximum and minimum impedance values measured over the multiple periods of time;

determining an impedance range value for the electrical path based on the central tendency of the plurality of difference ranges;

determining an impedance range variability value based on a difference between the determined impedance range value and at least one of the plurality of difference ranges;

determining an impedance threshold range value based on the determined impedance range value and the impedance range variability value; and

comparing newly measured maximum and minimum impedance values for the electrical path to the impedance threshold range value,

wherein indicating the possible condition of the electrical path is further based on the comparison of the newly measured maximum and minimum impedance values to the impedance threshold range value.

12. The method of claim 11, further comprising:

determining an updated impedance range variability value based on the impedance range variability value and a difference between the determined impedance range value and the newly measured maximum and minimum impedance values, such that impedance range variability values may adapt over time; and

determining an updated impedance range value based on the determined impedance range value and the newly measured maximum and minimum impedance values, such that determined impedance range values may adapt over time.

13. The method of claim 1, wherein at least one of the plurality of electrodes is located on an implantable medical lead coupled to an implantable medical device.

14. An implantable medical device comprising:

a module configured to measure a plurality of impedance values for an electrical path associated with at least one implantable lead, wherein the plurality of measured impedance values are measured over multiple periods of time and, wherein the electrical path comprises a plurality of electrodes for at least one of patient stimulation or sensing; and

a processor configured to;

obtain a central tendency of the plurality of measure impedance values for the electrical path;

determine an impedance value for the electrical path based on the central tendency;

determine an impedance variability value based on at least a difference between one of the plurality of measured impedance values and the determined impedance value, wherein the one of the plurality of measured impedance values comprises either a maximum or a minimum impedance value measured during one of the multiple periods of time, and wherein the impedance variability value indicates an expected level of variability for impedance measurements for the electrical path;

determine an impedance threshold value based on the determined impedance value and the impedance variability value;

compare a newly measured impedance value for the electrical path to the impedance threshold value; and

indicate a possible condition of the electrical path based on the comparison.

15. The implantable medical device of claim 14, further comprising a stimulation generator configured to deliver stimulation via the at least one implantable lead, wherein at least one of the plurality of electrodes is located on the at least one implantable lead.

16. The implantable medical device of claim 14, wherein the plurality of measured impedance values comprises a first plurality of measured impedance values, wherein the electrical path comprises a first electrical path, wherein the central tendency comprises a first central tendency, wherein the impedance value comprises a first impedance value, wherein the impedance variability value comprises a first impedance variability value, wherein the multiple periods of time comprises a first multiple periods of time, wherein the threshold value comprises a first threshold value, and wherein the processor is further configured to:

obtain a second plurality of measured impedance values for a second electrical path that are measured over a second multiple periods of time;

obtain a second central tendency of the second plurality of measured impedance values for the second electrical path;

determine a second impedance value for the second electrical path based on the second central tendency;

determine a second impedance variability value based on a difference between at least one of the second plurality of measured impedance values and the determined second impedance value, wherein the one of the second plurality of measured impedance values comprises either a maximum or a minimum impedance value measured during one of the second multiple periods of time;

determine a second threshold value based on the second determined impedance value and the second impedance variability value;

compare a newly measured impedance value for the second electrical path to the second threshold value; and

indicate a possible condition of the second electrical path based on the comparison to the second threshold value.

17. The implantable medical device of claim 14, wherein the processor is further configured to:

determine multiple impedance values based on the plurality of measured impedance values for the electrical path over a defined time period the multiple periods of time to obtain an adapted value of the determined impedance value; and

determine multiple impedance variability values based on differences between the plurality of measured impedance values and the multiple determined impedance values over the multiple periods of time to obtain an adapted value of the impedance variability value.

18. The implantable medical device of claim 14, wherein the processor is configured to generate an indication to a user of the possible condition.

19. The implantable medical device of claim 14, wherein:

the processor is configured to determine the impedance value at least by determining a mean maximum impedance value based on a central tendency of maximum impedance values of the plurality of measured impedance values for the electrical path that are measured over the multiple periods of time;

the processor is configured to determine the impedance variability value at least by determining a maximum impedance variability value based on a difference between at least one of the maximum impedance values of the plurality of measured impedance values and the mean maximum impedance value at a particular point in time;

the processor is configured to determine the impedance threshold value at least by determining a maximum threshold value based on the mean maximum impedance value and the maximum impedance variability value; and

the processor is configured to compare the newly measured impedance value at least by comparing a newly measured maximum impedance value to the maximum impedance threshold value.

20. The implantable medical device of claim 19, wherein the processor is configured to compare the newly measured maximum impedance value to the maximum impedance threshold value at least by determining whether the newly measured maximum impedance value exceeds the maximum impedance threshold value.

21. The implantable medical device of claim 14, wherein the processor is further configured to:

determine an updated impedance variability value based on the impedance variability value and a difference between the newly measured impedance value and the determined impedance value when the newly measured impedance value is below the impedance threshold value and comprises either the maximum or the minimum impedance value measured during one of the multiple periods of time, such that impedance variability values may adapt over time; and

determine an updated impedance value based on the determined impedance value and the newly measured impedance value when the newly measured impedance value is below the impedance threshold value and comprises either the maximum or the minimum impedance value measured during one of the multiple periods of time, such that determined impedance values may adapt over time.

22. The implantable medical device of claim 21, wherein the processor is further configured to:

repeat, over the multiple time periods of time, the determining of the impedance value, the determining of the impedance variability value, the determining of the impedance threshold value, the comparing of the newly measured impedance value to the impedance threshold value, the determining of the updated impedance variability value, and the determining of the updated impedance value.

23. The implantable medical device of claim 22, wherein the processor is configured to indicate the possible condition when multiple newly measured impedance values have each crossed a respective impedance threshold value during at least two of the multiple periods of time.

24. The implantable medical device of claim 14, wherein the processor is further configured to constrain the impedance variability value based on the determined impedance value.

25. The implantable medical device of claim 14, wherein the processor is further configured to:

obtain a central tendency of a plurality of difference ranges between maximum and minimum impedance values measured over the multiple periods of time;

determine an impedance range value for the lead based on the central tendency of the plurality of difference ranges between maximum and minimum impedance values measured over the multiple periods of time;

determine an impedance range variability value based on a difference between the determined impedance range value and at least one of the plurality of difference ranges;

determine an impedance threshold range value based on the determined impedance range value and the impedance range variability value; and

compare newly measured maximum and minimum impedance values for the electrical path to the impedance threshold range value,

wherein the processor is further configured to indicate the possible condition of the electrical path based on the comparison of the newly measured maximum and minimum impedance values to the impedance threshold range value.

26. The implantable medical device of claim 25, wherein the processor is further configured to:

determine an updated impedance range variability value based on the impedance range variability value and a difference between the determined impedance range value and the newly measured maximum and minimum impedance values, such that impedance range variability values may adapt over time; and

determine an updated impedance range value based on the determined impedance range value and the newly measured maximum and minimum impedance values, such that determined impedance range values may adapt over time.

27. A system comprising:

a module configured to receive a plurality of impedance values for an electrical path associated with at least one lead, wherein the plurality of measured impedance values are measured over multiple periods of time and, wherein the electrical path comprises a plurality of electrodes for at least one of patient stimulation or sensing; and

one or more processors configured to;

obtain a central tendency of the plurality of measured impedance values for the electrical path;

determine an impedance value for the electrical path based on the central tendency;

determine an impedance variability value based on at least a difference between one of the plurality of measured impedance values and the determined impedance value, wherein the one of the plurality of measured impedance values comprises either a maximum or a minimum impedance value measured during one of the multiple periods of time, and wherein the impedance variability value indicates an expected level of variability for impedance measurements for the electrical path;

determine an impedance threshold value based on the determined impedance value and the impedance variability value;

compare a newly measured impedance value for the electrical path to the impedance threshold value; and

indicate a possible condition of the electrical path based on the comparison.

28. The system of claim 27, further comprising a user interface module configured to display an alarm that indicates the possible condition of the electrical path.

29. The system of claim 27, wherein the plurality of measured impedance values comprises a first plurality of measured impedance values, wherein the electrical path comprises a first electrical path, the central tendency comprises a first central tendency, wherein the impedance value comprises a first impedance value, wherein the impedance variability value comprises a first impedance variability value, wherein the multiple periods of time comprises a first multiple periods of time, wherein the threshold value comprises a first threshold value, and wherein the one or more processors are further configured to:

obtain a second plurality of measured impedance values for a second electrical path that are measured over a second multiple periods of time;

obtain a second central tendency of the second plurality of measured impedance values for the second electrical path;

determine a second impedance value for the second electrical path based on the second central tendency;

determine a second impedance variability value based on at least a difference between one of the second plurality of measured impedance values and the determined second impedance value, wherein the one of the second plurality of measured impedance values comprises either a maximum or a minimum impedance value measured during one of the second multiple periods of time;

determine a second threshold value based on the second determined impedance value and the second impedance variability value;

compare a newly measured impedance value for the second electrical path to the second threshold value; and

indicate a possible condition of the second electrical path based on the comparison to the second threshold value.

30. The system of claim 27, wherein the one or more processors are further configured to:

determine multiple impedance values based on the plurality of measured impedance values for the electrical path over a defined time period the multiple periods of time to obtain an adapted value of the determined impedance value; and

determine multiple impedance variability values based on differences between the plurality of measured impedance values and the multiple determined impedance values over the multiple periods of time to obtain an adapted value of the impedance variability value.

31. The system of claim 27, wherein the one or more processors are configured to generate an indication to a user of the possible condition.

32. The system of claim 27, wherein:

the one or more processors are configured to determine the impedance value at least by determining a mean maximum impedance value based on a central tendency of maximum impedance values of the plurality of measured impedance values for the electrical path that are measured over the multiple periods of time;

the one or more processors are configured to determine the impedance variability value at least by determining a maximum impedance variability value based on a difference between at least one of the maximum impedance values of the plurality of measured impedance values and the mean maximum impedance value at a particular point in time;

the one or more processors are configured to determine the impedance threshold value at least by determining a maximum threshold value based on the mean maximum impedance value and the maximum impedance variability value; and

the one or more processors are configured to compare the newly measured impedance value at least by comparing a newly measured maximum impedance value to the maximum impedance threshold value.

33. The system of claim 32, wherein the one or more processors are configured to compare the newly measured maximum impedance value to the maximum impedance threshold value at least by determining whether the newly measured maximum impedance value exceeds the maximum impedance threshold value.

34. The system of claim 27, wherein the one or more processors are further configured to:

determine an updated impedance variability value based on the impedance variability value and a difference between the newly measured impedance value and the determined impedance value when the newly measured impedance value is below the impedance threshold value and comprises either the maximum or the minimum impedance value measured during one of the multiple periods of time, such that impedance variability values may adapt over time; and

determine an updated impedance value based on the determined impedance value and the newly measured impedance value when the newly measured impedance value is below the impedance threshold value and comprises either the maximum or the minimum impedance value measured during one of the multiple periods of time, such that determined impedance values may adapt over time.

35. The system of claim 34, wherein the one or more processors are further configured to:

repeat, over the multiple periods of time, the determining of the impedance value, the determining of the impedance variability value, the determining of the impedance threshold value, the comparing of the newly measured impedance value to the impedance threshold value, the determining of the updated impedance variability value, and the determining of the updated impedance value.

36. The system of claim 35, wherein the one or more processors are configured to indicate the possible condition when multiple newly measured impedance values have each crossed a respective impedance threshold value during at least two of the multiple periods of time.

37. The system of claim 27, wherein the one or more processors are further configured to constrain the impedance variability value based on the determined impedance value.

38. The system of claim 27, wherein the one or more processors are further configured to:

obtain a central tendency of a plurality of difference ranges between maximum and minimum impedance values measured over the multiple periods of time;

determine an impedance range value for the lead based on the central tendency of the plurality of difference ranges;

determine an impedance range variability value based on differences between the determined impedance range value and at least one of the plurality of difference ranges;

determine an impedance threshold range value based on the determined impedance range value and the impedance range variability value; and

compare newly measured maximum and minimum impedance values for the electrical path to the impedance threshold range value,

wherein the one or more processors are further configured to indicate the possible condition of the electrical path based on the comparison of the newly measured maximum and minimum impedance values to the impedance threshold range value.

39. The system of claim 38, wherein the one or more processors are further configured to:

determine an updated impedance range variability value based on the impedance range variability value and a difference between the determined impedance range value and the newly measured maximum and minimum impedance values, such that impedance range variability values may adapt over time; and

determine an updated impedance range value based on the determined impedance range value and the newly measured maximum and minimum impedance values, such that determined impedance range values may adapt over time.

40. A system comprising:

an impedance measurement module configured to receive a plurality of measured impedance values for an electrical path associated with at least one medical lead, wherein the plurality of measured impedance values are measured over multiple periods of time and, wherein the electrical path comprises a plurality of electrodes for at least one of patient stimulation or sensing;

a threshold update module configured to obtain a central tendency of the plurality of measured impedance values for the electrical path, to determine an impedance value for the electrical path based on the central tendency, to determine an impedance variability value based on at least a difference between one of the plurality of measured impedance values and the determined impedance value, wherein the one of the plurality of measured impedance values comprises either a maximum or a minimum impedance value measured during one of the multiple periods of time, wherein the impedance variability value indicates an expected level of variability for impedance measurements for the electrical path, and wherein the threshold update module is further configured to determine an impedance threshold value based on the determined impedance value and the impedance variability value;

a threshold comparison module configured to compare a newly measured impedance value for the electrical path to the impedance threshold value; and

an integrity indication module configured to indicate a possible condition of the electrical path based on the comparison.

41. A non-transitory computer-readable storage medium comprising instructions for causing one or more processors to:

obtain a plurality of measured impedance values for an electrical path that are measured over multiple periods of time, wherein the electrical path comprises a plurality of electrodes for at least one of stimulation or sensing;

obtain a central tendency of the plurality of measured impedance values for the electrical path;

determine an impedance value for the electrical path based on the central tendency;

determine an impedance variability value based on at least a difference between one of the plurality of measured impedance values and the determined impedance value, wherein the one of the plurality of measured impedance values comprises either a maximum or a minimum impedance value measured during one of the multiple periods of time, and wherein the impedance variability value indicates an expected level of variability for impedance measurements for the electrical path;

determine an impedance threshold value based on the determined impedance value and the impedance variability value;

compare a newly measured impedance value for the electrical path to the impedance threshold value; and

indicate a possible condition of the electrical path based on the comparison.

42. A system comprising:

means for obtaining a plurality of measured impedance values for an electrical path that are measured over multiple periods of time, wherein the electrical path comprises a plurality of electrodes for at least one of stimulation or sensing;

means for obtaining a central tendency of the plurality of measured impedance values for the electrical path;

means for determining an impedance value for the electrical path based on the central tendency;

means for determining an impedance variability value based on a difference between at least one of the plurality of measured impedance values and the determined impedance value, wherein the one of the plurality of measured impedance values comprises either a maximum or a minimum impedance value measured during one of the multiple periods of time, and wherein the impedance variability value indicates an expected level of variability for impedance measurements for the electrical path;

means for determining an impedance threshold value based on the determined impedance value and the impedance variability value;

means for comparing a newly measured impedance value for the electrical path to the impedance threshold value; and

means for indicating a possible condition of the electrical path based on the comparison.