Single poly EEPROM having a tunnel oxide layer
First Claim
1. A single poly EEPROM (Electrically Erasable Programmable Read Only Memory), comprising:
- a second conductive type well formed over a semiconductor substrate;
first conductive type source and drain regions formed in the second conductive type well;
a tunnel oxide layer formed over the second conductive type well;
a floating gate formed over the tunnel oxide layer and configured to be doped with second conductive type impurity ions; and
a first conductive type impurity region formed in the second conductive type well adjacent to the floating gate,wherein the floating gate is configured such that a concentration of the second conductive type impurity ions in a first region of the floating gate adjacent to the drain region is higher than that of a second region of the floating gate adjacent to the first conductive type impurity region.
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Accused Products
Abstract
A single poly EEPROM (Electrically Erasable Programmable Read Only Memory), which may include at least one of the following: (1) A second conductive type well formed on and/or over a semiconductor substrate. (2) A first conductive type source and drain regions formed in the second conductive type well. The single poly EEPROM may include at least one of: (a) A tunnel oxide layer formed on and/or over the second conductive type well. (b) A floating gate formed on and/or over the tunnel oxide layer and doped with second conductive type impurity ions. (c) A first conductive type impurity region formed in the second conductive type well adjacent to the floating gate. The floating gate may be configured such that a concentration of a region of the floating gate adjacent to the drain region is higher than that of the other region of the floating gate adjacent to the impurity region.
19 Citations
10 Claims
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1. A single poly EEPROM (Electrically Erasable Programmable Read Only Memory), comprising:
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a second conductive type well formed over a semiconductor substrate; first conductive type source and drain regions formed in the second conductive type well; a tunnel oxide layer formed over the second conductive type well; a floating gate formed over the tunnel oxide layer and configured to be doped with second conductive type impurity ions; and a first conductive type impurity region formed in the second conductive type well adjacent to the floating gate, wherein the floating gate is configured such that a concentration of the second conductive type impurity ions in a first region of the floating gate adjacent to the drain region is higher than that of a second region of the floating gate adjacent to the first conductive type impurity region. - View Dependent Claims (2, 3, 4, 5, 6, 7, 8, 9, 10)
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Specification