Electronic circuit testing apparatus

• US 8,648,614 B2
• Filed: 09/21/2005
• Issued: 02/11/2014
• Est. Priority Date: 09/30/2004
• Status: Active Grant

• Current Assignee: ThruChip Japan Inc.
• Original Assignee: KEIO University
• Inventors: Kuroda, Tadahiro, Mizoguchi, Daisuke, Mirua, Noriyuki
• Primary Examiner(s): Nguyen, Tung X
• Application Number:
  US11/664,262
• Publication Number:
  US 20080258744A1
• Time in Patent Office: 3,065 Days
• Field of Search: 324/765, 324/754, 324761-762, 324/158.1, 324/117.R, 324/117.H, 438 14- 18, 257/48
• US Class Current: 324/754.01
• CPC Class Codes: G01R 31/3025 Wireless interface with the DUT
• CPC Class Codes: G01R 31/315 by inductive methods

Abstract

The present invention has an object to provide an electronic circuit testing apparatus that is preferable for testing an electronic circuit which carries out communications between substrates based on inductive coupling and is capable of testing the electronic circuit without using test pads, wherein a probe 15 is caused to intervene in a communications channel composed by inductive coupling based on the first and second transmitter coils 21a, 21b; and the first and second receiver coils 23a, 23b, and an LSI is tested by a tester 11, buffers 12 and 13, and a Tx/Rx switch 14. Accordingly, it is not be necessary for that the electronic circuit testing apparatus is provided with a needle that touches pads and leads of the electronic circuit, and the service life there can be lengthened.

Claims

1. An LSI chip testing apparatus, for determining whether an electronic circuit of an LSI chip is satisfactory, comprising:

a tester for providing a test signal; and

at least one probe operatively connected to the tester, the at least one probe having a coil for inductively transmitting the test signal to the electronic circuit of the LSI chip and inductively receiving a response signal from the electronic circuit of the LSI chip, wherein

when inductively transmitting, the probe irradiates a magnetic line of flux toward the LSI chip and thereby becomes inductively coupled with a coil of the LSI chip, which is operatively connected to the electronic circuit, and when inductively receiving a signal from the coil connected to the electronic circuit, the probe generates an electromotive force in response to a change in the magnetic line of flux in the coil of the LSI chip such that the probe detects the response signal from the LSI chip and wherein

the tester determines if the electronic circuit of the LSI chip is satisfactory based on the response signal.

2. The LSI chip testing apparatus according to claim 1, wherein said probe is two-dimensionally movable.

3. The LSI chip testing apparatus according to claim 2, further comprising a plurality of said probes.

4. The LSI chip testing apparatus according to claim 1, further comprising a plurality of said probes.

5. The LSI chip testing apparatus according to claim 1, wherein the LSI chip is tested while part of a wafer.

6. The LSI chip testing apparatus according to claim 1, wherein the LSI chip is tested after being cut from a wafer.

7. The LSI chip testing apparatus according to claim 1, further comprising buffers operatively connected between the tester and the at least one probe.

8. The LSI chip testing apparatus according to claim 1, further comprising a switch operatively connected between the tester and the at least one probe.

9. An LSI chip testing apparatus, for determining whether an electronic circuit of an LSI chip is satisfactory, comprising:

a tester for providing a test signal;

at least one probe having a coil for inductively transmitting the test signal to the electronic circuit of the LSI chip and inductively receiving a response signal from the LSI chip without the probe contacting the LSI chip, wherein

when inductively transmitting, the probe irradiates a magnetic line of flux toward the LSI chip and thereby becomes inductively coupled with a coil of the LSI chip, which is operatively connected to the electronic circuit, and when inductively receiving a signal from the coil connected to the electronic circuit, the probe generates an electromotive force in response to a change in the magnetic line of flux in the coil of the LSI chip such that the probe detects the response signal from the LSI chip,

wherein the tester determines if the electronic circuit of the LSI chip is satisfactory based on the response signal.