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High bandwidth memory interface

  • US 8,654,573 B2
  • Filed: 01/17/2013
  • Issued: 02/18/2014
  • Est. Priority Date: 07/27/1998
  • Status: Expired due to Fees
First Claim
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1. A semiconductor device comprising:

  • a first flip-flop configured to be driven by an even internal clock to sample even output data of the semiconductor device;

    a second flip-flop configured to be driven by an odd internal clock to sample odd output data of the semiconductor device;

    a third flip-flop configured to be driven by the even internal clock to sample the odd internal clock; and

    a fourth flip-flop configured to be driven by the odd internal clock to sample the even internal clock.

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