Systems and methods for over-the-air testing of wireless systems

• US 8,655,284 B2
• Filed: 05/08/2011
• Issued: 02/18/2014
• Est. Priority Date: 06/07/2006
• Status: Active Grant

• Current Assignee: ETS-Lindgren LP (ESCO Technologies, Inc.)
• Original Assignee: ETS-Lindgren LP (ESCO Technologies, Inc.)
• Inventors: Foegelle, Michael
• Primary Examiner(s): Pham, Tuan
• Application Number:
  US13/103,067
• Publication Number:
  US 20110275329A1
• Time in Patent Office: 1,017 Days
• Field of Search: 455/67.11, 455/67.14, 455/67.16, 455/115.1, 455/115.2, 455/226.1, 455/226.2, 455/226.3, 324/637, 324/639, 324/633, 324/627, 324/663, 324/613, 324/636, 324/202, 324/204, 324/224, 324/261, 324/262
• US Class Current: 455/67.11
• CPC Class Codes: G01R 1/04 Housings; Supporting members; Arrangements of terminals
• CPC Class Codes: G01R 17/20 AC or DC potentiometric measuring arrangements
• CPC Class Codes: H04B 17/20 of receivers
• CPC Class Codes: H04W 24/00 Supervisory, monitoring or testing arrangements
• CPC Class Codes: H04W 24/06 Testing, supervising or monitoring using simulated traffic

Abstract

Embodiments include systems and methods for over-the-air testing of wireless systems. Embodiments comprise separated chambers containing wireless devices. The chambers are connected by propagation path corridors.

Claims

1. A method of over-the-air testing of wireless systems, comprising:

providing a plurality of at least partially absorber-lined chambers, at least one of the plurality of chambers adapted to contain a device under test; and

connecting a plurality of the chambers by a plurality of separately bounded propagation path corridors of different electrical lengths.

2. The method of claim 1, wherein at least one propagation path corridor is a section of waveguide.

3. The method of claim 1, wherein at least one propagation path corridor comprises at least one absorbing baffle to selectively pass a propagation path.

4. The method of claim 1, wherein at least one propagation path is a coaxial cable and at least one propagation path is a waveguide.

5. The method of claim 1, wherein a first chamber includes a first device under test, a second chamber includes a second device under test, and a third chamber includes at least one antenna.

6. The method of claim 5, wherein a fourth chamber includes a third device under test.

7. The method of claim 5, wherein at least one of the first, second, and fourth chambers exhibits at least one wall that is only partially covered by absorbers.

8. The method of claim 1, wherein a first set of propagation path corridors connect a first chamber and a second chamber and a second set of propagation path corridors connect a third chamber and the second chamber.

9. The method of claim 1, wherein a first electrical path length from a device in a first chamber to an antenna in a second chamber via a first propagation path corridor is substantially equal to one of 4.5, 9, 15, 30, 42, 45, and 75 meters (m) and a second electrical path length from the device to the antenna via a second propagation path corridor is substantially equal to a different one of 4.5, 9, 15, 30, 42, 45, and 75 meters (m).

10. A test apparatus for over-the-air testing of wireless devices, comprising:

a plurality of at least partially absorber-lined chambers, with at least one chamber to contain a device under test; and

a plurality of separately bounded propagation path corridors of different electrical lengths connecting two or more of the chambers.

11. The apparatus of claim 10, wherein at least one propagation path corridor comprises at least one absorbing baffle to selectively pass a propagation path.

12. The apparatus of claim 10, wherein at least one propagation path is a coaxial cable of a first length and another propagation path is a coaxial cable of a second length.

13. The method of claim 10, wherein each of a plurality of propagation path corridors is individually selectable.

14. The test apparatus of claim 10, wherein a plurality of the separately bounded propagation path corridors comprise a plurality of waveguides of different electrical lengths.

15. The apparatus of claim 10, wherein a first electrical path length from a device in a first chamber to an antenna in a second chamber via a first propagation path corridor is substantially equal to one of 4.5, 9, 15, 30, 42, 45, and 75 meters (m) and a second electrical path length from the device to the antenna via a second propagation path corridor is substantially equal to a different one of 4.5, 9, 15, 30, 42, 45, and 75 meters (m).