Method compensation operating voltage, flash memory device, and data storage device
First Claim
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1. A method generating an operating voltage in a non-volatile memory device including a memory cell array of non-volatile memory cells, the method comprising:
- detecting at least one memory cell condition including a current temperature for the non-volatile memory device;
generating the operating voltage to be applied to a selected memory cell in the memory cell array; and
compensating the operating voltage in response to the at least one memory cell condition,wherein the at least one memory cell condition includes in addition to the current temperature at least one of a programmed data state of the selected memory cell, a location of the selected memory cell in the memory cell array, page information associated with the selected memory cell, and a location of a selected word line associated with the selected memory cell in the memory cell array.
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Abstract
Disclosed is a method generating a compensated operating voltage, such as a read voltage, in a non-volatile memory device, and a related non-volatile memory device. The operating voltage is compensated in response to one or more memory cell conditions such as temperature variation, programmed data state or physical location of a selected memory cell, page information for selected memory cell, or the location of a selected word line.
29 Citations
31 Claims
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1. A method generating an operating voltage in a non-volatile memory device including a memory cell array of non-volatile memory cells, the method comprising:
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detecting at least one memory cell condition including a current temperature for the non-volatile memory device; generating the operating voltage to be applied to a selected memory cell in the memory cell array; and compensating the operating voltage in response to the at least one memory cell condition, wherein the at least one memory cell condition includes in addition to the current temperature at least one of a programmed data state of the selected memory cell, a location of the selected memory cell in the memory cell array, page information associated with the selected memory cell, and a location of a selected word line associated with the selected memory cell in the memory cell array. - View Dependent Claims (2, 3, 4, 5, 6, 7, 8, 9, 10)
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11. A method generating an operating voltage in a memory system comprising a non-volatile memory device including an operating voltage generator, and a memory cell array of non-volatile memory cells, the method comprising:
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storing trim information in a trim information region of the memory cell array, wherein the trim information comprises voltage trim information; upon powering-up the non-volatile memory device and using the trim voltage information, configuring at least one lookup table storing a plurality of compensating offset values; detecting a current temperature for the non-volatile memory device; after receiving an access command initiating execution of an access operation by the non-volatile memory device, generating a compensated operating voltage by selecting an offset value from the plurality of compensating offset values stored in the at least one lookup table in response to the current temperature; and performing the access operation using the compensated operating voltage. - View Dependent Claims (12, 13, 14, 15, 16, 17, 18, 19)
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20. A non-volatile memory device comprising:
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control logic that controls operation of the non-volatile memory device; a memory cell array of nonvolatile memory cells; and an operating voltage generator that generates a compensated operating voltage to be applied to a selected memory cell in the memory cell array, wherein the operating voltage generator comprises; a temperature code generator that detects a current temperature and generates a corresponding temperature code; a first lookup table that stores a plurality of first offset values that respectively correspond to a plurality of temperature ranges; and a second lookup table that stores a plurality of second offset values that respectively correspond to variations in a memory cell condition, wherein the control logic selects one of the first offset values in response to the temperature code and one of the second offset values in response to a determined variation in the memory cell condition, and the operating voltage generator generates the compensated operating voltage in response to the first offset value and the second offset value. - View Dependent Claims (21, 22, 23, 24, 25, 26)
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27. A memory card comprising:
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at least one non-volatile memory device; a controller including a buffer memory and configured to control the non-volatile memory device; and an interface providing an interface between the controller and an external device, wherein the at least one non-volatile memory device comprises; control logic that controls operation of the non-volatile memory device; a memory cell array of nonvolatile memory cells; and an operating voltage generator that generates a compensated operating voltage to be applied to a selected memory cell in the memory cell array, wherein the operating voltage generator comprises; a temperature code generator that detects a current temperature and generates a corresponding temperature code; a first lookup table that stores a plurality of first offset values that respectively correspond to a plurality of temperature ranges; and a second lookup table that stores a plurality of second offset values that respectively correspond to variations in a memory cell condition, wherein the control logic selects one of the first offset values in response to the temperature code and one of the second offset values in response to a determined variation in the memory cell condition, and the operating voltage generator generates the compensated operating voltage in response to the first offset value and the second offset value.
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28. A solid state drive (SSD) comprising:
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storage media including a plurality of non-volatile memory devices; and a controller connected with the storage media via a plurality of channels and configured to control the storage media, wherein at least one of the plurality of non-volatile memory devices comprises; control logic that controls operation of the non-volatile memory device; a memory cell array of nonvolatile memory cells; and an operating voltage generator that generates a compensated operating voltage to be applied to a selected memory cell in the memory cell array, wherein the operating voltage generator comprises; a temperature code generator that detects a current temperature and generates a corresponding temperature code; a first lookup table that stores a plurality of first offset values that respectively correspond to a plurality of temperature ranges; and a second lookup table that stores a plurality of second offset values that respectively correspond to variations in a memory cell condition, wherein the control logic selects one of the first offset values in response to the temperature code and one of the second offset values in response to a determined variation in the memory cell condition, and the operating voltage generator generates the compensated operating voltage in response to the first offset value and the second offset value.
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29. A method generating an operating voltage in a non-volatile memory device including a memory cell array of non-volatile memory cells, the method comprising:
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detecting a programmed data state of a selected memory cell in the memory cell array; generating the operating voltage to be applied to the selected memory cell; and compensating the operating voltage in response to a read voltage level corresponding to the programmed data state of the selected memory cell.
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30. A method generating an operating voltage in a non-volatile memory device including a memory cell array of non-volatile memory cells, the method comprising:
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detecting a location of a selected word line in the memory cell array; generating the operating voltage to be applied to the selected word line; and compensating the operating voltage in response to the location of the selected word line.
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31. A method generating an operating voltage in a non-volatile memory device including a memory cell array of non-volatile memory cells, the method comprising:
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detecting a programmed data state of a selected memory cell in the memory cell array; generating a read voltage to be applied to a selected word line associated with the selected memory cell in the memory cell array; and compensating the read voltage in response to a read voltage level corresponding to the programmed data state of the selected memory cell.
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Specification