Process for fabricating a capacitance type tri-axial accelerometer

• US 8,664,029 B2
• Filed: 10/19/2009
• Issued: 03/04/2014
• Est. Priority Date: 03/31/2009
• Status: Expired due to Fees

• Current Assignee: Domintech Co., Ltd.
• Original Assignee: Domintech Co., Ltd.
• Inventors: Wu, Ming-Ching
• Primary Examiner(s): Nhu, David
• Application Number:
  US12/581,358
• Publication Number:
  US 20100242602A1
• Time in Patent Office: 1,597 Days
• Field of Search: 438/50, 438/51, 438/52, 438/53, 438/462, 735/143.2, 735/143.8, 257/E21.19, 257/E21.2, 257/E21.421, 257/E21.499
• US Class Current: 438/50
• CPC Class Codes: G01P 15/0802 Details
• CPC Class Codes: G01P 15/125 by capacitive pick-up
• CPC Class Codes: G01P 15/18 in two or more dimensions
• CPC Class Codes: G01P 2015/084 the mass being suspended at more than one of its sides, e.g. membrane-type suspension, so as to permit multi-axis movement of the mass

Abstract

A process for fabricating a capacitance type tri-axial accelerometer comprises of preparing a wafer having an upper layer, an intermediate layer and a lower layer, etching the lower layer of the wafer to form an isolated proof mass having a core and four segments extending from the core, etching the upper layer of the wafer to form a suspension and four separating plates, etching away a portion of the intermediate layer located between the four segments of the proof mass and the plates of the upper layer, and disposing an electrical conducting means to pass through the intermediate layer from the suspension to the core of the proof mass.

Claims

1. A process for fabricating a capacitance type tri-axial accelerometer comprising:

preparing a wafer haying an upper layer, an intermediate layer and a lower layer, said upper and lower layers being made of semiconductor material and said intermediate layer being made of insulating material;

etching said lower layer of said wafer to form an isolated proof mass having a core and four segments extending from said core;

etching said upper layer of said wafer to form a suspension and four separating plates, said suspension connecting with said core of said proof mass through said intermediate layer;

etching away a portion of said intermediate layer located between said four segments of said proof mass and said plates of said upper layer such that said proof mass can freely swing up and down following said suspension; and

disposing an electrical conducting means to pass through said intermediate layer from said suspension to said core of said proof mass such that said suspension and said proof mass are electrically connected.

2. The process for fabricating a capacitance type tri-axial accelerometer according to claim 1, wherein each of said segments extends symmetrically and outwardly from said core.

3. The process for fabricating a capacitance type tri-axial accelerometer according to claim 2, wherein each of said segments is separated from each other by a slot disposed between said segments.

4. The process for fabricating a capacitance type tri-axial accelerometer according to claim 3, wherein said suspension has a center and four arms extending respectively, symmetrically and outwardly from said center.

5. The process for fabricating a capacitance type tri-axial accelerometer according to claim 4, wherein each of said arms of said suspension has a width smaller than that of said slot.

6. The process for fabricating a capacitance type tri-axial accelerometer according to claim 4, wherein said center of said suspension is connected with said core of said proof mass by a center portion of said intermediate layer located said upper and lower layers.

7. The process for fabricating a capacitance type tri-axial accelerometer according to claim 4, wherein each of said arms of said suspension has a first conducting pad disposed on an end thereof and each of said separating plates of said upper layer has a second conducting pad disposed on an edge thereof.

8. The process for fabricating a capacitance type tri-axial accelerometer according to claim 4, wherein said electrical conducting means is a conducting plug passing through said intermediate layer from said center of said suspension to said core of said proof mass.

9. The process for fabricating a capacitance type tri-axial accelerometer according to claim 8, wherein said conducting plug is formed by the steps of:

etching said upper layer and said intermediate layer to form a straight hole extending from said center of said suspension through said intermediate layer to said core of said proof mass;

depositing an electrical conducting material upon the upper surface of said upper layer in such a way that said straight hole is filled by said electrical conducting material; and

removing said electrical conducting material from the upper surface of said upper layer except the portion that filled into said straight hole to form said conducting plug.

10. The process for fabricating a capacitance type tri-axial accelerometer according to claim 7, further comprising the step of preparing an upper lid that covers the upper surface of said upper layer of said wafer, wherein said upper lid includes a plurality of through holes and insulating pads.

11. The process for fabricating a capacitance type tri-axial accelerometer according to claim 1, further comprising the step of:

etching said lower layer of said wafer on its bottom surface to form a depression under said proof mass.

12. The process for fabricating a capacitance type tri-axial accelerometer according to claim 11, further comprising the step of:

preparing a bottom lid that attaches to said bottom surface of said lower layer of said wafer.

13. The process for fabricating a capacitance type tri-axial accelerometer according to claim 11, wherein said step to form said proof mass and said step to form said depression of said lower layer of said wafer can be performed simultaneously.

14. A capacitance type tri-axial accelerometer produced in accordance with the process for fabricating a capacitance type tri-axial accelerometer of claim 1.