Sputtering target, oxide semiconductor film and semiconductor device
First Claim
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1. A semiconductor device using a crystalline oxide comprising indium as a semiconductor, wherein the crystalline oxide has an electron career concentration of less than 1018 /cm3,wherein the crystalline oxide comprises a positive trivalent element other than indium and the crystalline oxide is a polycrystalline oxide.
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Abstract
A sputtering target including an oxide sintered body, the oxide sintered body containing indium (In) and at least one element selected from gadolinium (Gd), dysprosium (Dy), holmium (Ho), erbium (Er) and ytterbium (Yb), and the oxide sintered body substantially being of a bixbyite structure.
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Citations
18 Claims
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1. A semiconductor device using a crystalline oxide comprising indium as a semiconductor, wherein the crystalline oxide has an electron career concentration of less than 1018 /cm3,
wherein the crystalline oxide comprises a positive trivalent element other than indium and the crystalline oxide is a polycrystalline oxide.
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