Method and apparatus for discriminating cardiac signals in a medical device based on wavelet decomposition analysis

• US 8,676,289 B2
• Filed: 05/04/2007
• Issued: 03/18/2014
• Est. Priority Date: 05/05/2006
• Status: Active Grant

• Current Assignee: Medtronic Incorporated (Medtronic Plc)
• Original Assignee: Medtronic Incorporated (Medtronic Plc)
• Inventors: Ghanem, Raja N., Jackson, Troy E.
• Primary Examiner(s): Porter, Jr., Allen
• Application Number:
  US11/744,455
• Publication Number:
  US 20070270912A1
• Time in Patent Office: 2,510 Days
• Field of Search: 600/509, 600/508, 600/510, 600/515, 607/2, 607/27
• US Class Current: 600/373
• CPC Class Codes: A61B 5/276 Protection against electrode failure
• CPC Class Codes: A61B 5/287 Holders for multiple electrodes, e.g. electrode catheters for electrophysiological study [EPS]
• CPC Class Codes: A61B 5/361 Detecting fibrillation
• CPC Class Codes: A61B 5/363 Detecting tachycardia or bradycardia
• CPC Class Codes: A61B 5/726 using Wavelet transforms
• CPC Class Codes: A61N 1/3706 Pacemaker parameters stimulation threshold A61N1/371
• CPC Class Codes: G06F 2218/12 Classification; Matching

Abstract

A method of detecting cardiac signals in a medical device that includes decomposing a cardiac signal using a wavelet function at a plurality of scales to form a corresponding wavelet transform, determining approximation coefficients in response to the plurality of scales, reconstructing a first wavelet representation of the wavelet transform using predetermined approximation coefficients of the determined approximation coefficients, and evaluating the detected cardiac signals in response to the reconstructing.

Claims

1. A method of detecting faults in a lead of an implantable medical device, an electrode being positioned with respect to the lead, comprising the steps of:

sensing electrical signals with the electrode;

obtaining a signal function based on the electrical signal;

applying a wavelet transform function to the signal function to obtain a plurality of highpass wavelet values and a plurality of lowpass wavelet values associated with the signal function;

then applying a wavelet transform function to an immediately preceding plurality of lowpass wavelet values associated with the signal function to obtain a subsequent plurality of highpass wavelet values and a subsequent plurality of lowpass wavelet values associated with the signal function;

then

repeating at least once the applying the wavelet transform function to an immediately preceding plurality of lowpass wavelet values associated with the signal function;

calculating a dispersion of the lowpass wavelet values; and

identifying a fault in the lead of the implantable medical device based, at least in part, on the dispersion of the lowpass wavelet values.

2. The method of claim 1, further comprising the step of:

creating a wavelet representation of the signal function by combining at least one of the pluralities of lowpass wavelet values;

wherein the calculating a dispersion step comprises calculating a dispersion of wavelet values of the wavelet representation.

3. The method of claim 1, further comprising:

applying a second wavelet transform function to the signal function to obtain a second plurality of highpass wavelet values and a second plurality of lowpass wavelet values associated with the signal function;

then

applying a second wavelet transform function to an immediately preceding second plurality of lowpass wavelet values associated with the signal function to obtain a subsequent second plurality of highpass wavelet values and a subsequent second plurality of lowpass wavelet values associated with the signal function;

then

repeating at least once the applying the second wavelet transform function to an immediately preceding second plurality of lowpass wavelet values associated with the signal function; and

calculating a second dispersion of the second lowpass wavelet values;

wherein the identifying step identifies a fault in the lead of the implantable medical device based, at least in part, on the dispersion of the lowpass wavelet values and the second dispersion of the second lowpass wavelet values.

4. The method of claim 3, further comprising the step of:

creating a wavelet representation of the signal function by combining at least one of the second pluralities of lowpass wavelet values;

wherein the calculating a dispersion step comprises calculating a dispersion of wavelet values of the wavelet representation.

5. The method of claim 3, wherein the wavelet transform function is different than the second wavelet transform function.

6. The method of claim 1, further comprising the step of:

comparing the dispersion of the lowpass wavelet values with a dispersion threshold to obtain a comparison; and

wherein the identifying step comprises identifying ventricular fibrillation if the comparison is less than a dispersion threshold identifying a fault in the lead of the implantable medical device if the comparison is not less than the dispersion threshold.

7. The method of claim 1, wherein the wavelet transform function is a Haar wavelet transform function.

8. A method of detecting faults in a lead of an implantable medical device, an electrode being positioned with respect to the lead, comprising the steps of:

sensing electrical signals with the electrode;

obtaining a signal function based on the electrical signal;

applying a wavelet transform function to the signal function to obtain a plurality of highpass wavelet values and a plurality of lowpass wavelet values associated with the signal function;

then applying a wavelet transform function to an immediately preceding plurality of lowpass wavelet values associated with the signal function to obtain a subsequent plurality of highpass wavelet values and a subsequent plurality of lowpass wavelet values associated with the signal function;

then

repeating at least once the applying the wavelet transform function to an immediately preceding plurality of lowpass wavelet values associated with the signal function;

creating a first wavelet representation of the signal function by combining at least one of the pluralities of lowpass wavelet values; and

identifying a fault in the lead of the implantable medical device based, at least in part, on the first wavelet representation.

9. The method of claim 8, further comprising:

creating a second wavelet representation of the signal function by combining at least one of the pluralities of highpass wavelet values; and

wherein the identifying a fault in the lead step is based, at least in part, on the first wavelet representation and the second wavelet representation.

10. The method of claim 9, wherein the at least one of the pluralities of lowpass wavelet values of the creating a first wavelet representation step are the plurality of lowpass wavelet values obtained in the applying a wavelet transform function to the signal function step;

and

wherein the at least one of the pluralities of highpass wavelet values of the creating a second wavelet representation step are the plurality of highpass wavelet values obtained in a final repeating of the applying a wavelet transform function to an immediately preceding plurality of lowpass wavelet values step.

11. The method of 8, wherein the wavelet transform function is a Haar wavelet transform function.

12. The method of claim 11, wherein the least one of the pluralities of lowpass wavelet values of the creating a first wavelet representation step are the plurality of lowpass wavelet values obtained in the applying a wavelet transform function to the signal function step;

and

wherein at least one of the pluralities of highpass wavelet values of the creating a second wavelet representation step are the plurality of highpass wavelet values obtained in a second repeating of the applying a wavelet transform function to an immediately preceding plurality of lowpass wavelet values step.

13. A method of detecting faults in a lead of an implantable medical device, an electrode being positioned with respect to the lead, comprising:

sensing electrical signals with the electrode;

obtaining a signal function based on the electrical signal;

applying a wavelet transform function to the signal function to obtain a plurality of highpass wavelet values and a plurality of lowpass wavelet values associated with the signal function;

then applying a wavelet transform function to an immediately preceding plurality of lowpass wavelet values associated with the signal function to obtain a subsequent plurality of highpass wavelet values and a subsequent plurality of lowpass wavelet values associated with the signal function;

then

repeating at least once the applying the wavelet transform function to an immediately preceding plurality of lowpass wavelet values associated with the signal function;

creating a first wavelet representation of the signal function by combining at least one of the pluralities of lowpass wavelet values; and

creating a second wavelet representation of the signal function by combining at least one of the pluralities of highpass wavelet values; and

calculating a first dispersion of the first wavelet representation and a second dispersion of the second wavelet representation; and

identifying a fault in the lead of the implantable medical device based, at least in part, on the first dispersion and the second dispersion.

14. The method of claim 13, wherein at least one of the pluralities of lowpass wavelet values of the creating a first wavelet representation step are the plurality of lowpass wavelet values obtained in the applying a wavelet transform function to the signal function step;

and

wherein the at least one of the pluralities of highpass wavelet values of the creating a second wavelet representation step are the plurality of highpass wavelet values obtained in a final repeating of the applying a wavelet transform function to an immediately preceding plurality of lowpass wavelet values step.

15. The method of 13, wherein the wavelet transform function is a Haar wavelet transform function.

16. The method of claim 15, wherein the least one of the pluralities of lowpass wavelet values of the creating a first wavelet representation step are the plurality of lowpass wavelet values obtained in the applying a wavelet transform function to the signal function step;

and

wherein at least one of the pluralities of highpass wavelet values of the creating a second wavelet representation step are the plurality of highpass wavelet values obtained in a second repeating of the applying a wavelet transform function to an immediately preceding plurality of lowpass wavelet values step.