Analytical instrumentation, apparatuses, and methods

• US 8,680,461 B2
• Filed: 04/25/2006
• Issued: 03/25/2014
• Est. Priority Date: 04/25/2005
• Status: Active Grant

• Current Assignee: Teledyne FLIR Defense Incorporated (Teledyne Technologies Incorporated)
• Original Assignee: Griffin Analytical Technologies, LLC (Teledyne Technologies Incorporated)
• Inventors: Rardin, Brent, Wells, James Mitchell, Patterson, Garth E.
• Primary Examiner(s): IPPOLITO, NICOLE MARIE
• Application Number:
  US11/919,323
• Publication Number:
  US 20100042334A1
• Time in Patent Office: 2,891 Days
• Field of Search: 250/281, 250/282, 250/283, 250/288, 250/290, 250/291, 250/292, 250/293, 250/294, 250/295, 250/296, 250/297, 250/298, 250/299
• US Class Current: 250/282
• CPC Class Codes: H01J 49/0031 Step by step routines describing the use of the apparatus H01J49/0081 takes precedence
• CPC Class Codes: H01J 49/02 Details

Abstract

A sample analysis apparatus (10) includes processing circuitry (22) coupled to a data set device (20) and a storage device (24) to acquire one data set from an analysis component (14) according to one analysis parameter set and to prepare another analysis parameter set using another previously acquired data set.

Claims

1. A continuous sampling analysis method comprising:

providing gas-phase samples to an analysis component configured as a mass spectrometer;

configuring processing circuitry of the analysis component to acquire data according to a first analysis component parameter set;

using the analysis component configured to acquire data according to the first analysis component parameter set, analyzing an earlier sample to acquire a first data set including analyte ion abundance;

using the processing circuitry, processing the first data set to prepare a second analysis component parameter set, the processing comprising comparing the analyte ion abundance of the first data set to a predefined threshold analyte ion abundance and determining a difference between the analyte ion abundance of the first data set and the predefined threshold;

configuring the processing circuitry of the analysis component to acquire data according to the second analysis component parameter set, the second analysis component parameter set being different from the first analysis component parameter set; and

using the analysis component configured to acquire data according to the second analysis component parameter set, analyzing a later sample to acquire a second data set including analyte ion abundance.

2. The method of claim 1 wherein the predefined threshold is a predefined upper limit total ion abundance, and the second analysis component parameter set includes an ionization time parameter less than the ionization time parameter of the first analysis component parameter set.

3. The method of claim 1 wherein the threshold abundance is a lower limit threshold, and the second analysis component parameter set includes an ionization time parameter greater than the ionization time parameter of the first analysis component parameter set.

4. The method of claim 1 further comprising selecting the earlier and/or later samples from a continuous sampling stream.

5. The method of claim 4 wherein the processing of the first data set is performed prior to the selecting of the later sample.

6. The method of claim 1 wherein the samples are part of a stream of gas chromatograph effluent.

7. The method of claim 1 wherein the samples are part of a stream of desorber effluent.

8. The method of claim 1 wherein the second analysis parameter set includes scanning parameters that include predefined m/z ratios.

9. The method of claim 1 wherein the second analysis parameter set includes scanning parameters that include a predefined scan range.

10. The method of claim 1 wherein the second analysis parameter set includes scanning parameters that include a predefined ionization time.