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Solid-state imaging device, fabrication method thereof, imaging apparatus, and fabrication method of anti-reflection structure

  • US 8,685,856 B2
  • Filed: 03/22/2010
  • Issued: 04/01/2014
  • Est. Priority Date: 03/31/2009
  • Status: Expired due to Fees
First Claim
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1. A fabrication method of an anti-reflection structure, the method comprising the steps of:

  • providing a resin film having micro-particles dispersed therein on a surface of a substrate;

    forming a dummy protrusion pattern on a surface of the resin film by etching the resin film using the micro-particles in the resin film as a mask while gradually etching the micro-particles; and

    forming a protrusion pattern on the surface of the substrate by etching back the surface of the substrate together with the resin film having the protrusion dummy pattern formed thereon, thereby transferring a surface shape of the dummy protrusion pattern formed on the surface of the resin film to the surface of the substrate and eliminating the resin film, the resulting protrusions being tapering in cross-section from a relatively wide base to a relatively narrow end, the resulting protrusions having a distribution pitch and an aspect ratio of height to base diameter effective to suppress reflection of light and provide the anti-reflection structure.

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