Systems and method for display temperature detection
First Claim
Patent Images
1. Temperature-measuring display system, comprising:
- a display panel configured to display a graphical image;
temperature measurement circuitry, comprising;
a mesh layer disposed in or on the display panel, wherein the mesh layer comprises rows and columns of wire;
measurement circuitry configured to measure baseline resistance values or the baseline capacitance values or a combination thereof, at various points in a mesh layer disposed in or on the display panel and to determine temperature values in one or more areas of the display panel that correspond to various intersecting points of the rows and columns of the mesh layer based upon electrical attributes of the rows and columns in the mesh layer; and
a processor configured to control the display panel based at least in part upon the temperature values.
1 Assignment
0 Petitions
Accused Products
Abstract
Disclosed embodiments relate to a display temperature detection system that can detect temperature variations in different regions of a display panel. The temperature measuring display system includes a display panel that provides graphical images. Further, the temperature measuring display system includes temperature measurement circuitry. The temperature measurement circuitry includes one or more thermal diodes, transistors, or a mesh layer useful to determine at least one temperature measurement of the display panel.
-
Citations
27 Claims
-
1. Temperature-measuring display system, comprising:
-
a display panel configured to display a graphical image; temperature measurement circuitry, comprising; a mesh layer disposed in or on the display panel, wherein the mesh layer comprises rows and columns of wire; measurement circuitry configured to measure baseline resistance values or the baseline capacitance values or a combination thereof, at various points in a mesh layer disposed in or on the display panel and to determine temperature values in one or more areas of the display panel that correspond to various intersecting points of the rows and columns of the mesh layer based upon electrical attributes of the rows and columns in the mesh layer; and a processor configured to control the display panel based at least in part upon the temperature values. - View Dependent Claims (2, 3, 4, 5, 6, 7, 8, 9, 10, 11, 12, 13, 14, 15)
-
-
16. A method, comprising:
-
measuring, via measurement circuitry of a display panel, baseline resistance values or the baseline capacitance values or a combination thereof, at various points in a mesh layer disposed in or on the display panel, wherein the mesh layer comprises rows and columns of electrically conductive lines; determining, via the measurement circuitry, a change in resistance, a change in capacitance, or combination thereof from the baseline resistance, capacitance, or combination thereof at various intersecting points of the rows and columns of electrically conductive lines in the mesh layer; associating, via the processing circuitry, the change in resistance, the change in capacitance or combination thereof of the rows and columns of electrically conductive lines with one or more temperature values that correspond to various intersecting points of the rows and columns of electrically conductive lines; and controlling the display panel, via the processing circuitry, based at least in part upon the temperature values. - View Dependent Claims (17, 18, 19, 20, 21, 22)
-
-
23. An electronic device, comprising:
-
a display panel configured to display a graphical image; a processor configured to provide image data to the display panel; and temperature measurement circuitry, comprising; a mesh layer disposed in or on the display panel, wherein the mesh layer comprises rows and columns of wire, and wherein resistance values, capacitance values, or a combination thereof at various intersecting points of the rows and columns of wire change based upon temperature changes of the display panel; measurement circuitry, configured to determine at least one of the resistance values or the capacitance values at various intersecting points of the rows and columns of wire, wherein the processor is configured to determine one or more temperature values in one or more areas of the display based at least in part upon the resistance values, capacitance values, or combination thereof; and a processor configured to control the display panel based at least in part upon the temperature values. - View Dependent Claims (24, 25, 26)
-
-
27. A method, comprising:
-
measuring, via measurement circuitry of a display panel, baseline resistance values or the baseline capacitance values or a combination thereof to determine a plurality of temperature values that correspond to various points in a mesh layer disposed in or on the display panel; generating, via display circuitry, a temperature gradient map that corresponds to various intersecting points of rows and columns of the mesh layer disposed in or on the display panel based at least in part on the plurality of temperature values; and adjusting, via processing circuitry, one or more white point values of the display panel based at least in part on the plurality of temperature values.
-
Specification