Method of inspecting organic electroluminescence display device
First Claim
1. A method of inspecting an organic electroluminescence (EL) display device which includes pixels each of which includes an organic EL element, the method comprising:
- imaging the pixels for a predetermined time with a reverse bias voltage being applied to the pixels;
identifying light emitting points which produce, in the imaging, luminance of light leakage that is greater than or equal to threshold intensity, the light emitting points being located within the pixels; and
determining that a pixel including a one of the light emitting points is a defective pixel when, after plural iterations of the imaging and the identifying, the one light emitting point is identified twice or more in the plural iterations of the identifying,wherein the threshold intensity is set based on average luminance of the pixels that is obtained by imaging simultaneous light emission from all the pixels in the imaging.
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Abstract
A method of inspecting an organic electroluminescence (EL) display device which includes pixels each of which includes an organic electroluminescence (EL) element includes: imaging the pixels for a predetermined time with a reverse bias voltage being applied to the pixels; identifying light emitting points which produce, in the imaging, light leakage that is greater than or equal to threshold intensity, the light emitting points being located within the pixels; and determining that a pixel including one light emitting point is a defective pixel when, after plural iterations of the imaging and the identifying, the light emitting point is identified in twice or more in the plural iterations of the identifying.
17 Citations
9 Claims
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1. A method of inspecting an organic electroluminescence (EL) display device which includes pixels each of which includes an organic EL element, the method comprising:
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imaging the pixels for a predetermined time with a reverse bias voltage being applied to the pixels; identifying light emitting points which produce, in the imaging, luminance of light leakage that is greater than or equal to threshold intensity, the light emitting points being located within the pixels; and determining that a pixel including a one of the light emitting points is a defective pixel when, after plural iterations of the imaging and the identifying, the one light emitting point is identified twice or more in the plural iterations of the identifying, wherein the threshold intensity is set based on average luminance of the pixels that is obtained by imaging simultaneous light emission from all the pixels in the imaging. - View Dependent Claims (2, 3, 4, 5, 6, 7, 8, 9)
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Specification