Method and apparatus for deriving parameters of optical paths in optical networks using two-wavelength OTDR and a wavelength-dependent reflective element

• US 8,687,957 B2
• Filed: 10/19/2009
• Issued: 04/01/2014
• Est. Priority Date: 10/17/2008
• Status: Active Grant

• Current Assignee: EXFO Incorporated (11172239 Canada, Inc.)
• Original Assignee: EXFO Incorporated (11172239 Canada, Inc.)
• Inventors: Perron, Stphane
• Primary Examiner(s): Vanderpuye, Ken
• Assistant Examiner(s): SANDHU, AMRITBIR K
• Application Number:
  US13/124,455
• Publication Number:
  US 20120045205A1
• Time in Patent Office: 1,625 Days
• Field of Search: 398/25, 398/33
• US Class Current: 398/25
• CPC Class Codes: H04B 10/0795 Performance monitoring; Measurement of transmission parameters
• CPC Class Codes: H04J 14/0282 WDM tree architectures

Abstract

A method of distinguishing a wavelength-dependent reflective element (HRD) from wavelength-independent events in an optical network, the reflective element (HRD) being highly-reflective at a first predetermined wavelength (λ₁) and significantly less reflective at least one other predetermined wavelength (λ₂), comprising the steps of: connecting the wavelength-dependent reflective element (HRD) to said optical path at a first position, and, using an optical time domain reflectometer (22) connected to said optical path at a position remote from said reflective element, launching into said optical path light at said first wavelength (λ₁) and at said second wavelength (λ₂), detecting corresponding backreflected light from said optical paths and obtaining therefrom first and second OTDR traces (OTDR-λ₁, OTDR-λ₂) corresponding to said first (λ₁) and second (λ₂) wavelengths, respectively, of detected backreflected light as a function of optical distance from said point; comparing the first and second OTDR traces to distinguish a peak corresponding to said wavelength-dependent reflective element from peaks corresponding to said wavelength-independent reflective events; and outputting at least one parameter value of the distinguished peak as a measure of a parameter of said wavelength-dependent reflective element.

Claims

1. A method of using an optical time domain reflectometer (OTDR) means (22) and a wavelength-dependent reflective (HRD) element in characterizing one or more parameters of a selected optical path of an optical network, said OTDR and said HRD element being connected to said selected optical path at respective first and second mutually-spaced points, said HRD element being highly-reflective at one of two predetermined wavelengths (λ

1,λ

2) and significantly less reflective at the other of the two predetermined wavelengths, neither of the two wavelengths corresponding to a normal operating wavelength of the optical path, the method comprising the steps of;

using said optical time domain reflectometer means (22) connected to said first point of said selected optical path;

to launch into the selected optical path at said first point light at each of said two wavelengths (λ

1) and (λ

2),

to detect at said first point corresponding backreflected light as a function of time at each of said two wavelengths (λ

1,λ

2) and obtain therefrom first and second OTDR traces (OTDR-λ

1,OTDR-λ

2), respectively, each representing backreflected light as a function of optical distance;

to compare the first and second OTDR traces to distinguish a peak corresponding to said HRD element from peaks corresponding to wavelength-independent localized reflectances, and

to derive from said peak a value of one or more parameters of either or both of said HRD element and said selected optical path between said first and second mutually-spaced points.

2. A method according to claim 1, wherein the selected optical path is in a point-to-multiple point (PMP) optical network, said first point at which the OTDR is connected to said selected optical path is common to more than one of plural optical paths, and said second point at which the HRD element is connected to the selected optical path is unique to said selected optical path, and wherein the step of detecting at said first point corresponding backreflected light detects backreflected light from said more than one of the plural optical paths, and the distinguishing step distinguishes said peak corresponding to said HRD element from peaks corresponding to other reflective events in any of the commonly-connected optical paths.

3. A method according to claim 2, wherein said selected optical path extends between an optical line terminal (OLT) and an optical network unit (ONU) of a passive optical network (PON).

4. A method according to claim 1, wherein the OTDR means has normalizing means for normalizing the detected backreflected light power with respect to the power of the light launched into the optical path.

5. A method according to claim 4, wherein

the normalizing means of the OTDR means comprises a known reference reflectance, and the HRD element has a known reflectance value at the said one of the two predetermined wavelengths at which said HRD element is highly-reflective;

and

wherein the step of deriving the said one or more parameter(s) derives the loss of the optical path between the first and second points in dependence upon the reference value and the known reflectance value.

6. A method according to claim 4, wherein:

the normalizing means of the OTDR means comprises a known reference reflectance, and, at the said one of the two predetermined wavelengths, the reflectance value of the HRD element is substantially stable in time,

the difference in the acquired OTDR data between the peak attributable to the HRD element and the said reference reflectance value has been previously measured and stored as a baseline measurement, and

where the difference in the acquired OTDR data between the peak attributable to the HRD element and the said reference reflectance is measured again to provide a current difference value,

the step of deriving said one or more parameters then deriving the change in loss of the optical path between the first and second points in the time interval between the previous and current measurements.

7. A method according to claim 6, wherein the selected optical path is one of a plurality of paths of a point-to-multipoint optical network having respective first ends connected in common at said first point,

each having a respective one of a plurality of wavelength-dependent reflective (HRD) elements at a predetermined distance from said first point, and

wherein the method comprises repeatedly deriving said one or more parameters and determining variations of said one or more parameters between successive measurements.

8. A method according to claim 1, wherein the reflectance and insertion loss of said HRD element at said other wavelength (λ

₂) are sufficiently low that high attenuation and concomitant decay and dead zone effects attributable to said HRD element at said one wavelength (λ

₁) do not significantly obfuscate any expected Rayleigh backscatter (RBS) in said backreflected light emanating from an optical distance farther from said first point than the optical distance of the said HRD element from the said first point, the method further comprising the step of measuring said level of RBS at said other wavelength (λ

₂).

9. A method according to claim 1, wherein said optical network has at least one other wavelength-dependent reflective (HRD) element previously connected to a different optical path of the network at a known distance from said first point at which said OTDR light is launched, and the step of comparing the first and second OTDR traces (OTDR-λ

₁,OTDR-λ

₂) takes into account said known distance to distinguish the peak produced by the HRD element from another peak produced by said other wavelength-dependent reflective (HRD) element.

10. A method according to claim 9, wherein, if the peak attributable to the HRD element is at least approximately coincident with said another peak, the method further comprises the step of measuring the normalized amplitude of each of the two OTDR traces (OTDR-λ

₁, OTDR-λ

₂) at the same position corresponding to said known distance and differentiating between the said peak and the said another peak according to the difference, if any, between the two amplitudes.

11. A method according to claim 1, wherein said one or more parameters comprise amplitude of said peak and distance between the HRD element and said first point at which said OTDR means detects the backreflected light, the method further comprising the step of determining loss of the selected optical path over said distance.

12. A method according to claim 11, wherein the normalization means of the OTDR means comprises a reference reflectance which is used to normalize said backreflected light relative to the power of the light launched into the optical path before determining said loss.

13. A method according to claim 11, wherein said loss is compared with a stored value of loss for said selected optical path, said stored value having been determined previously and stored in a memory device.

14. A method according to claim 13, wherein the previously determined and stored value of loss was obtained by the prior steps of:

using an optical time domain reflectometer (22) connected to a first point of said selected optical paths,

to launch into the selected optical path at said first point light at each of said two wavelengths (λ

₁) and (λ

₂),

to detect at said first point corresponding backreflected light as a function of time at each of said two wavelengths (λ

₁,λ

₂) and obtain therefrom first and second OTDR traces (OTDR-λ

₁,OTDR-λ

₂), respectively, each representing backreflected light as a function of optical distance,

to compare the first and second OTDR traces to distinguish a peak corresponding to said HRD element from peaks corresponding to wavelength-independent localized reflectances, and

to derive from said peak a value of one or more parameters of either or both of said selected optical path and said HRD element.

15. A method according to claim 1, wherein said optical network comprises a point-to-multipoint optical network having multiple optical paths whose respective first ends are connected at a common connection point to a network element (OLT), respective opposite ends of at least a plurality of said multiple optical paths being connected to a corresponding plurality of network units (ONU), respectively, each of said plurality of optical paths having connected thereto at a position at or adjacent said opposite end a respective one of a corresponding plurality of HRD elements (HRD_C) that are each highly-reflective at the same said one of said two predetermined wavelengths (λ

₁, λ

₂) and significantly less reflective at the other of said two predetermined wavelengths, the respective positions of said plurality of wavelength-dependent reflective elements relative to said common connection point being known a priori,

and wherein a temporarily-connected HRD element (HRD_S) is to be distinguished from said plurality of HRD_C elements, the temporarily-connected HRD element (HRD_S) being highly-reflective at said other of the two predetermined wavelengths (λ

₂) and significantly less reflective at said one of the two predetermined wavelengths (λ

₁),

wherein the OTDR means is used to

launch light at said first wavelength (λ

₁) and at said second wavelength (λ

₂) into said optical paths at said first point where said optical paths are commonly-connected; and

wherein the step of comparing the first and second OTDR traces distinguishes localized reflective events corresponding to said plurality of HRD elements and said temporarily-connected HRD element (HRDs) from other localized reflective events resulting from wavelength-independent reflective events, and,

using known positions of the plurality of HRD elements, segregates localized reflective events attributable to said plurality of HRD elements from a localized reflective event corresponding to said temporarily-connected HRD element (HRDs).

16. A method according to claim 15, wherein normalization means of said OTDR means comprises a co-located reference reflectance (R_REF) and the deriving step derives said value of said at least one parameter of said at least one selected optical path in dependence upon a difference between values of said first and second OTDR traces at the location of said localized reflective event, said values being normalized relative to said co-located reference reflector (R_REF).

17. A method according to claim 16, wherein a reflectance value of each of said plurality of HRD elements (HRD_C) at said first wavelength (λ

₁) and a reflectance value of said temporary HRD element (HRD_S) at said second wavelength (λ

₂) are known at least approximately, and the said one or more parameter values of said selected optical path comprise a loss of the optical path between the temporary HRD element (HRD_S) and the commonly-connected point at said first wavelength (λ

₁).

18. A method according to claim 16, wherein the expected position of each of the said plurality of localized events on the said OTDR traces is known a priori, the said difference between the said first and second normalized OTDR traces permitting the identification of one or several of the said plurality of optical paths that may be experiencing excessive loss.

19. A method according to claim 15, wherein a reflectance value of each of said plurality of HRD elements (HRD_C) at said first wavelength (λ

₁) and a reflectance value of said temporary HRD element (HRD_S) at said second wavelength (λ

₂) are known at least approximately, and the said one or more parameter values of said selected optical path comprise a loss of the optical path between the temporary HRD element (HRD_S) and the commonly-connected point at said second wavelength (λ

₂) and a loss of the optical path between the permanent HRD element (HRD_C) and the commonly-connected point at said first wavelength (λ

₂) and wherein the loss of the optical path between the temporary HRD element (HRD_S) and the corresponding one of the plurality of HRD elements (HRD_C) connected to the same optical path is determined as the difference between the two loss measurements.

20. A method according to claim 17, in a said optical network comprising a plurality of said first reflective elements connected to a plurality of optical paths, respectively, wherein, following completion of the OTDR measurements for said different optical path, the temporary HRD element (HRD_S) is removed from said different optical path, installed temporarily into another of said optical paths, and the OTDR measurements from the common point repeated for said another of said optical paths.

21. A method according to claim 1, wherein said one or more parameter values are stored in a storage device together with respective identifiers for either or both of the corresponding optical path and wavelength-dependent reflective element (HRD_C).

22. A method according to claim 1, further comprising, following connection of the HRD element (HRD_C;

HRD_S) to said optical path, the step of communicating with an entity at the OTDR end of the optical path to initiate operation of the OTDR means to perform the launching, detecting, comparing and distinguishing steps.

23. A method according to claim 22, wherein said entity is another person who operates the OTDR.

24. A method according to claim 22, wherein the entity is a computer device operable to receive the communication via a data network and initiate said OTDR measurements by said OTDR means.

25. A method according to claim 1, wherein each reflective element that is highly-reflective at said first predetermined wavelength is integrated into a network transceiver unit (ONU) installed at an end of the optical path remote from said common connection point.

26. A method according to claim 25, wherein the OTDR measurements are initiated automatically by a monitoring device at the OTDR end of the optical path.

27. A method according to claim 1, further comprising the step of outputting the value of said measured parameter to a display device or other tangible, concrete real world output means.

28. A remote control device (28) for use in the method of claim 1 to measure at least one parameter of an optical path of an optical network, the device (28) comprising a wavelength-dependent reflective element (HRD_S) (30) that is not highly-reflective at a first predetermined wavelength (λ

₁) and highly-reflective at a second wavelength (λ

₂), means (34) for connecting the reflective element (HRD_S) into said optical path, processor and user interface means (32) for communicating with an electronic device at a distal end of said optical path to initiate OTDR measurement of a parameter of said optical path by;

launching into said optical path light at said first wavelength (λ

₁) and at said second wavelength (λ

₂);

detecting corresponding backreflected light from said optical paths and obtaining therefrom first and second OTDR traces (OTDR-λ

₁,OTDR-λ

₂) corresponding to said first (λ

₁) and second (λ

₂) wavelengths, respectively, of detected backreflected light as a function of optical distance from said point;

comparing the first and second OTDR traces to distinguish a peak corresponding to said wavelength-dependent reflective element from peaks corresponding to said wavelength-independent reflective events;

deriving from said peak values of one or more parameters of either or both of said wavelength-dependent reflective element and said selected optical path; and

transmitting said parameter values to said remote control device;

said processor and user interface means (32) receiving and displaying said parameter values at said remote control device (28).

29. An optical network comprising a plurality of optical paths connected at their respective first ends in common to a first network element (OLT) and at their opposite ends to a plurality of second network elements (ONU), respectively, at least some of said optical paths each having a reflective element (HRD_C) at a position remote from said first end thereof, each said reflective element (HRD_C) being strongly reflective at one of two different predetermined wavelengths and significantly less reflective at the other, neither of said two different predetermined wavelengths being a normal operating wavelength of the optical path, and OTDR measuring means connected to said first ends of said plurality of optical paths in common for launching light at two different wavelengths into said optical paths, detecting corresponding backreflected light and obtaining corresponding OTDR traces at said two different predetermined wavelengths, and comparing the OTDR traces to distinguish peaks corresponding to reflective elements (HRD_C) from peaks corresponding to wavelength-independent localized reflectances and deriving from at least one of said peaks a value of one or more parameters of at least one of said optical paths.

30. In a point-to-multipoint optical network, a method of using an optical time domain reflectometer (OTDR) means (22) to measure cumulative Rayleigh backscattering signal (RBS) emanating from one or more of optical paths at optical distances greater than that between the OTDR means and a wavelength-dependent reflective (HRD) element in one of said optical paths, said OTDR and said HRD element being connected to a selected optical path at respective first and second mutually-spaced points, said HRD element being highly-reflective at one of two predetermined wavelengths (λ

₁,λ

₂) and significantly less reflective at the other of the two predetermined wavelengths, neither of the two wavelengths corresponding to a normal operating wavelength of the optical path, wherein the reflectance and insertion loss of said HRD element at said other wavelength (λ

₂) are sufficiently low that high attenuation and concomitant decay and dead zone effects attributable to said HRD element at said one wavelength (λ

₁) do not significantly obfuscate any expected Rayleigh backscatter (RBS) in said backreflected light emanating from an optical distance farther from said first point than the optical distance of the said HRD element from the said first point, the method comprising the steps of;

using said optical time domain reflectometer means (22) connected to said first point of said selected optical path;

to launch into the selected optical path at said first point light at each of said two wavelengths (λ

1) and (λ

2),

to detect at said first point corresponding backreflected light as a function of time at each of said two wavelengths (λ

1,λ

2) and obtain therefrom first and second OTDR traces (OTDR-λ

1,OTDR-λ

2), respectively, each representing backreflected light as a function of optical distance,

to compare the first and second OTDR traces to distinguish a peak corresponding to said HRD element from peaks corresponding to wavelength-independent localized reflectances, and

to derive from said second OTDR trace a value of said RBS at said second wavelength as a function of distance.

31. A method according to claim 30, wherein at least one additional OTDR trace having said other wavelength (λ

2) is acquired using OTDR settings more appropriate to Rayleigh backscatter (RBS) signal detection, the reflectance and insertion loss of one or more HRD elements at said other wavelength (λ

₂) being sufficiently low that high attenuation and concomitant decay and dead zone effects attributable to said HRD element at said one wavelength (λ

₁) do not significantly obfuscate any said RBS signal.

32. A method according to claim 31, wherein said OTDR settings more appropriate to RBS signal detection comprise a longer pulse width than that used in the two first acquisitions dedicated to HRD detection and measurement at λ

1 and λ

2.