Laminated structure for CIS based solar cell, and integrated structure and manufacturing method for CIS based thin-film solar cell
First Claim
1. A method for manufacturing a CIS based thin-film solar cell, comprising the steps of:
- making a back electrode on a substrate selected from the group consisting of glass and metal;
forming a p-type CIS based light absorbing layer on the back electrode;
forming a buffer layer formed of a thin film of a zinc oxide group directly on the p-type CIS based light absorbing layer; and
forming an n-type transparent conductive film formed of the thin film of a zinc oxide group on the buffer layer,wherein the buffer layer forming step is performed by an MOCVD method, anda substrate temperature of the buffer layer forming step is 190 to 300°
C. which is higher than the substrate temperature at the time of forming the n-type transparent conductive film for keeping a high resistivity of the buffer layer which is 500Ω
·
cm or higher by avoiding diffusion of dopant from the n-type transparent conductive film to the buffer layer.
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Abstract
This invention aims to provide a laminated structure and an integrated structure of a high production efficiency for a CIS based thin-film solar cell, which can produce a high-resistance buffer layer of the CIS based thin-film solar cell efficiently on a series of production lines and which needs no treatment of wastes or the like, and a manufacturing method for the structures. The CIS based thin-film solar cell includes a back electrode, a p-type CIS based light absorbing layer, a high-resistance buffer layer and an n-type transparent conductive film laminated in this order. The high-resistance buffer layer and the n-type transparent conductive film are formed of thin films of a zinc oxide group. The buffer layer contacts the p-type CIS based light absorbing layer directly, and has a resistivity of 500Ω·cm or higher.
9 Citations
4 Claims
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1. A method for manufacturing a CIS based thin-film solar cell, comprising the steps of:
-
making a back electrode on a substrate selected from the group consisting of glass and metal; forming a p-type CIS based light absorbing layer on the back electrode; forming a buffer layer formed of a thin film of a zinc oxide group directly on the p-type CIS based light absorbing layer; and forming an n-type transparent conductive film formed of the thin film of a zinc oxide group on the buffer layer, wherein the buffer layer forming step is performed by an MOCVD method, and a substrate temperature of the buffer layer forming step is 190 to 300°
C. which is higher than the substrate temperature at the time of forming the n-type transparent conductive film for keeping a high resistivity of the buffer layer which is 500Ω
·
cm or higher by avoiding diffusion of dopant from the n-type transparent conductive film to the buffer layer. - View Dependent Claims (2, 3, 4)
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Specification