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Device for analysis of a sample on a test element

  • US 8,692,119 B2
  • Filed: 11/06/2012
  • Issued: 04/08/2014
  • Est. Priority Date: 10/25/2005
  • Status: Active Grant
First Claim
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1. An analysis device for analysis of a sample on a test element, comprising at least one first component configured to make electrical contact with at least one second component for electrical transmission therebetween, wherein the first component comprises an injection-molded circuit mount, wherein the first component has at least one sprung contact lug, configured to make contact with the second component, which sprung contact lug comprises a contact lug body comprising an injection-molded plastic and a metallic electrical conductor structure, wherein the contact lug is configured to make electrical contact with a rotating second component of the analysis device.

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